{"id":"https://openalex.org/W2089135503","doi":"https://doi.org/10.1145/2564926","title":"Critical-reliability path identification and delay analysis","display_name":"Critical-reliability path identification and delay analysis","publication_year":2014,"publication_date":"2014-02-01","ids":{"openalex":"https://openalex.org/W2089135503","doi":"https://doi.org/10.1145/2564926","mag":"2089135503"},"language":"en","primary_location":{"id":"doi:10.1145/2564926","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2564926","pdf_url":null,"source":{"id":"https://openalex.org/S96198239","display_name":"ACM Journal on Emerging Technologies in Computing Systems","issn_l":"1550-4832","issn":["1550-4832","1550-4840"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Journal on Emerging Technologies in Computing Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101859288","display_name":"Jifeng Chen","orcid":"https://orcid.org/0000-0003-1083-2858"},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Jifeng Chen","raw_affiliation_strings":["University of Connecticut, Storrs CT","University of Connecticut Storrs, CT"],"affiliations":[{"raw_affiliation_string":"University of Connecticut, Storrs CT","institution_ids":["https://openalex.org/I140172145"]},{"raw_affiliation_string":"University of Connecticut Storrs, CT","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101750084","display_name":"Shuo Wang","orcid":"https://orcid.org/0009-0001-0768-7920"},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shuo Wang","raw_affiliation_strings":["University of Connecticut, Storrs CT","University of Connecticut Storrs, CT"],"affiliations":[{"raw_affiliation_string":"University of Connecticut, Storrs CT","institution_ids":["https://openalex.org/I140172145"]},{"raw_affiliation_string":"University of Connecticut Storrs, CT","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113697198","display_name":"Mohammad Tehranipoor","orcid":null},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mohammad Tehranipoor","raw_affiliation_strings":["University of Connecticut, Storrs CT","University of Connecticut Storrs, CT"],"affiliations":[{"raw_affiliation_string":"University of Connecticut, Storrs CT","institution_ids":["https://openalex.org/I140172145"]},{"raw_affiliation_string":"University of Connecticut Storrs, CT","institution_ids":["https://openalex.org/I140172145"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5101859288"],"corresponding_institution_ids":["https://openalex.org/I140172145"],"apc_list":null,"apc_paid":null,"fwci":1.49,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.85103788,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"10","issue":"2","first_page":"1","last_page":"21"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7806079387664795},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7750399708747864},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5772929191589355},{"id":"https://openalex.org/keywords/workload","display_name":"Workload","score":0.5717191696166992},{"id":"https://openalex.org/keywords/negative-bias-temperature-instability","display_name":"Negative-bias temperature instability","score":0.5297549366950989},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.5186178088188171},{"id":"https://openalex.org/keywords/lookup-table","display_name":"Lookup table","score":0.5070679187774658},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.43301093578338623},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4299930930137634},{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.4204050898551941},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3132595419883728},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22384461760520935},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.1593543291091919},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.1561596691608429},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.14313271641731262},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10768914222717285},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.0967676043510437}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7806079387664795},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7750399708747864},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5772929191589355},{"id":"https://openalex.org/C2778476105","wikidata":"https://www.wikidata.org/wiki/Q628539","display_name":"Workload","level":2,"score":0.5717191696166992},{"id":"https://openalex.org/C557185","wikidata":"https://www.wikidata.org/wiki/Q6987194","display_name":"Negative-bias temperature instability","level":5,"score":0.5297549366950989},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.5186178088188171},{"id":"https://openalex.org/C134835016","wikidata":"https://www.wikidata.org/wiki/Q690265","display_name":"Lookup table","level":2,"score":0.5070679187774658},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.43301093578338623},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4299930930137634},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.4204050898551941},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3132595419883728},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22384461760520935},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.1593543291091919},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.1561596691608429},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.14313271641731262},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10768914222717285},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.0967676043510437},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2564926","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2564926","pdf_url":null,"source":{"id":"https://openalex.org/S96198239","display_name":"ACM Journal on Emerging Technologies in Computing Systems","issn_l":"1550-4832","issn":["1550-4832","1550-4840"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Journal on Emerging Technologies in Computing Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"},{"id":"https://openalex.org/F4320307791","display_name":"Cisco Systems","ror":"https://ror.org/03yt1ez60"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W1586504780","https://openalex.org/W1970620885","https://openalex.org/W1990785435","https://openalex.org/W1991431227","https://openalex.org/W2040091297","https://openalex.org/W2041424982","https://openalex.org/W2066959447","https://openalex.org/W2097579272","https://openalex.org/W2100661413","https://openalex.org/W2101686625","https://openalex.org/W2103792078","https://openalex.org/W2103821368","https://openalex.org/W2109231632","https://openalex.org/W2112542663","https://openalex.org/W2113728962","https://openalex.org/W2113764022","https://openalex.org/W2120802493","https://openalex.org/W2122507955","https://openalex.org/W2122757690","https://openalex.org/W2125169487","https://openalex.org/W2129225986","https://openalex.org/W2134111163","https://openalex.org/W2135748666","https://openalex.org/W2138916868","https://openalex.org/W2142908374","https://openalex.org/W2156064231","https://openalex.org/W2159583646","https://openalex.org/W2164178706","https://openalex.org/W2170333286","https://openalex.org/W2545401637","https://openalex.org/W2745045259","https://openalex.org/W4229487452","https://openalex.org/W4237900519","https://openalex.org/W4254947099","https://openalex.org/W6600339457","https://openalex.org/W6814250579"],"related_works":["https://openalex.org/W1970920853","https://openalex.org/W2099679924","https://openalex.org/W2738622559","https://openalex.org/W1977755957","https://openalex.org/W2115165828","https://openalex.org/W2126834173","https://openalex.org/W1982822282","https://openalex.org/W2076372184","https://openalex.org/W2142908374","https://openalex.org/W2471494153"],"abstract_inverted_index":{"Circuit":[0],"reliability":[1,35,102,164,223],"analysis":[2,85,110,143,190,224],"at":[3],"the":[4,38,60,72,125,132,148,195],"presilicon":[5],"stage":[6],"has":[7],"become":[8],"vital":[9],"for":[10,44,64,107,116],"sub-45nm":[11],"technology":[12],"designs":[13,43,90],"in":[14,37,55,71,200],"particular,":[15],"due":[16,98,130],"to":[17,58,88,123,131,146,166,183],"aging":[18,50,84,136,152,173],"effects,":[19],"such":[20],"as":[21],"Negative":[22],"Bias":[23],"Temperature":[24],"Instability":[25],"(NBTI)":[26],"and":[27,111,216],"Hot":[28],"Carrier":[29],"Injection":[30],"(HCI).":[31],"To":[32],"avoid":[33],"potential":[34],"hazards":[36],"postsilicon":[39],"stage,":[40],"current":[41,162],"large-scale":[42],"commercial":[45,163,222],"implementation":[46],"overpessimistically":[47],"analyze":[48],"circuit":[49],"under":[51],"assumed":[52],"worst-case":[53],"workload":[54],"order":[56],"not":[57,114,128],"violate":[59],"corner":[61],"cases":[62],"even":[63],"low":[65,92],"possibilities,":[66],"thus":[67,112],"introducing":[68],"unnecessary":[69],"margin":[70],"design":[73],"timing":[74,109],"analysis.":[75,174],"The":[76],"major":[77],"issue":[78],"is":[79,96,144,158],"lack":[80],"of":[81,135,150,194],"an":[82],"effective":[83],"method":[86],"applicable":[87],"large":[89,117],"with":[91,221],"CPU":[93],"runtime,":[94],"which":[95],"mainly":[97],"to:":[99],"(1)":[100],"conventional":[101],"tools":[103,165,225],"are":[104,113,127,180],"extremely":[105],"time-consuming":[106],"circuit-level":[108,172],"practical":[115],"designs;":[118],"(2)":[119],"mathematical":[120,178],"models":[121,179],"developed":[122,159],"expedite":[124],"process":[126],"accurate":[129],"high":[133,169],"complexity":[134],"effects.":[137],"In":[138],"this":[139],"article,":[140],"a":[141,155,187,201],"comprehensive":[142],"presented":[145],"highlight":[147],"importance":[149],"each":[151],"parameter.":[153],"Then,":[154],"novel":[156],"methodology":[157],"based":[160],"on":[161,171],"guarantee":[167],"its":[168],"accuracy":[170],"Existing":[175],"proven":[176],"low-level":[177],"further":[181],"enhanced":[182],"extensively":[184],"speed":[185],"up":[186],"higher":[188],"level":[189],"by":[191],"taking":[192],"advantage":[193],"explicit":[196],"intermediate":[197],"conditions":[198],"stored":[199],"pregenerated":[202],"lookup":[203],"table.":[204],"Our":[205],"results":[206],"indicate":[207],"\u2265244":[208],"X":[209],"improved":[210],"computational":[211],"efficiency,":[212],"\u22645%":[213],"relative":[214],"error,":[215],"\u22640.7%":[217],"absolute":[218],"error":[219],"compared":[220],"(e.g.,":[226],"HSPICE":[227],"MOSRA).":[228]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2026-04-21T08:09:41.155169","created_date":"2025-10-10T00:00:00"}