{"id":"https://openalex.org/W2296343188","doi":"https://doi.org/10.1145/2847263.2847278","title":"SEU Mitigation and Validation of the LEON3 Soft Processor Using Triple Modular Redundancy for Space Processing","display_name":"SEU Mitigation and Validation of the LEON3 Soft Processor Using Triple Modular Redundancy for Space Processing","publication_year":2016,"publication_date":"2016-02-04","ids":{"openalex":"https://openalex.org/W2296343188","doi":"https://doi.org/10.1145/2847263.2847278","mag":"2296343188"},"language":"en","primary_location":{"id":"doi:10.1145/2847263.2847278","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2847263.2847278","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2016 ACM/SIGDA International Symposium on Field-Programmable Gate Arrays","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041342112","display_name":"Michael Wirthlin","orcid":"https://orcid.org/0000-0003-0328-6713"},"institutions":[{"id":"https://openalex.org/I100005738","display_name":"Brigham Young University","ror":"https://ror.org/047rhhm47","country_code":"US","type":"education","lineage":["https://openalex.org/I100005738"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Michael J. Wirthlin","raw_affiliation_strings":["Brigham Young University, Provo, UT, USA"],"affiliations":[{"raw_affiliation_string":"Brigham Young University, Provo, UT, USA","institution_ids":["https://openalex.org/I100005738"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073004665","display_name":"Andrew M. Keller","orcid":"https://orcid.org/0000-0002-6285-5288"},"institutions":[{"id":"https://openalex.org/I100005738","display_name":"Brigham Young University","ror":"https://ror.org/047rhhm47","country_code":"US","type":"education","lineage":["https://openalex.org/I100005738"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Andrew M. Keller","raw_affiliation_strings":["Brigham Young University, Provo, UT, USA"],"affiliations":[{"raw_affiliation_string":"Brigham Young University, Provo, UT, USA","institution_ids":["https://openalex.org/I100005738"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007727773","display_name":"Chase McCloskey","orcid":null},"institutions":[{"id":"https://openalex.org/I100005738","display_name":"Brigham Young University","ror":"https://ror.org/047rhhm47","country_code":"US","type":"education","lineage":["https://openalex.org/I100005738"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chase McCloskey","raw_affiliation_strings":["Brigham Young University, Provo, UT, USA"],"affiliations":[{"raw_affiliation_string":"Brigham Young University, Provo, UT, USA","institution_ids":["https://openalex.org/I100005738"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013777589","display_name":"Parker Ridd","orcid":null},"institutions":[{"id":"https://openalex.org/I100005738","display_name":"Brigham Young University","ror":"https://ror.org/047rhhm47","country_code":"US","type":"education","lineage":["https://openalex.org/I100005738"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Parker Ridd","raw_affiliation_strings":["Brigham Young University, Provo, UT, USA"],"affiliations":[{"raw_affiliation_string":"Brigham Young University, Provo, UT, USA","institution_ids":["https://openalex.org/I100005738"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104040205","display_name":"David Lee","orcid":"https://orcid.org/0000-0003-0248-6844"},"institutions":[{"id":"https://openalex.org/I4210104735","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David Lee","raw_affiliation_strings":["Sandia National Laboratories, Albuquerque, NM, USA"],"affiliations":[{"raw_affiliation_string":"Sandia National Laboratories, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I4210104735"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110567690","display_name":"Jeffrey Draper","orcid":null},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jeffrey Draper","raw_affiliation_strings":["University of Southern California, Marina del Ray, CA, USA"],"affiliations":[{"raw_affiliation_string":"University of Southern California, Marina del Ray, CA, USA","institution_ids":["https://openalex.org/I1174212"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5041342112"],"corresponding_institution_ids":["https://openalex.org/I100005738"],"apc_list":null,"apc_paid":null,"fwci":2.2052,"has_fulltext":false,"cited_by_count":35,"citation_normalized_percentile":{"value":0.88346421,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"205","last_page":"214"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9890999794006348,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.7558472156524658},{"id":"https://openalex.org/keywords/triple-modular-redundancy","display_name":"Triple modular redundancy","score":0.7441446185112},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6740175485610962},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.6401396989822388},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6398332118988037},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.5698056817054749},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5567559003829956},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.5539214611053467},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.5442358255386353},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.5403772592544556},{"id":"https://openalex.org/keywords/reconfigurability","display_name":"Reconfigurability","score":0.5004217624664307},{"id":"https://openalex.org/keywords/payload","display_name":"Payload (computing)","score":0.4524650573730469},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.4382864534854889},{"id":"https://openalex.org/keywords/emulation","display_name":"Emulation","score":0.41347622871398926},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.34237203001976013},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3206658959388733},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30300283432006836},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.2005573809146881},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.11546662449836731},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.0989842414855957}],"concepts":[{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.7558472156524658},{"id":"https://openalex.org/C196371267","wikidata":"https://www.wikidata.org/wiki/Q3998979","display_name":"Triple modular redundancy","level":3,"score":0.7441446185112},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6740175485610962},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.6401396989822388},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6398332118988037},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.5698056817054749},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5567559003829956},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.5539214611053467},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.5442358255386353},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.5403772592544556},{"id":"https://openalex.org/C2780149590","wikidata":"https://www.wikidata.org/wiki/Q7302742","display_name":"Reconfigurability","level":2,"score":0.5004217624664307},{"id":"https://openalex.org/C134066672","wikidata":"https://www.wikidata.org/wiki/Q1424639","display_name":"Payload (computing)","level":3,"score":0.4524650573730469},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.4382864534854889},{"id":"https://openalex.org/C149810388","wikidata":"https://www.wikidata.org/wiki/Q5374873","display_name":"Emulation","level":2,"score":0.41347622871398926},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.34237203001976013},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3206658959388733},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30300283432006836},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.2005573809146881},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.11546662449836731},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0989842414855957},{"id":"https://openalex.org/C158379750","wikidata":"https://www.wikidata.org/wiki/Q214111","display_name":"Network packet","level":2,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C50522688","wikidata":"https://www.wikidata.org/wiki/Q189833","display_name":"Economic growth","level":1,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2847263.2847278","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2847263.2847278","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2016 ACM/SIGDA International Symposium on Field-Programmable Gate Arrays","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1504339380","https://openalex.org/W1585307141","https://openalex.org/W1968395020","https://openalex.org/W1976834654","https://openalex.org/W1980478863","https://openalex.org/W2021391543","https://openalex.org/W2037969914","https://openalex.org/W2040421909","https://openalex.org/W2102893099","https://openalex.org/W2103743897","https://openalex.org/W2116549540","https://openalex.org/W2121903726","https://openalex.org/W2122802656","https://openalex.org/W2125640276","https://openalex.org/W2131342909","https://openalex.org/W2135743241","https://openalex.org/W2136842831","https://openalex.org/W2137588572","https://openalex.org/W2170171948","https://openalex.org/W2533368764","https://openalex.org/W4231740769"],"related_works":["https://openalex.org/W2622269177","https://openalex.org/W1523508240","https://openalex.org/W2044069930","https://openalex.org/W2102538861","https://openalex.org/W2995137536","https://openalex.org/W1749592617","https://openalex.org/W2122334461","https://openalex.org/W2078707653","https://openalex.org/W2165400042","https://openalex.org/W1553526993"],"abstract_inverted_index":{"Processors":[0],"are":[1,47,99],"an":[2,115,125],"essential":[3],"component":[4],"in":[5,26,70,93,152],"most":[6],"satellite":[7],"payload":[8],"electronics":[9],"and":[10,19,42,52,86,105,119,136],"handle":[11],"a":[12,73,79,144,153],"variety":[13],"of":[14,72,117,128,148],"functions":[15],"including":[16],"command":[17],"handling":[18],"data":[20],"processing.":[21],"There":[22],"is":[23],"growing":[24],"interest":[25],"implementing":[27],"soft":[28,75],"processors":[29],"on":[30,78],"commercial":[31],"FPGAs":[32,36],"within":[33],"satellites.":[34],"Commercial":[35],"offer":[37],"reconfigurability,":[38],"large":[39],"logic":[40],"density,":[41],"I/O":[43],"bandwidth;":[44],"however,":[45],"they":[46],"sensitive":[48],"to":[49,62,146],"ionizing":[50],"radiation":[51,108,121],"systems":[53],"developed":[54],"for":[55],"space":[56],"must":[57],"implement":[58],"single-event":[59],"upset":[60],"mitigation":[61,89],"operate":[63],"reliably.":[64],"This":[65],"paper":[66],"investigates":[67],"the":[68,120,139],"improvements":[69,92],"reliability":[71,94],"LEON3":[74,141],"processor":[76,142],"operating":[77],"SRAM-based":[80],"FPGA":[81],"when":[82],"using":[83],"triple-modular":[84],"redundancy":[85],"other":[87],"processor-specific":[88],"techniques.":[90],"The":[91,110],"provided":[95],"by":[96],"these":[97],"techniques":[98],"validated":[100],"with":[101],"both":[102],"fault":[103,111],"injection":[104,112],"heavy":[106],"ion":[107],"tests.":[109],"experiments":[113],"indicate":[114],"improvement":[116,127],"51\u00d7":[118],"testing":[122],"results":[123],"demonstrate":[124],"average":[126],"10\u00d7.":[129],"Orbit":[130],"failure":[131,147],"rate":[132],"estimations":[133],"were":[134],"computed":[135],"suggest":[137],"that":[138],"TMR":[140],"has":[143],"mean-time":[145],"over":[149],"76":[150],"years":[151],"geosynchronous":[154],"orbit.":[155]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}