{"id":"https://openalex.org/W2075094681","doi":"https://doi.org/10.1145/2818567.2818656","title":"Reliability Analysis for Embedded System with Two Types of Faults and Common Cause Failure Using Markov process","display_name":"Reliability Analysis for Embedded System with Two Types of Faults and Common Cause Failure Using Markov process","publication_year":2015,"publication_date":"2015-09-25","ids":{"openalex":"https://openalex.org/W2075094681","doi":"https://doi.org/10.1145/2818567.2818656","mag":"2075094681"},"language":"en","primary_location":{"id":"doi:10.1145/2818567.2818656","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2818567.2818656","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the Sixth International Conference on Computer and Communication Technology 2015","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003896096","display_name":"Madhu Jain","orcid":"https://orcid.org/0000-0002-8183-5338"},"institutions":[{"id":"https://openalex.org/I154851008","display_name":"Indian Institute of Technology Roorkee","ror":"https://ror.org/00582g326","country_code":"IN","type":"education","lineage":["https://openalex.org/I154851008"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Madhu Jain","raw_affiliation_strings":["Department of Mathematics, IIT, Roorkee-247667, India","Department of Mathematics, IIT, Roorkee - 247667, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mathematics, IIT, Roorkee-247667, India","institution_ids":["https://openalex.org/I154851008"]},{"raw_affiliation_string":"Department of Mathematics, IIT, Roorkee - 247667, India","institution_ids":["https://openalex.org/I154851008"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103362362","display_name":"Manju Kaushik","orcid":"https://orcid.org/0000-0002-0720-1249"},"institutions":[{"id":"https://openalex.org/I3131927718","display_name":"JECRC University","ror":"https://ror.org/04hjsag95","country_code":"IN","type":"education","lineage":["https://openalex.org/I3131927718"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Manju Kaushik","raw_affiliation_strings":["Department of CSE, JECRC University, Jaipur-303905, India","Department of CSE, JECRC University, Jaipur 303905, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of CSE, JECRC University, Jaipur-303905, India","institution_ids":["https://openalex.org/I3131927718"]},{"raw_affiliation_string":"Department of CSE, JECRC University, Jaipur 303905, India","institution_ids":["https://openalex.org/I3131927718"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103497340","display_name":"Gireesh Kumar","orcid":null},"institutions":[{"id":"https://openalex.org/I912344705","display_name":"JK Lakshmipat University","ror":"https://ror.org/0456b2t50","country_code":"IN","type":"education","lineage":["https://openalex.org/I912344705"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Gireesh Kumar","raw_affiliation_strings":["Department of CSE, JK Lakshmipat University, Jaipur-302026, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of CSE, JK Lakshmipat University, Jaipur-302026, India","institution_ids":["https://openalex.org/I912344705"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.09361358,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"271","last_page":"275"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6952646970748901},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.67097407579422},{"id":"https://openalex.org/keywords/markov-process","display_name":"Markov process","score":0.6601378917694092},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6541913151741028},{"id":"https://openalex.org/keywords/markov-chain","display_name":"Markov chain","score":0.5870234966278076},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5675511360168457},{"id":"https://openalex.org/keywords/markov-model","display_name":"Markov model","score":0.55681312084198},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.540787935256958},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5355472564697266},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.4932553172111511},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.4321504533290863},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4010586142539978},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3342103362083435},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19583290815353394},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1359187364578247},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.13079732656478882}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6952646970748901},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.67097407579422},{"id":"https://openalex.org/C159886148","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov process","level":2,"score":0.6601378917694092},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6541913151741028},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.5870234966278076},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5675511360168457},{"id":"https://openalex.org/C163836022","wikidata":"https://www.wikidata.org/wiki/Q6771326","display_name":"Markov model","level":3,"score":0.55681312084198},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.540787935256958},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5355472564697266},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.4932553172111511},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.4321504533290863},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4010586142539978},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3342103362083435},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19583290815353394},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1359187364578247},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.13079732656478882},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2818567.2818656","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2818567.2818656","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the Sixth International Conference on Computer and Communication Technology 2015","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions","score":0.7099999785423279}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1851013546","https://openalex.org/W2000520466","https://openalex.org/W2003912221","https://openalex.org/W2084245090","https://openalex.org/W2087746305","https://openalex.org/W2093112112","https://openalex.org/W2100697910","https://openalex.org/W2106171435","https://openalex.org/W2111033809","https://openalex.org/W2131069178","https://openalex.org/W2183996229"],"related_works":["https://openalex.org/W2044069930","https://openalex.org/W2078707653","https://openalex.org/W3196277062","https://openalex.org/W4224229821","https://openalex.org/W2079643259","https://openalex.org/W2782341877","https://openalex.org/W2593605297","https://openalex.org/W2969553121","https://openalex.org/W1553526993","https://openalex.org/W2408771053"],"abstract_inverted_index":{"This":[0],"investigation":[1],"is":[2,25,74,81,107],"concerned":[3],"with":[4],"the":[5,36,85,89,94,97,112,118,127],"performance":[6,129],"modeling":[7],"of":[8,16,21,39,52,96,117,123],"an":[9],"embedded":[10,41,98],"system":[11,90,128],"in":[12,84],"which":[13],"two":[14,50],"types":[15,51],"faults":[17,53],"occurs.":[18],"The":[19,43,70,121],"concept":[20],"common":[22],"cause":[23],"failure":[24],"also":[26,108],"taken":[27],"into":[28],"consideration":[29],"to":[30,34,49,110],"develop":[31],"Markov":[32],"model":[33,95],"analyze":[35],"reliability":[37],"indices":[38,130],"software":[40],"system.":[42,86],"hardware":[44,72],"components":[45,73],"may":[46],"fail":[47],"due":[48],"namely":[54],"(i)":[55],"permanent":[56],"fault":[57,65],"known":[58,66],"as":[59,67],"hard":[60],"error":[61],"and":[62,114],"(ii)":[63],"transient":[64],"soft":[68],"errors.":[69],"failed":[71],"repaired":[75],"by":[76],"a":[77],"single":[78],"repairman":[79],"who":[80],"always":[82],"available":[83],"To":[87],"obtain":[88],"state":[91],"probabilities":[92],"governing":[93],"system,":[99],"we":[100],"employ":[101],"Runge-Kutta":[102],"method.":[103],"A":[104],"numerical":[105],"illustration":[106],"presented":[109],"validate":[111],"analytical":[113],"computational":[115],"tractability":[116],"proposed":[119],"model.":[120],"effect":[122],"different":[124],"parameters":[125],"on":[126],"are":[131],"demonstrated":[132],"graphically.":[133]},"counts_by_year":[{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":10}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}