{"id":"https://openalex.org/W2162994747","doi":"https://doi.org/10.1145/2660540.2660976","title":"Improved Charge Pump Circuits for Standard CMOS Technologies","display_name":"Improved Charge Pump Circuits for Standard CMOS Technologies","publication_year":2014,"publication_date":"2014-09-01","ids":{"openalex":"https://openalex.org/W2162994747","doi":"https://doi.org/10.1145/2660540.2660976","mag":"2162994747"},"language":"en","primary_location":{"id":"doi:10.1145/2660540.2660976","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2660540.2660976","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 27th Symposium on Integrated Circuits and Systems Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5031373371","display_name":"Carlos Augusto de Moraes Cruz","orcid":"https://orcid.org/0000-0002-0614-1379"},"institutions":[{"id":"https://openalex.org/I62885914","display_name":"Universidade Federal do Amazonas","ror":"https://ror.org/02263ky35","country_code":"BR","type":"education","lineage":["https://openalex.org/I62885914"]}],"countries":["BR"],"is_corresponding":true,"raw_author_name":"Carlos A. de Moraes Cruz","raw_affiliation_strings":["DETEC, Universidade Federal do Amazonas -- UFAM, Manaus -- AM, Brazil"],"affiliations":[{"raw_affiliation_string":"DETEC, Universidade Federal do Amazonas -- UFAM, Manaus -- AM, Brazil","institution_ids":["https://openalex.org/I62885914"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108536494","display_name":"Carlos Alberto dos Reis Filho","orcid":null},"institutions":[{"id":"https://openalex.org/I71715416","display_name":"Universidade Federal do ABC","ror":"https://ror.org/028kg9j04","country_code":"BR","type":"education","lineage":["https://openalex.org/I71715416"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Carlos A. dos Reis Filho","raw_affiliation_strings":["Universidade Federal do ABC -- UFABC, Santo Andr\u00e9 -- SP, Brazil"],"affiliations":[{"raw_affiliation_string":"Universidade Federal do ABC -- UFABC, Santo Andr\u00e9 -- SP, Brazil","institution_ids":["https://openalex.org/I71715416"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081915367","display_name":"Davies William de Lima Monteiro","orcid":"https://orcid.org/0000-0002-9925-2392"},"institutions":[{"id":"https://openalex.org/I110200422","display_name":"Universidade Federal de Minas Gerais","ror":"https://ror.org/0176yjw32","country_code":"BR","type":"education","lineage":["https://openalex.org/I110200422"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Davies W. de Lima Monteiro","raw_affiliation_strings":["DEE/PPGEE, Universidade Federal de Minas Gerais -- UFMG, Belo Horizonte -- MG, Brazil"],"affiliations":[{"raw_affiliation_string":"DEE/PPGEE, Universidade Federal de Minas Gerais -- UFMG, Belo Horizonte -- MG, Brazil","institution_ids":["https://openalex.org/I110200422"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5031373371"],"corresponding_institution_ids":["https://openalex.org/I62885914"],"apc_list":null,"apc_paid":null,"fwci":0.3631,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.67455551,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11230","display_name":"Innovative Energy Harvesting Technologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11230","display_name":"Innovative Energy Harvesting Technologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.794926643371582},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6875269412994385},{"id":"https://openalex.org/keywords/charge-pump","display_name":"Charge pump","score":0.6553232669830322},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5615989565849304},{"id":"https://openalex.org/keywords/gate-oxide","display_name":"Gate oxide","score":0.5552298426628113},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5361506938934326},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.528622031211853},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4905969202518463},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.46691063046455383},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4512830674648285},{"id":"https://openalex.org/keywords/integrated-injection-logic","display_name":"Integrated injection logic","score":0.4307706952095032},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4040129780769348},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3518082797527313},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.32887330651283264},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2959974408149719},{"id":"https://openalex.org/keywords/pass-transistor-logic","display_name":"Pass transistor logic","score":0.21438640356063843},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.1307830810546875},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11451676487922668}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.794926643371582},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6875269412994385},{"id":"https://openalex.org/C114825011","wikidata":"https://www.wikidata.org/wiki/Q440704","display_name":"Charge pump","level":4,"score":0.6553232669830322},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5615989565849304},{"id":"https://openalex.org/C2361726","wikidata":"https://www.wikidata.org/wiki/Q5527031","display_name":"Gate oxide","level":4,"score":0.5552298426628113},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5361506938934326},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.528622031211853},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4905969202518463},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.46691063046455383},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4512830674648285},{"id":"https://openalex.org/C159903706","wikidata":"https://www.wikidata.org/wiki/Q173574","display_name":"Integrated injection logic","level":5,"score":0.4307706952095032},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4040129780769348},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3518082797527313},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.32887330651283264},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2959974408149719},{"id":"https://openalex.org/C198521697","wikidata":"https://www.wikidata.org/wiki/Q7142438","display_name":"Pass transistor logic","level":4,"score":0.21438640356063843},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.1307830810546875},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11451676487922668},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2660540.2660976","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2660540.2660976","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 27th Symposium on Integrated Circuits and Systems Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8700000047683716,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1998899622","https://openalex.org/W2022987655","https://openalex.org/W2024355525","https://openalex.org/W2034785288","https://openalex.org/W2045822807","https://openalex.org/W2070588354","https://openalex.org/W2079915013","https://openalex.org/W2105473785","https://openalex.org/W2109132965","https://openalex.org/W2111323554","https://openalex.org/W2112309804","https://openalex.org/W2113299542","https://openalex.org/W2119637544","https://openalex.org/W2121670926","https://openalex.org/W2134182872","https://openalex.org/W2134390307","https://openalex.org/W2544273168","https://openalex.org/W4229612460"],"related_works":["https://openalex.org/W4241635412","https://openalex.org/W3215232745","https://openalex.org/W1851494072","https://openalex.org/W1863251870","https://openalex.org/W1971786091","https://openalex.org/W2101354357","https://openalex.org/W2545120047","https://openalex.org/W1775886837","https://openalex.org/W1900707063","https://openalex.org/W2170979950"],"abstract_inverted_index":{"Reliability":[0],"problems":[1],"such":[2,44,111],"as":[3,14],"gate-oxide":[4,16,70,115],"voltage":[5,36,95,151],"overstress":[6,22,71,116],"have":[7,140],"become":[8],"a":[9,123],"concern":[10],"for":[11,26,49,55,76],"CMOS":[12,50,78],"circuits":[13,29,41,145],"the":[15,80,87,136,143],"thickness":[17],"is":[18,23,46,82,89,126,129],"scaled":[19],"down.":[20],"Gate-oxide":[21],"particularly":[24],"worse":[25],"charge":[27,39,73],"pump":[28,40],"because":[30],"they":[31],"usually":[32,66],"operate":[33],"in":[34,72,117],"high":[35],"levels.":[37],"Devising":[38],"that":[42,142],"avoid":[43],"problem":[45],"far":[47],"simpler":[48],"triple":[51],"well":[52],"technologies":[53],"than":[54],"standard":[56,77],"technologies,":[57,79],"nevertheless":[58],"fabrication":[59],"costs":[60],"are":[61,65],"higher.":[62],"Two":[63],"approaches":[64],"applied":[67],"to":[68,102,131,134],"eliminate":[69],"pumps":[74],"designed":[75],"first":[81],"multiple":[83],"phase":[84,91],"control,":[85],"and":[86],"second":[88],"dual":[90],"control":[92],"with":[93],"doubled":[94],"swing.":[96],"The":[97],"latter":[98],"has":[99],"been":[100],"shown":[101,130,141],"produce":[103],"more":[104],"power":[105],"efficient":[106],"circuits,":[107],"however":[108],"solutions":[109],"using":[110],"approach":[112],"still":[113],"present":[114],"some":[118],"transistors.":[119],"In":[120],"this":[121],"work":[122],"simple":[124],"solution":[125],"presented":[127],"which":[128],"be":[132],"able":[133],"overcome":[135],"problem.":[137],"Moreover,":[138],"simulations":[139],"proposed":[144],"can":[146],"reach":[147],"about":[148],"98.2%":[149],"of":[150],"multiplication":[152],"efficiency.":[153]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}