{"id":"https://openalex.org/W2509992958","doi":"https://doi.org/10.1145/2896820","title":"Hierarchical Statistical Leakage Analysis and Its Application","display_name":"Hierarchical Statistical Leakage Analysis and Its Application","publication_year":2016,"publication_date":"2016-09-02","ids":{"openalex":"https://openalex.org/W2509992958","doi":"https://doi.org/10.1145/2896820","mag":"2509992958"},"language":"en","primary_location":{"id":"doi:10.1145/2896820","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2896820","pdf_url":null,"source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100668456","display_name":"Yang Xu","orcid":"https://orcid.org/0000-0002-6679-8540"},"institutions":[{"id":"https://openalex.org/I181369854","display_name":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg","ror":"https://ror.org/00f7hpc57","country_code":"DE","type":"education","lineage":["https://openalex.org/I181369854"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Yang Xu","raw_affiliation_strings":["Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg (FAU), Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg (FAU), Germany","institution_ids":["https://openalex.org/I181369854"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076672029","display_name":"J\u00fcrgen Teich","orcid":"https://orcid.org/0000-0001-6285-5862"},"institutions":[{"id":"https://openalex.org/I181369854","display_name":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg","ror":"https://ror.org/00f7hpc57","country_code":"DE","type":"education","lineage":["https://openalex.org/I181369854"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"J\u00fcrgen Teich","raw_affiliation_strings":["Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg (FAU), Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg (FAU), Germany","institution_ids":["https://openalex.org/I181369854"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.07079217,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"21","issue":"4","first_page":"1","last_page":"22"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.795117974281311},{"id":"https://openalex.org/keywords/floorplan","display_name":"Floorplan","score":0.7930386066436768},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.737175703048706},{"id":"https://openalex.org/keywords/design-flow","display_name":"Design flow","score":0.4670625627040863},{"id":"https://openalex.org/keywords/leakage-power","display_name":"Leakage power","score":0.42280739545822144},{"id":"https://openalex.org/keywords/statistical-analysis","display_name":"Statistical analysis","score":0.42192697525024414},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.41484329104423523},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3398682773113251},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3268035054206848},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.23581215739250183},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.143550306558609},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.11074602603912354},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.0989784300327301}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.795117974281311},{"id":"https://openalex.org/C130145326","wikidata":"https://www.wikidata.org/wiki/Q1553985","display_name":"Floorplan","level":2,"score":0.7930386066436768},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.737175703048706},{"id":"https://openalex.org/C37135326","wikidata":"https://www.wikidata.org/wiki/Q931942","display_name":"Design flow","level":2,"score":0.4670625627040863},{"id":"https://openalex.org/C2987719587","wikidata":"https://www.wikidata.org/wiki/Q1811428","display_name":"Leakage power","level":4,"score":0.42280739545822144},{"id":"https://openalex.org/C2986587452","wikidata":"https://www.wikidata.org/wiki/Q938438","display_name":"Statistical analysis","level":2,"score":0.42192697525024414},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.41484329104423523},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3398682773113251},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3268035054206848},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.23581215739250183},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.143550306558609},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.11074602603912354},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0989784300327301},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2896820","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2896820","pdf_url":null,"source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W361445374","https://openalex.org/W1967709031","https://openalex.org/W1990935421","https://openalex.org/W2007678974","https://openalex.org/W2015930828","https://openalex.org/W2018077132","https://openalex.org/W2029885908","https://openalex.org/W2100740271","https://openalex.org/W2104135808","https://openalex.org/W2104493335","https://openalex.org/W2108726631","https://openalex.org/W2110090002","https://openalex.org/W2110288367","https://openalex.org/W2119821681","https://openalex.org/W2121483324","https://openalex.org/W2121675760","https://openalex.org/W2122245206","https://openalex.org/W2125169487","https://openalex.org/W2132389735","https://openalex.org/W2132661750","https://openalex.org/W2148694408","https://openalex.org/W2152406824","https://openalex.org/W2155014551","https://openalex.org/W2162935501","https://openalex.org/W2164813835","https://openalex.org/W2171452856","https://openalex.org/W2178225970","https://openalex.org/W3148341734","https://openalex.org/W4246680754","https://openalex.org/W4318977545"],"related_works":["https://openalex.org/W2055008360","https://openalex.org/W1500063550","https://openalex.org/W4245901115","https://openalex.org/W2900067469","https://openalex.org/W2130342263","https://openalex.org/W2968511773","https://openalex.org/W2128559064","https://openalex.org/W2316140901","https://openalex.org/W1535054023","https://openalex.org/W1966025033"],"abstract_inverted_index":{"In":[0,118],"this":[1,74,126],"article,":[2],"we":[3,50,120],"investigate":[4,122],"a":[5,53,61,129],"hierarchical":[6,147],"statistical":[7,15,32,80],"leakage":[8,16,33,58,81,148],"analysis":[9,82,149],"(HSLA)":[10],"design":[11],"flow":[12],"where":[13],"module-level":[14],"models":[17],"supplied":[18],"by":[19,170],"IP":[20,45,94],"vendors":[21],"are":[22,168],"used":[23],"to":[24,55,63,133,152],"improve":[25],"the":[26,38,65,76,90,93,100,116,135,153,161,165],"efficiency":[27],"and":[28,164],"capacity":[29],"of":[30,40,78,92,125,137,160],"SoC":[31],"power":[34],"analysis.":[35],"To":[36],"solve":[37],"challenges":[39],"incorporating":[41],"spatial":[42,66],"correlations":[43,67],"between":[44],"modules":[46],"at":[47,68],"system":[48,69,79],"level,":[49],"first":[51],"propose":[52],"method":[54,62,103,141,150,167],"extract":[56],"correlation-inclusive":[57],"models.":[59],"Then":[60],"handle":[64],"level":[70],"is":[71,104,156],"proposed.":[72,157],"Using":[73],"method,":[75,128],"runtime":[77],"(SLA)":[83],"can":[84],"be":[85],"significantly":[86],"improved":[87],"without":[88],"disclosing":[89],"netlists":[91],"modules.":[95],"Experimental":[96],"results":[97],"demonstrate":[98,134],"that":[99],"proposed":[101],"HSLA":[102,127,140],"about":[105],"100":[106],"times":[107],"faster":[108],"than":[109],"gate-level":[110],"full-chip":[111],"SLA":[112],"methods":[113],"while":[114],"maintaining":[115],"accuracy.":[117],"addition,":[119],"also":[121],"one":[123],"application":[124],"leakage-yield-driven":[130],"floorplanning":[131,154,162],"framework,":[132],"benefits":[136],"such":[138],"an":[139,145],"in":[142],"practice.":[143],"Moreover,":[144],"optimized":[146,166],"dedicated":[151],"framework":[155,163],"The":[158],"effectiveness":[159],"confirmed":[169],"extensive":[171],"experimental":[172],"results.":[173]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}