{"id":"https://openalex.org/W2063832396","doi":"https://doi.org/10.1145/2591513.2591594","title":"Using adaptive read voltage thresholds to enhance the reliability of MLC NAND flash memory systems","display_name":"Using adaptive read voltage thresholds to enhance the reliability of MLC NAND flash memory systems","publication_year":2014,"publication_date":"2014-05-20","ids":{"openalex":"https://openalex.org/W2063832396","doi":"https://doi.org/10.1145/2591513.2591594","mag":"2063832396"},"language":"en","primary_location":{"id":"doi:10.1145/2591513.2591594","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2591513.2591594","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 24th edition of the great lakes symposium on VLSI","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103241728","display_name":"Nikolaos Papandreou","orcid":"https://orcid.org/0000-0001-6979-2171"},"institutions":[{"id":"https://openalex.org/I4210126328","display_name":"IBM Research - Zurich","ror":"https://ror.org/02js37d36","country_code":"CH","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210126328"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Nikolaos Papandreou","raw_affiliation_strings":["IBM Research - Zurich, Zurich, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Research - Zurich, Zurich, Switzerland","institution_ids":["https://openalex.org/I4210126328"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040727953","display_name":"Thomas Parnell","orcid":"https://orcid.org/0000-0002-1308-6590"},"institutions":[{"id":"https://openalex.org/I4210126328","display_name":"IBM Research - Zurich","ror":"https://ror.org/02js37d36","country_code":"CH","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210126328"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Thomas Parnell","raw_affiliation_strings":["IBM Research - Zurich, Zurich, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Research - Zurich, Zurich, Switzerland","institution_ids":["https://openalex.org/I4210126328"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007575599","display_name":"Haralampos Pozidis","orcid":"https://orcid.org/0000-0001-5084-6651"},"institutions":[{"id":"https://openalex.org/I4210126328","display_name":"IBM Research - Zurich","ror":"https://ror.org/02js37d36","country_code":"CH","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210126328"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Haralampos Pozidis","raw_affiliation_strings":["IBM Research - Zurich, Zurich, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Research - Zurich, Zurich, Switzerland","institution_ids":["https://openalex.org/I4210126328"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073826700","display_name":"Thomas Mittelholzer","orcid":null},"institutions":[{"id":"https://openalex.org/I4210126328","display_name":"IBM Research - Zurich","ror":"https://ror.org/02js37d36","country_code":"CH","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210126328"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Thomas Mittelholzer","raw_affiliation_strings":["IBM Research - Zurich, Zurich, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Research - Zurich, Zurich, Switzerland","institution_ids":["https://openalex.org/I4210126328"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043271107","display_name":"Evangelos Eleftheriou","orcid":"https://orcid.org/0000-0002-3826-5931"},"institutions":[{"id":"https://openalex.org/I4210126328","display_name":"IBM Research - Zurich","ror":"https://ror.org/02js37d36","country_code":"CH","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210126328"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Evangelos Eleftheriou","raw_affiliation_strings":["IBM Research - Zurich, Zurich, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Research - Zurich, Zurich, Switzerland","institution_ids":["https://openalex.org/I4210126328"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010805613","display_name":"Charles Camp","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Charles Camp","raw_affiliation_strings":["IBM Systems and Technology Group, Houston, USA","IBM Systems and Technology Group, Houston, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Systems and Technology Group, Houston, USA","institution_ids":[]},{"raw_affiliation_string":"IBM Systems and Technology Group, Houston, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017004816","display_name":"Thomas J. Griffin","orcid":"https://orcid.org/0000-0002-2814-4183"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Thomas Griffin","raw_affiliation_strings":["IBM Systems and Technology Group, Poughkeepsie, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Systems and Technology Group, Poughkeepsie, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068854170","display_name":"Gary Tressler","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Gary Tressler","raw_affiliation_strings":["IBM Systems and Technology Group, Poughkeepsie, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Systems and Technology Group, Poughkeepsie, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085917261","display_name":"Andrew Walls","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Andrew Walls","raw_affiliation_strings":["IBM Systems and Technology Group, San Jose, USA","IBM Systems and Technology Group, San Jose, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Systems and Technology Group, San Jose, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM Systems and Technology Group, San Jose, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":9,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.6786,"has_fulltext":false,"cited_by_count":39,"citation_normalized_percentile":{"value":0.95196206,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"151","last_page":"156"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12162","display_name":"Cellular Automata and Applications","score":0.9846000075340271,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11321","display_name":"Error Correcting Code Techniques","score":0.9559000134468079,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nand-gate","display_name":"NAND gate","score":0.7465590834617615},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7328512668609619},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6865266561508179},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.6456816792488098},{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.6078686714172363},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.5604910850524902},{"id":"https://openalex.org/keywords/data-retention","display_name":"Data retention","score":0.5082868933677673},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.48580288887023926},{"id":"https://openalex.org/keywords/computer-data-storage","display_name":"Computer data storage","score":0.4520074427127838},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4520062804222107},{"id":"https://openalex.org/keywords/flash-file-system","display_name":"Flash file system","score":0.4296637773513794},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3778253495693207},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.33744126558303833},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.2967798411846161},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2923409342765808},{"id":"https://openalex.org/keywords/computer-memory","display_name":"Computer memory","score":0.20792892575263977},{"id":"https://openalex.org/keywords/semiconductor-memory","display_name":"Semiconductor memory","score":0.1434009075164795},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1308896839618683}],"concepts":[{"id":"https://openalex.org/C124296912","wikidata":"https://www.wikidata.org/wiki/Q575178","display_name":"NAND gate","level":3,"score":0.7465590834617615},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7328512668609619},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6865266561508179},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.6456816792488098},{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.6078686714172363},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.5604910850524902},{"id":"https://openalex.org/C2780866740","wikidata":"https://www.wikidata.org/wiki/Q5227345","display_name":"Data retention","level":2,"score":0.5082868933677673},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.48580288887023926},{"id":"https://openalex.org/C194739806","wikidata":"https://www.wikidata.org/wiki/Q66221","display_name":"Computer data storage","level":2,"score":0.4520074427127838},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4520062804222107},{"id":"https://openalex.org/C27670709","wikidata":"https://www.wikidata.org/wiki/Q5457555","display_name":"Flash file system","level":4,"score":0.4296637773513794},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3778253495693207},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.33744126558303833},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.2967798411846161},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2923409342765808},{"id":"https://openalex.org/C92855701","wikidata":"https://www.wikidata.org/wiki/Q5830907","display_name":"Computer memory","level":3,"score":0.20792892575263977},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.1434009075164795},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1308896839618683},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2591513.2591594","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2591513.2591594","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 24th edition of the great lakes symposium on VLSI","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6299999952316284,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320337392","display_name":"Division of Electrical, Communications and Cyber Systems","ror":"https://ror.org/01krpsy48"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1972127875","https://openalex.org/W1980944860","https://openalex.org/W1984463050","https://openalex.org/W2003314673","https://openalex.org/W2055550117","https://openalex.org/W2101759317","https://openalex.org/W2102340702","https://openalex.org/W2106673654","https://openalex.org/W2108587706","https://openalex.org/W2109136771","https://openalex.org/W2109987538","https://openalex.org/W2135288278","https://openalex.org/W2149453042"],"related_works":["https://openalex.org/W164278522","https://openalex.org/W2606330551","https://openalex.org/W2101851311","https://openalex.org/W2391055460","https://openalex.org/W2085734125","https://openalex.org/W2082238054","https://openalex.org/W1937038249","https://openalex.org/W2351735955","https://openalex.org/W1989463597","https://openalex.org/W2042631286"],"abstract_inverted_index":{"NAND":[0,121],"Flash":[1,28,60,90,122],"memory":[2],"is":[3],"not":[4],"only":[5],"the":[6,38,46,65,89,97,101,110,117,127,137,141],"ubiquitous":[7],"storage":[8,21],"medium":[9],"in":[10,19,37,116,145],"consumer":[11],"applications,":[12],"but":[13],"has":[14],"also":[15],"started":[16],"to":[17,33,63,87,100,154],"appear":[18],"enterprise":[20,78],"systems":[22],"as":[23,42],"well.":[24],"MLC":[25,59],"and":[26,82,94,135,152],"TLC":[27],"technology":[29,57],"made":[30],"it":[31],"possible":[32],"store":[34],"multiple":[35],"bits":[36],"same":[39],"silicon":[40],"area":[41],"SLC,":[43],"thus":[44,95],"reducing":[45],"cost":[47],"per":[48],"amount":[49],"of":[50,67,112,120,139,147],"data":[51,150],"stored.":[52],"However,":[53],"at":[54],"current":[55],"sub-20nm":[56],"nodes,":[58],"devices":[61],"fail":[62],"provide":[64],"levels":[66],"raw":[68],"reliability,":[69],"mainly":[70],"cycling":[71,148],"endurance,":[72,149],"that":[73],"are":[74,85],"required":[75],"by":[76],"typical":[77],"applications.":[79],"Advanced":[80],"signal-processing":[81],"coding":[83],"schemes":[84],"needed":[86],"improve":[88],"bit":[91],"error":[92],"rate":[93],"elevate":[96],"device":[98],"reliability":[99],"desired":[102],"level.":[103],"In":[104],"this":[105],"paper,":[106],"we":[107],"report":[108],"on":[109],"use":[111],"adaptive":[113],"voltage":[114,130,143],"thresholds":[115,131,144],"read":[118,129,142,155],"operation":[119],"devices.":[123],"We":[124],"discuss":[125],"how":[126],"optimal":[128],"can":[132],"be":[133],"determined,":[134],"assess":[136],"benefit":[138],"adapting":[140],"terms":[146],"retention":[151],"resilience":[153],"disturb.":[156]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":11},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}