{"id":"https://openalex.org/W2161469101","doi":"https://doi.org/10.1145/2540708.2540720","title":"Virtually-aged sampling DMR","display_name":"Virtually-aged sampling DMR","publication_year":2013,"publication_date":"2013-12-07","ids":{"openalex":"https://openalex.org/W2161469101","doi":"https://doi.org/10.1145/2540708.2540720","mag":"2161469101"},"language":"en","primary_location":{"id":"doi:10.1145/2540708.2540720","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2540708.2540720","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 46th Annual IEEE/ACM International Symposium on Microarchitecture","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008283910","display_name":"Raghuraman Balasubramanian","orcid":null},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Raghuraman Balasubramanian","raw_affiliation_strings":["University of Wisconsin-Madison"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Wisconsin-Madison","institution_ids":["https://openalex.org/I135310074"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028943049","display_name":"Karthikeyan Sankaralingam","orcid":"https://orcid.org/0000-0002-8315-2389"},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Karthikeyan Sankaralingam","raw_affiliation_strings":["University of Wisconsin-Madison"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Wisconsin-Madison","institution_ids":["https://openalex.org/I135310074"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I135310074"],"apc_list":null,"apc_paid":null,"fwci":0.9602,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.79994426,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"123","last_page":"135"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7122738361358643},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6087784767150879},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5726761221885681},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5613834261894226},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5422762632369995},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.5252556204795837},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5056581497192383},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4464343786239624},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4277753233909607},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3573616147041321},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2792094945907593},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19311586022377014},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.09670752286911011},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08939328789710999},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08733206987380981}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7122738361358643},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6087784767150879},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5726761221885681},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5613834261894226},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5422762632369995},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.5252556204795837},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5056581497192383},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4464343786239624},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4277753233909607},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3573616147041321},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2792094945907593},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19311586022377014},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.09670752286911011},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08939328789710999},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08733206987380981},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2540708.2540720","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2540708.2540720","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 46th Annual IEEE/ACM International Symposium on Microarchitecture","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7300000190734863,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G1672068982","display_name":null,"funder_award_id":"CNS-1117782","funder_id":"https://openalex.org/F4320337388","funder_display_name":"Division of Computer and Network Systems"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320337388","display_name":"Division of Computer and Network Systems","ror":"https://ror.org/02rdzmk74"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":64,"referenced_works":["https://openalex.org/W147650083","https://openalex.org/W1529803699","https://openalex.org/W1911029421","https://openalex.org/W1969008267","https://openalex.org/W1973551931","https://openalex.org/W1975295215","https://openalex.org/W1989662831","https://openalex.org/W1990575577","https://openalex.org/W1991025821","https://openalex.org/W2003900900","https://openalex.org/W2069452468","https://openalex.org/W2089185783","https://openalex.org/W2098695358","https://openalex.org/W2098736822","https://openalex.org/W2099828501","https://openalex.org/W2099971661","https://openalex.org/W2100866260","https://openalex.org/W2102863623","https://openalex.org/W2104114347","https://openalex.org/W2104677471","https://openalex.org/W2105058680","https://openalex.org/W2105407828","https://openalex.org/W2110283673","https://openalex.org/W2112192542","https://openalex.org/W2114100940","https://openalex.org/W2114626867","https://openalex.org/W2115173506","https://openalex.org/W2116059696","https://openalex.org/W2123891574","https://openalex.org/W2125169487","https://openalex.org/W2126310216","https://openalex.org/W2126869140","https://openalex.org/W2126977030","https://openalex.org/W2128941141","https://openalex.org/W2130016203","https://openalex.org/W2132362854","https://openalex.org/W2136534898","https://openalex.org/W2141565132","https://openalex.org/W2143283746","https://openalex.org/W2149866574","https://openalex.org/W2150526221","https://openalex.org/W2151113616","https://openalex.org/W2151845324","https://openalex.org/W2153998895","https://openalex.org/W2154169726","https://openalex.org/W2155581886","https://openalex.org/W2156204788","https://openalex.org/W2158382658","https://openalex.org/W2162351670","https://openalex.org/W2163421219","https://openalex.org/W2163890539","https://openalex.org/W2164754947","https://openalex.org/W2166022257","https://openalex.org/W2167253897","https://openalex.org/W2167678606","https://openalex.org/W2171945873","https://openalex.org/W2465088004","https://openalex.org/W3147035810","https://openalex.org/W4237087767","https://openalex.org/W4240016538","https://openalex.org/W4240237526","https://openalex.org/W4241149914","https://openalex.org/W4255519882","https://openalex.org/W6605987033"],"related_works":["https://openalex.org/W2130922779","https://openalex.org/W2121043529","https://openalex.org/W2082366402","https://openalex.org/W2120242933","https://openalex.org/W1657300322","https://openalex.org/W2055295790","https://openalex.org/W2083209667","https://openalex.org/W2185394135","https://openalex.org/W3155997325","https://openalex.org/W2742111403"],"abstract_inverted_index":{"Hardware":[0],"failure":[1,10,229],"due":[2],"to":[3,74,83,142,161,176,227,259],"wearout":[4,34,92,163],"is":[5,12,16,72,82,204,237,257],"a":[6,91,102,140,187,196],"growing":[7],"concern.":[8],"Circuit":[9],"prediction":[11],"an":[13],"approach":[14],"that":[15,129,202],"effective":[17],"if":[18],"it":[19],"meets":[20],"the":[21,66,76,86,98,106,111,116,146,192,243],"following":[22],"requirements:":[23],"low":[24,27,50],"design":[25,78],"complexity,":[26],"overheads,":[28],"generality":[29],"(supporting":[30],"various":[31],"types":[32],"of":[33,68,217],"including":[35],"soft":[36],"and":[37,40,48,88,108,137,166,206,214,219,232,253,265],"hard":[38],"breakdown)":[39],"high":[41],"accuracy.":[42],"State-of-the-art":[43],"techniques,":[44],"which":[45],"typically":[46],"detect":[47,110,228],"measure":[49],"level":[51],"circuit":[52,70],"properties":[53],"like":[54],"gate":[55],"delay":[56,99],"cannot":[57],"deliver":[58],"on":[59,191,195,208],"all":[60,209],"four":[61,77,210],"requirements.":[62,79],"Moving":[63],"away":[64],"from":[65],"paradigm":[67],"measuring":[69],"delays":[71],"key":[73],"satisfying":[75],"Our":[80,154],"insight":[81],"virtually":[84,114],"age":[85,115],"processor":[87,194],"thus":[89],"manifest":[90],"fault":[93,107,125],"early":[94,165,234],"--":[95],"we":[96,127,138],"convert":[97],"degradation":[100],"into":[101],"logic":[103],"fault;":[104],"expose":[105,143,162],"then":[109],"fault.":[112],"To":[113],"processor,":[117],"reducing":[118],"supply":[119],"voltage":[120],"effectively":[121],"mirrors":[122],"wearout.":[123],"For":[124],"exposure,":[126],"observe":[128],"faults":[130,144,164],"in":[131],"critical":[132],"paths":[133,148],"are":[134],"naturally":[135],"exposed":[136],"develop":[139,174],"technique":[141],"along":[145],"non-critical":[147],"using":[149,169],"clock":[150],"phase":[151],"shifting":[152],"logic.":[153],"system,":[155],"Aged-SDMR,":[156],"combines":[157],"these":[158,178],"two":[159,179],"mechanisms":[160,180],"detects":[167],"them":[168],"Sampling":[170],"DMR.":[171],"We":[172,185,200],"also":[173],"principles":[175],"combine":[177],"with":[181],"any":[182,250],"detection":[183],"technique.":[184],"implement":[186],"prototype":[188],"system":[189],"based":[190],"OpenRISC":[193],"Xilinx":[197],"Zync":[198],"FPGA.":[199],"demonstrate":[201],"Aged-SDMR":[203,241],"practical":[205],"delivers":[207],"requirements,":[211],"has":[212],"area":[213],"energy":[215],"overheads":[216],"9%":[218],"0.7%":[220],"respectively,":[221],"takes":[222],"at":[223],"most":[224],"0.4":[225],"days":[226],"after":[230],"onset":[231],"its":[233],"warning":[235],"window":[236],"configurable.":[238],"More":[239],"generally,":[240],"provides":[242],"capability":[244],"for":[245],"low-overhead":[246],"DMR":[247],"execution":[248],"without":[249],"missed":[251],"errors":[252],"100%":[254],"coverage.":[255],"It":[256],"likely":[258],"find":[260],"broad":[261],"uses":[262],"within":[263],"reliability":[264],"elsewhere.":[266]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}