{"id":"https://openalex.org/W1976197109","doi":"https://doi.org/10.1145/2593069.2593183","title":"Post-Silicon Validation of the IBM POWER8 Processor","display_name":"Post-Silicon Validation of the IBM POWER8 Processor","publication_year":2014,"publication_date":"2014-05-27","ids":{"openalex":"https://openalex.org/W1976197109","doi":"https://doi.org/10.1145/2593069.2593183","mag":"1976197109"},"language":"en","primary_location":{"id":"doi:10.1145/2593069.2593183","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2593069.2593183","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 51st Annual Design Automation Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083923985","display_name":"Amir Nahir","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Amir Nahir","raw_affiliation_strings":["IBM Research","IBM Research, -"],"affiliations":[{"raw_affiliation_string":"IBM Research","institution_ids":[]},{"raw_affiliation_string":"IBM Research, -","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065863737","display_name":"Manoj Dusanapudi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Manoj Dusanapudi","raw_affiliation_strings":["IBM Systems &amp; Technology Group"],"affiliations":[{"raw_affiliation_string":"IBM Systems &amp; Technology Group","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110753413","display_name":"Shakti Kapoor","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Shakti Kapoor","raw_affiliation_strings":["IBM Systems &amp; Technology Group"],"affiliations":[{"raw_affiliation_string":"IBM Systems &amp; Technology Group","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074782537","display_name":"Kevin Reick","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kevin Reick","raw_affiliation_strings":["IBM Systems &amp; Technology Group"],"affiliations":[{"raw_affiliation_string":"IBM Systems &amp; Technology Group","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064770930","display_name":"Wolfgang Roesner","orcid":"https://orcid.org/0009-0004-5483-3371"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Wolfgang Roesner","raw_affiliation_strings":["IBM Systems &amp; Technology Group"],"affiliations":[{"raw_affiliation_string":"IBM Systems &amp; Technology Group","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058612894","display_name":"Klaus-Dieter Schubert","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Klaus-Dieter Schubert","raw_affiliation_strings":["IBM Systems &amp; Technology Group"],"affiliations":[{"raw_affiliation_string":"IBM Systems &amp; Technology Group","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110205320","display_name":"Keith Sharp","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Keith Sharp","raw_affiliation_strings":["IBM Systems &amp; Technology Group"],"affiliations":[{"raw_affiliation_string":"IBM Systems &amp; Technology Group","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027133754","display_name":"Greg Wetli","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Greg Wetli","raw_affiliation_strings":["IBM Systems &amp; Technology Group"],"affiliations":[{"raw_affiliation_string":"IBM Systems &amp; Technology Group","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5083923985"],"corresponding_institution_ids":["https://openalex.org/I1341412227"],"apc_list":null,"apc_paid":null,"fwci":4.9036,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.95290048,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ibm","display_name":"IBM","score":0.8857320547103882},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6557182669639587},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5167483687400818},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.4644731283187866},{"id":"https://openalex.org/keywords/microarchitecture","display_name":"Microarchitecture","score":0.43677031993865967},{"id":"https://openalex.org/keywords/software-bug","display_name":"Software bug","score":0.4289742708206177},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.41757482290267944},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3817688822746277},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3379662036895752},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20992201566696167},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.1696896255016327}],"concepts":[{"id":"https://openalex.org/C70388272","wikidata":"https://www.wikidata.org/wiki/Q5968558","display_name":"IBM","level":2,"score":0.8857320547103882},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6557182669639587},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5167483687400818},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.4644731283187866},{"id":"https://openalex.org/C107598950","wikidata":"https://www.wikidata.org/wiki/Q259864","display_name":"Microarchitecture","level":2,"score":0.43677031993865967},{"id":"https://openalex.org/C1009929","wikidata":"https://www.wikidata.org/wiki/Q179550","display_name":"Software bug","level":3,"score":0.4289742708206177},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.41757482290267944},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3817688822746277},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3379662036895752},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20992201566696167},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.1696896255016327},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2593069.2593183","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2593069.2593183","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 51st Annual Design Automation Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Responsible consumption and production","score":0.5,"id":"https://metadata.un.org/sdg/12"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W298612178","https://openalex.org/W626284047","https://openalex.org/W1514254291","https://openalex.org/W1515959435","https://openalex.org/W1544635590","https://openalex.org/W1600068019","https://openalex.org/W1601834268","https://openalex.org/W1981523793","https://openalex.org/W1989178937","https://openalex.org/W2005961863","https://openalex.org/W2053176592","https://openalex.org/W2097027490","https://openalex.org/W2108870314","https://openalex.org/W2112423443","https://openalex.org/W2122146819","https://openalex.org/W2143387652","https://openalex.org/W2143849045","https://openalex.org/W2147180595","https://openalex.org/W2147524308","https://openalex.org/W2162045655","https://openalex.org/W2164380910","https://openalex.org/W2492757556","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W2398322655","https://openalex.org/W2524838473","https://openalex.org/W3081879387","https://openalex.org/W628040712","https://openalex.org/W122453572","https://openalex.org/W2351011383","https://openalex.org/W2146879484","https://openalex.org/W4221002079","https://openalex.org/W2162875803","https://openalex.org/W1757458251"],"abstract_inverted_index":{"The":[0],"post-silicon":[1],"validation":[2],"phase":[3],"in":[4,17,22,33],"a":[5],"processor's":[6],"design":[7,35],"life":[8],"cycle":[9],"is":[10],"geared":[11],"towards":[12],"finding":[13],"all":[14],"remaining":[15],"bugs":[16,32],"the":[18,34],"system.":[19],"It":[20],"is,":[21],"fact,":[23],"our":[24],"last":[25],"opportunity":[26],"to":[27,39],"find":[28],"functional":[29],"and":[30],"electrical":[31],"before":[36],"shipping":[37],"it":[38],"customers.":[40]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":7},{"year":2015,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
