{"id":"https://openalex.org/W2010119725","doi":"https://doi.org/10.1145/2593069.2602971","title":"Advanced Diagnosis","display_name":"Advanced Diagnosis","publication_year":2014,"publication_date":"2014-05-27","ids":{"openalex":"https://openalex.org/W2010119725","doi":"https://doi.org/10.1145/2593069.2602971","mag":"2010119725"},"language":"en","primary_location":{"id":"doi:10.1145/2593069.2602971","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2593069.2602971","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 51st Annual Design Automation Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077098249","display_name":"Felix Reimann","orcid":"https://orcid.org/0000-0002-9590-6811"},"institutions":[{"id":"https://openalex.org/I181369854","display_name":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg","ror":"https://ror.org/00f7hpc57","country_code":"DE","type":"education","lineage":["https://openalex.org/I181369854"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Felix Reimann","raw_affiliation_strings":["University of Erlangen-Nuremberg, Germany","University of Erlangen-Nuremberg (Germany)"],"affiliations":[{"raw_affiliation_string":"University of Erlangen-Nuremberg, Germany","institution_ids":["https://openalex.org/I181369854"]},{"raw_affiliation_string":"University of Erlangen-Nuremberg (Germany)","institution_ids":["https://openalex.org/I181369854"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079135719","display_name":"Michael Gla\u00df","orcid":"https://orcid.org/0000-0002-8006-8843"},"institutions":[{"id":"https://openalex.org/I181369854","display_name":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg","ror":"https://ror.org/00f7hpc57","country_code":"DE","type":"education","lineage":["https://openalex.org/I181369854"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Michael Gla\u00df","raw_affiliation_strings":["University of Erlangen-Nuremberg, Germany","University of Erlangen-Nuremberg (Germany)"],"affiliations":[{"raw_affiliation_string":"University of Erlangen-Nuremberg, Germany","institution_ids":["https://openalex.org/I181369854"]},{"raw_affiliation_string":"University of Erlangen-Nuremberg (Germany)","institution_ids":["https://openalex.org/I181369854"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076672029","display_name":"J\u00fcrgen Teich","orcid":"https://orcid.org/0000-0001-6285-5862"},"institutions":[{"id":"https://openalex.org/I181369854","display_name":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg","ror":"https://ror.org/00f7hpc57","country_code":"DE","type":"education","lineage":["https://openalex.org/I181369854"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"J\u00fcrgen Teich","raw_affiliation_strings":["University of Erlangen-Nuremberg, Germany","University of Erlangen-Nuremberg (Germany)"],"affiliations":[{"raw_affiliation_string":"University of Erlangen-Nuremberg, Germany","institution_ids":["https://openalex.org/I181369854"]},{"raw_affiliation_string":"University of Erlangen-Nuremberg (Germany)","institution_ids":["https://openalex.org/I181369854"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026437506","display_name":"Alejandro Cook","orcid":null},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Alejandro Cook","raw_affiliation_strings":["University of Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"University of Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040660689","display_name":"Laura Rodr\u00edguez G\u00f3mez","orcid":"https://orcid.org/0000-0003-0842-2390"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Laura Rodr\u00edguez G\u00f3mez","raw_affiliation_strings":["University of Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"University of Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039468819","display_name":"Dominik Ull","orcid":null},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Dominik Ull","raw_affiliation_strings":["University of Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"University of Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008775226","display_name":"Hans-Joachim Wunderlich","orcid":"https://orcid.org/0000-0003-4536-8290"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hans-Joachim Wunderlich","raw_affiliation_strings":["University of Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"University of Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111644092","display_name":"Piet Engelke","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Piet Engelke","raw_affiliation_strings":["Infineon Technologies AG, Neubiberg, Germany","Infineon Technologies AG, Neubiberg, Germany#TAB#"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG, Neubiberg, Germany","institution_ids":["https://openalex.org/I137594350"]},{"raw_affiliation_string":"Infineon Technologies AG, Neubiberg, Germany#TAB#","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072022544","display_name":"Ulrich Abelein","orcid":null},"institutions":[{"id":"https://openalex.org/I1322300227","display_name":"Audi (Germany)","ror":"https://ror.org/02aykj333","country_code":"DE","type":"company","lineage":["https://openalex.org/I1322300227"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ulrich Abelein","raw_affiliation_strings":["AUDI AG, Ingolstadt, Germany","AUDI AG Ingolstadt, Germany#TAB#"],"affiliations":[{"raw_affiliation_string":"AUDI AG, Ingolstadt, Germany","institution_ids":["https://openalex.org/I1322300227"]},{"raw_affiliation_string":"AUDI AG Ingolstadt, Germany#TAB#","institution_ids":["https://openalex.org/I1322300227"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5077098249"],"corresponding_institution_ids":["https://openalex.org/I181369854"],"apc_list":null,"apc_paid":null,"fwci":2.4518,"has_fulltext":false,"cited_by_count":28,"citation_normalized_percentile":{"value":0.88752883,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.756598949432373},{"id":"https://openalex.org/keywords/implementation","display_name":"Implementation","score":0.6458715200424194},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6321351528167725},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5909039378166199},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.5487528443336487},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5277360677719116},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.5070087909698486},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4979698657989502},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.4735219478607178},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4462849497795105},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.4440149664878845},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.36294540762901306},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.1700718104839325},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1621464192867279},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.1573791205883026},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.1374715268611908}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.756598949432373},{"id":"https://openalex.org/C26713055","wikidata":"https://www.wikidata.org/wiki/Q245962","display_name":"Implementation","level":2,"score":0.6458715200424194},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6321351528167725},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5909039378166199},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.5487528443336487},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5277360677719116},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.5070087909698486},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4979698657989502},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.4735219478607178},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4462849497795105},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.4440149664878845},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.36294540762901306},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.1700718104839325},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1621464192867279},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.1573791205883026},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1374715268611908},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2593069.2602971","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2593069.2602971","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 51st Annual Design Automation Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.49000000953674316,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1968989269","https://openalex.org/W1976062726","https://openalex.org/W1984867390","https://openalex.org/W1994533443","https://openalex.org/W2000199097","https://openalex.org/W2024681686","https://openalex.org/W2032663532","https://openalex.org/W2094295517","https://openalex.org/W2095423241","https://openalex.org/W2111572707","https://openalex.org/W2114096484","https://openalex.org/W2122581382","https://openalex.org/W2126042558","https://openalex.org/W2138530143","https://openalex.org/W2147726041","https://openalex.org/W2155341425","https://openalex.org/W2156710719","https://openalex.org/W2162696040","https://openalex.org/W2164529645","https://openalex.org/W2168723885"],"related_works":["https://openalex.org/W2120447654","https://openalex.org/W2977179488","https://openalex.org/W2144453115","https://openalex.org/W4382644535","https://openalex.org/W2128223750","https://openalex.org/W4238532390","https://openalex.org/W2188872161","https://openalex.org/W2002978035","https://openalex.org/W2961779879","https://openalex.org/W797688974"],"abstract_inverted_index":{"The":[0,72],"constantly":[1],"growing":[2],"amount":[3],"of":[4,12,27,41,58,77],"semiconductors":[5],"in":[6,44,97],"automotive":[7],"systems":[8],"increases":[9],"the":[10,20,38,55,75,78,98],"number":[11],"possible":[13],"defect":[14],"mechanisms,":[15],"and":[16,29,63,90,124],"therefore":[17],"raises":[18],"also":[19],"effort":[21],"to":[22,34,113],"maintain":[23],"a":[24],"sufficient":[25],"level":[26],"quality":[28],"reliability.":[30],"A":[31],"promising":[32],"solution":[33],"this":[35,50],"problem":[36],"is":[37,70],"on-line":[39],"application":[40],"structural":[42],"tests":[43,79],"key":[45],"components,":[46],"typically":[47],"ECUs.":[48],"In":[49],"work,":[51],"an":[52],"approach":[53,73],"for":[54],"optimized":[56,109],"integration":[57],"both":[59],"Software-Based":[60],"Self-Tests":[61,65],"(SBST)":[62],"Built-In":[64],"(BIST)":[66],"into":[67],"E/E":[68],"architectures":[69],"presented.":[71],"integrates":[74],"execution":[76,126],"non-intrusively,":[80],"i.":[81,117],"e.,":[82,118],"it":[83],"(a)":[84],"does":[85,92],"not":[86,93],"affect":[87],"functional":[88],"applications":[89],"(b)":[91],"require":[94],"costly":[95],"changes":[96],"communication":[99,103],"schedules":[100],"or":[101],"additional":[102],"overhead.":[104],"Via":[105],"design":[106],"space":[107],"exploration,":[108],"implementations":[110],"with":[111],"respect":[112],"multiple":[114],"conflicting":[115],"objectives,":[116],"monetary":[119],"costs,":[120],"safety,":[121],"test":[122],"quality,":[123],"required":[125],"time":[127],"are":[128],"derived.":[129]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2016-06-24T00:00:00"}