{"id":"https://openalex.org/W2140735333","doi":"https://doi.org/10.1145/2593069.2593201","title":"Remembrance of Transistors Past","display_name":"Remembrance of Transistors Past","publication_year":2014,"publication_date":"2014-05-27","ids":{"openalex":"https://openalex.org/W2140735333","doi":"https://doi.org/10.1145/2593069.2593201","mag":"2140735333"},"language":"en","primary_location":{"id":"doi:10.1145/2593069.2593201","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2593069.2593201","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 51st Annual Design Automation Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hdl.handle.net/1721.1/137447","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100754132","display_name":"Yu Li","orcid":"https://orcid.org/0000-0002-4975-4896"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Li Yu","raw_affiliation_strings":["Massachusetts Institute of Technology"],"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102784876","display_name":"Sharad Saxena","orcid":null},"institutions":[{"id":"https://openalex.org/I65376102","display_name":"PDF Solutions (United States)","ror":"https://ror.org/007737841","country_code":"US","type":"company","lineage":["https://openalex.org/I65376102"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sharad Saxena","raw_affiliation_strings":["PDF Solutions","[PDF Solutions]"],"affiliations":[{"raw_affiliation_string":"PDF Solutions","institution_ids":["https://openalex.org/I65376102"]},{"raw_affiliation_string":"[PDF Solutions]","institution_ids":["https://openalex.org/I65376102"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075541043","display_name":"Christopher P. Hess","orcid":"https://orcid.org/0000-0002-5132-5302"},"institutions":[{"id":"https://openalex.org/I65376102","display_name":"PDF Solutions (United States)","ror":"https://ror.org/007737841","country_code":"US","type":"company","lineage":["https://openalex.org/I65376102"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Christopher Hess","raw_affiliation_strings":["PDF Solutions","[PDF Solutions]"],"affiliations":[{"raw_affiliation_string":"PDF Solutions","institution_ids":["https://openalex.org/I65376102"]},{"raw_affiliation_string":"[PDF Solutions]","institution_ids":["https://openalex.org/I65376102"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048725993","display_name":"Ibrahim M. Elfadel","orcid":"https://orcid.org/0000-0003-3220-9987"},"institutions":[{"id":"https://openalex.org/I3132928613","display_name":"Sadjad University of Technology","ror":"https://ror.org/04b9hej41","country_code":"IR","type":"education","lineage":["https://openalex.org/I3132928613"]},{"id":"https://openalex.org/I4399598377","display_name":"Institute of Science and Technology","ror":"https://ror.org/02wxm3f24","country_code":null,"type":"education","lineage":["https://openalex.org/I155028946","https://openalex.org/I4399598377"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Abe Elfadel","raw_affiliation_strings":["Masdar Institute of Science and Technology"],"affiliations":[{"raw_affiliation_string":"Masdar Institute of Science and Technology","institution_ids":["https://openalex.org/I3132928613","https://openalex.org/I4399598377"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056314310","display_name":"D.A. Antoniadis","orcid":"https://orcid.org/0000-0002-4836-6525"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dimitri Antoniadis","raw_affiliation_strings":["Massachusetts Institute of Technology"],"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066048721","display_name":"Duane S. Boning","orcid":"https://orcid.org/0000-0002-0417-445X"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Duane Boning","raw_affiliation_strings":["Massachusetts Institute of Technology"],"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology","institution_ids":["https://openalex.org/I63966007"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5100754132"],"corresponding_institution_ids":["https://openalex.org/I63966007"],"apc_list":null,"apc_paid":null,"fwci":2.5148,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.89920763,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9925000071525574,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.6567184925079346},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6451834440231323},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6121989488601685},{"id":"https://openalex.org/keywords/maximum-a-posteriori-estimation","display_name":"Maximum a posteriori estimation","score":0.46576452255249023},{"id":"https://openalex.org/keywords/a-priori-and-a-posteriori","display_name":"A priori and a posteriori","score":0.4392514228820801},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.4279380440711975},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4221665859222412},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39208608865737915},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.37685468792915344},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.31197234988212585},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.19067618250846863},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17383620142936707},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1364518702030182},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.1357233226299286},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.128975510597229},{"id":"https://openalex.org/keywords/maximum-likelihood","display_name":"Maximum likelihood","score":0.08622533082962036}],"concepts":[{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.6567184925079346},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6451834440231323},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6121989488601685},{"id":"https://openalex.org/C9810830","wikidata":"https://www.wikidata.org/wiki/Q635384","display_name":"Maximum a posteriori estimation","level":3,"score":0.46576452255249023},{"id":"https://openalex.org/C75553542","wikidata":"https://www.wikidata.org/wiki/Q178161","display_name":"A priori and a posteriori","level":2,"score":0.4392514228820801},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.4279380440711975},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4221665859222412},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39208608865737915},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.37685468792915344},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.31197234988212585},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19067618250846863},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17383620142936707},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1364518702030182},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.1357233226299286},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.128975510597229},{"id":"https://openalex.org/C49781872","wikidata":"https://www.wikidata.org/wiki/Q1045555","display_name":"Maximum likelihood","level":2,"score":0.08622533082962036},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1145/2593069.2593201","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2593069.2593201","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 51st Annual Design Automation Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:dspace.mit.edu:1721.1/137447","is_oa":true,"landing_page_url":"https://hdl.handle.net/1721.1/137447","pdf_url":null,"source":{"id":"https://openalex.org/S4306400425","display_name":"DSpace@MIT (Massachusetts Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I63966007","host_organization_name":"Massachusetts Institute of Technology","host_organization_lineage":["https://openalex.org/I63966007"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-sa","license_id":"https://openalex.org/licenses/cc-by-nc-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Other repository","raw_type":"http://purl.org/eprint/type/ConferencePaper"},{"id":"pmh:oai:dspace.mit.edu:1721.1/137447.2","is_oa":true,"landing_page_url":"https://hdl.handle.net/1721.1/137447.2","pdf_url":null,"source":{"id":"https://openalex.org/S4306400425","display_name":"DSpace@MIT (Massachusetts Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I63966007","host_organization_name":"Massachusetts Institute of Technology","host_organization_lineage":["https://openalex.org/I63966007"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-sa","license_id":"https://openalex.org/licenses/cc-by-nc-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Other repository","raw_type":"Article"}],"best_oa_location":{"id":"pmh:oai:dspace.mit.edu:1721.1/137447","is_oa":true,"landing_page_url":"https://hdl.handle.net/1721.1/137447","pdf_url":null,"source":{"id":"https://openalex.org/S4306400425","display_name":"DSpace@MIT (Massachusetts Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I63966007","host_organization_name":"Massachusetts Institute of Technology","host_organization_lineage":["https://openalex.org/I63966007"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-sa","license_id":"https://openalex.org/licenses/cc-by-nc-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Other repository","raw_type":"http://purl.org/eprint/type/ConferencePaper"},"sustainable_development_goals":[{"score":0.49000000953674316,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320309369","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44"},{"id":"https://openalex.org/F4320322420","display_name":"Masdar Institute of Science and Technology","ror":"https://ror.org/05hffr360"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1506806321","https://openalex.org/W1663973292","https://openalex.org/W1994966754","https://openalex.org/W1998915140","https://openalex.org/W2020033710","https://openalex.org/W2025028595","https://openalex.org/W2076233859","https://openalex.org/W2097819249","https://openalex.org/W2108228762","https://openalex.org/W2129638963","https://openalex.org/W2132588722","https://openalex.org/W2138908842","https://openalex.org/W2143150278","https://openalex.org/W2144950713","https://openalex.org/W2167175161","https://openalex.org/W2172504065","https://openalex.org/W2518542666","https://openalex.org/W3165267979","https://openalex.org/W4212863985","https://openalex.org/W6629510986"],"related_works":["https://openalex.org/W4388311650","https://openalex.org/W5922282","https://openalex.org/W1974056099","https://openalex.org/W4245343541","https://openalex.org/W2386077341","https://openalex.org/W563589758","https://openalex.org/W62490179","https://openalex.org/W2150865841","https://openalex.org/W2138865713","https://openalex.org/W2169353922"],"abstract_inverted_index":{"In":[0],"this":[1,51],"paper,":[2],"we":[3],"propose":[4],"a":[5,71,95,115],"novel":[6],"MOSFET":[7,34],"parameter":[8],"extraction":[9,28,93,121],"method":[10,22,52,104,148],"to":[11,69,91,126],"enable":[12],"early":[13],"technology":[14],"evaluation.":[15],"The":[16,85,102,119],"distinguishing":[17],"feature":[18],"of":[19,29,33,56,62,81,99,131,145],"the":[20,27,54,79,82,128,134,142],"proposed":[21,103,120],"is":[23,53,105],"that":[24,137],"it":[25],"enables":[26],"an":[30],"entire":[31],"set":[32,98],"model":[35],"parameters":[36,80],"using":[37,94,107],"limited":[38],"and":[39,74,111],"incomplete":[40],"IV":[41],"measurements":[42,61,113],"from":[43,64],"on-chip":[44],"monitor":[45],"circuits.":[46],"An":[47],"important":[48],"step":[49],"in":[50],"use":[55],"maximum-a-posteriori":[57],"estimation":[58],"where":[59],"past":[60,109],"transistors":[63],"various":[65,108],"technologies":[66,110],"are":[67,149],"used":[68,125],"learn":[70],"prior":[72],"distribution":[73],"its":[75],"uncertainty":[76],"matrix":[77],"for":[78,114],"target":[83],"technology.":[84],"framework":[86],"then":[87],"utilizes":[88],"Bayesian":[89],"inference":[90],"facilitate":[92],"very":[96],"small":[97],"additional":[100],"measurements.":[101],"validated":[106],"post-silicon":[112],"commercial":[116],"28-nm":[117],"process.":[118],"could":[122],"also":[123],"be":[124],"characterize":[127],"statistical":[129],"variations":[130],"MOSFETs":[132],"with":[133],"significant":[135],"benefit":[136],"some":[138],"constraints":[139],"required":[140],"by":[141],"backward":[143],"propagation":[144],"variance":[146],"(BPV)":[147],"relaxed.":[150]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":5},{"year":2014,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}