{"id":"https://openalex.org/W2018299365","doi":"https://doi.org/10.1145/2660540.2660985","title":"Reliability Analysis of a 130nm Charge Redistribution SAR ADC under Single Event Effects","display_name":"Reliability Analysis of a 130nm Charge Redistribution SAR ADC under Single Event Effects","publication_year":2014,"publication_date":"2014-09-01","ids":{"openalex":"https://openalex.org/W2018299365","doi":"https://doi.org/10.1145/2660540.2660985","mag":"2018299365"},"language":"en","primary_location":{"id":"doi:10.1145/2660540.2660985","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2660540.2660985","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 27th Symposium on Integrated Circuits and Systems Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038282113","display_name":"Alisson J. C. Lanot","orcid":null},"institutions":[{"id":"https://openalex.org/I126460647","display_name":"Universidade Federal do Rio Grande","ror":"https://ror.org/05hpfkn88","country_code":"BR","type":"education","lineage":["https://openalex.org/I126460647"]},{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":true,"raw_author_name":"A. J. C. Lanot","raw_affiliation_strings":["Universidade Federal Do Rio Grande do Sul, Department of Electrical Engineering -- DELET, Graduate Program in Electrical Engineering -- PPGEE"],"affiliations":[{"raw_affiliation_string":"Universidade Federal Do Rio Grande do Sul, Department of Electrical Engineering -- DELET, Graduate Program in Electrical Engineering -- PPGEE","institution_ids":["https://openalex.org/I130442723","https://openalex.org/I126460647"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042649608","display_name":"Tiago R. Balen","orcid":"https://orcid.org/0000-0001-9641-300X"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]},{"id":"https://openalex.org/I126460647","display_name":"Universidade Federal do Rio Grande","ror":"https://ror.org/05hpfkn88","country_code":"BR","type":"education","lineage":["https://openalex.org/I126460647"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"T. R. Balen","raw_affiliation_strings":["Universidade Federal Do Rio Grande do Sul, Department of Electrical Engineering -- DELET, Graduate Program in Electrical Engineering -- PPGEE"],"affiliations":[{"raw_affiliation_string":"Universidade Federal Do Rio Grande do Sul, Department of Electrical Engineering -- DELET, Graduate Program in Electrical Engineering -- PPGEE","institution_ids":["https://openalex.org/I130442723","https://openalex.org/I126460647"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5038282113"],"corresponding_institution_ids":["https://openalex.org/I126460647","https://openalex.org/I130442723"],"apc_list":null,"apc_paid":null,"fwci":0.4187,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.670238,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.7498303651809692},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.6690728664398193},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6236956119537354},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6082487106323242},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5556106567382812},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.5259858965873718},{"id":"https://openalex.org/keywords/data-conversion","display_name":"Data conversion","score":0.47991499304771423},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.4580160677433014},{"id":"https://openalex.org/keywords/redistribution","display_name":"Redistribution (election)","score":0.42876729369163513},{"id":"https://openalex.org/keywords/charge-control","display_name":"Charge control","score":0.41447293758392334},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.32131898403167725},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.29908502101898193},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2855314612388611},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.23278534412384033},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2065708041191101},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.19028300046920776}],"concepts":[{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.7498303651809692},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.6690728664398193},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6236956119537354},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6082487106323242},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5556106567382812},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.5259858965873718},{"id":"https://openalex.org/C1232282","wikidata":"https://www.wikidata.org/wiki/Q1783551","display_name":"Data conversion","level":2,"score":0.47991499304771423},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.4580160677433014},{"id":"https://openalex.org/C74080474","wikidata":"https://www.wikidata.org/wiki/Q7305975","display_name":"Redistribution (election)","level":3,"score":0.42876729369163513},{"id":"https://openalex.org/C2777681924","wikidata":"https://www.wikidata.org/wiki/Q5074262","display_name":"Charge control","level":4,"score":0.41447293758392334},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.32131898403167725},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29908502101898193},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2855314612388611},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.23278534412384033},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2065708041191101},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.19028300046920776},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C555008776","wikidata":"https://www.wikidata.org/wiki/Q267298","display_name":"Battery (electricity)","level":3,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C94625758","wikidata":"https://www.wikidata.org/wiki/Q7163","display_name":"Politics","level":2,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2660540.2660985","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2660540.2660985","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 27th Symposium on Integrated Circuits and Systems Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321091","display_name":"Coordena\u00e7\u00e3o de Aperfei\u00e7oamento de Pessoal de N\u00edvel Superior","ror":"https://ror.org/00x0ma614"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W611078108","https://openalex.org/W1915486253","https://openalex.org/W1978113728","https://openalex.org/W2014353861","https://openalex.org/W2030501553","https://openalex.org/W2089950550","https://openalex.org/W2096692505","https://openalex.org/W2098247453","https://openalex.org/W2118319749","https://openalex.org/W2119368407","https://openalex.org/W2142753319","https://openalex.org/W2150943407","https://openalex.org/W2987455599","https://openalex.org/W4247114301"],"related_works":["https://openalex.org/W2204879205","https://openalex.org/W2096437374","https://openalex.org/W1943174035","https://openalex.org/W1928481607","https://openalex.org/W2125477176","https://openalex.org/W2023576729","https://openalex.org/W3137563628","https://openalex.org/W3148894610","https://openalex.org/W2112362786","https://openalex.org/W4250947714"],"abstract_inverted_index":{"Successive":[0],"Approximation":[1],"Register":[2],"(SAR)":[3],"converters":[4],"based":[5],"on":[6,27,56,67,72],"charge":[7,79],"redistribution":[8,80],"are":[9,84,97],"often":[10],"present":[11],"in":[12,92],"embedded":[13],"mixed-signal":[14],"systems.":[15],"Previous":[16],"works":[17],"have":[18],"shown":[19],"that":[20,95],"this":[21,61],"topology":[22],"is":[23],"prone":[24],"to":[25,38,45,52],"errors":[26,42,55],"the":[28,46,57,63,68,73,112,115,125],"conversion,":[29,50],"caused":[30],"by":[31,100],"Single":[32],"Event":[33],"Transients":[34],"(SET),":[35],"when":[36],"exposed":[37],"ionizing":[39],"radiation.":[40],"Such":[41],"can":[43,121,130],"propagate":[44],"subsequent":[47],"steps":[48],"of":[49,65,77,102,114],"leading":[51],"multiple":[53],"bit":[54],"converted":[58],"data.":[59],"In":[60],"work,":[62],"effects":[64,120],"SETs":[66],"analog":[69],"switches":[70],"and":[71,124],"digital":[74],"control":[75],"logic":[76],"a":[78,93,106],"SAR":[81],"A/D":[82],"converter":[83,116],"analyzed.":[85],"A":[86],"fault":[87],"injection":[88],"framework":[89],"was":[90],"developed":[91],"way":[94],"faults":[96],"randomly":[98],"injected,":[99],"means":[101],"spice":[103],"simulations,":[104],"considering":[105],"130nm":[107],"CMOS":[108],"technology.":[109],"This":[110],"way,":[111],"behavior":[113],"under":[117],"single":[118],"event":[119],"be":[122,131],"predicted,":[123],"most":[126],"vulnerable":[127],"circuit":[128],"nodes":[129],"identified.":[132]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}