{"id":"https://openalex.org/W2034588552","doi":"https://doi.org/10.1145/2518148.2518169","title":"Predictable, system-level fault tolerance in composite","display_name":"Predictable, system-level fault tolerance in composite","publication_year":2013,"publication_date":"2013-07-01","ids":{"openalex":"https://openalex.org/W2034588552","doi":"https://doi.org/10.1145/2518148.2518169","mag":"2034588552"},"language":"en","primary_location":{"id":"doi:10.1145/2518148.2518169","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2518148.2518169","pdf_url":null,"source":{"id":"https://openalex.org/S4210187018","display_name":"ACM SIGBED Review","issn_l":"1551-3688","issn":["1551-3688"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM SIGBED Review","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113495528","display_name":"Jiguo Song","orcid":null},"institutions":[{"id":"https://openalex.org/I193531525","display_name":"George Washington University","ror":"https://ror.org/00y4zzh67","country_code":"US","type":"education","lineage":["https://openalex.org/I193531525"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jiguo Song","raw_affiliation_strings":["The George Washington University, Washington, DC","The George Washington University Washington, DC"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The George Washington University, Washington, DC","institution_ids":["https://openalex.org/I193531525"]},{"raw_affiliation_string":"The George Washington University Washington, DC","institution_ids":["https://openalex.org/I193531525"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026572895","display_name":"Gabriel Parmer","orcid":"https://orcid.org/0000-0003-1343-4492"},"institutions":[{"id":"https://openalex.org/I193531525","display_name":"George Washington University","ror":"https://ror.org/00y4zzh67","country_code":"US","type":"education","lineage":["https://openalex.org/I193531525"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gabriel Parmer","raw_affiliation_strings":["The George Washington University, Washington, DC","The George Washington University Washington, DC"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The George Washington University, Washington, DC","institution_ids":["https://openalex.org/I193531525"]},{"raw_affiliation_string":"The George Washington University Washington, DC","institution_ids":["https://openalex.org/I193531525"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I193531525"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10020054,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"10","issue":"2","first_page":"31","last_page":"31"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11424","display_name":"Security and Verification in Computing","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.6548136472702026},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.6372078061103821},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6250103712081909},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5873011350631714},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.5103108286857605},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.48730313777923584},{"id":"https://openalex.org/keywords/scheduling","display_name":"Scheduling (production processes)","score":0.4717367887496948},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4600159823894501},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.44044482707977295},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.43177908658981323},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3964316248893738},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22128134965896606},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.127597838640213}],"concepts":[{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.6548136472702026},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6372078061103821},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6250103712081909},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5873011350631714},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.5103108286857605},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.48730313777923584},{"id":"https://openalex.org/C206729178","wikidata":"https://www.wikidata.org/wiki/Q2271896","display_name":"Scheduling (production processes)","level":2,"score":0.4717367887496948},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4600159823894501},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.44044482707977295},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.43177908658981323},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3964316248893738},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22128134965896606},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.127597838640213},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2518148.2518169","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2518148.2518169","pdf_url":null,"source":{"id":"https://openalex.org/S4210187018","display_name":"ACM SIGBED Review","issn_l":"1551-3688","issn":["1551-3688"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM SIGBED Review","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.6299999952316284}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1987371008","https://openalex.org/W2134738691","https://openalex.org/W2169355195"],"related_works":["https://openalex.org/W2971479921","https://openalex.org/W2607474334","https://openalex.org/W2138861322","https://openalex.org/W2902466307","https://openalex.org/W3145923041","https://openalex.org/W2946906624","https://openalex.org/W841176518","https://openalex.org/W188714996","https://openalex.org/W2101077206","https://openalex.org/W2157727563"],"abstract_inverted_index":{"Intermittent":[0],"faults":[1,23,37,77],"are":[2],"an":[3],"increasingly":[4,19],"challenging":[5],"difficulty":[6],"in":[7,70],"embedded":[8],"and":[9,59,91,99,106],"real-time":[10],"systems.":[11],"As":[12],"process":[13],"technologies":[14],"shrink":[15],"circuitry,":[16],"it":[17],"becomes":[18],"susceptible":[20],"to":[21,72],"transient":[22],"from":[24,56],"radiation":[25],"sources":[26],"such":[27,38],"as":[28,32,39],"cosmic":[29],"rays.":[30],"Additionally,":[31],"software":[33,43],"complexity":[34],"increases,":[35],"intermittent":[36],"race":[40],"conditions":[41],"challenge":[42],"reliability.":[44],"Given":[45],"these":[46],"motivations,":[47],"research":[48,66],"has":[49,67],"approached":[50],"the":[51,73,79,100],"paired":[52],"problems":[53],"of":[54,76,108],"recovering":[55],"a":[57],"fault,":[58],"doing":[60],"so":[61],"predictably.":[62],"However,":[63],"most":[64],"past":[65],"been":[68],"limited":[69],"focus":[71],"predictable":[74],"recovery":[75,105],"at":[78],"application-level":[80],".":[81],"Examples":[82],"include":[83],"systems":[84],"infrastructures":[85],"[2]":[86],"enabling":[87],"application":[88],"fault":[89],"recovery,":[90],"scheduling":[92],"theory":[93],"[3]":[94],"that":[95],"considers":[96],"periodic":[97],"faults,":[98],"impact":[101],"on":[102],"schedulability":[103],"for":[104],"re-execution":[107],"failed":[109],"applications.":[110]},"counts_by_year":[],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}