{"id":"https://openalex.org/W4235655120","doi":"https://doi.org/10.1145/2491899.2465562","title":"Boosting efficiency of fault detection and recovery throughapplication-specific comparison and checkpointing","display_name":"Boosting efficiency of fault detection and recovery throughapplication-specific comparison and checkpointing","publication_year":2013,"publication_date":"2013-06-11","ids":{"openalex":"https://openalex.org/W4235655120","doi":"https://doi.org/10.1145/2491899.2465562"},"language":"en","primary_location":{"id":"doi:10.1145/2491899.2465562","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2491899.2465562","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 14th ACM SIGPLAN/SIGBED conference on Languages, compilers and tools for embedded systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100353673","display_name":"Hao Chen","orcid":"https://orcid.org/0009-0001-6480-7976"},"institutions":[{"id":"https://openalex.org/I86501945","display_name":"University of Delaware","ror":"https://ror.org/01sbq1a82","country_code":"US","type":"education","lineage":["https://openalex.org/I86501945"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Hao Chen","raw_affiliation_strings":["University of Delaware, Newark, DE, USA"],"affiliations":[{"raw_affiliation_string":"University of Delaware, Newark, DE, USA","institution_ids":["https://openalex.org/I86501945"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016268650","display_name":"Chengmo Yang","orcid":"https://orcid.org/0000-0003-0978-1504"},"institutions":[{"id":"https://openalex.org/I86501945","display_name":"University of Delaware","ror":"https://ror.org/01sbq1a82","country_code":"US","type":"education","lineage":["https://openalex.org/I86501945"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chengmo Yang","raw_affiliation_strings":["University of Delaware, Newark, DE, USA"],"affiliations":[{"raw_affiliation_string":"University of Delaware, Newark, DE, USA","institution_ids":["https://openalex.org/I86501945"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5100353673"],"corresponding_institution_ids":["https://openalex.org/I86501945"],"apc_list":null,"apc_paid":null,"fwci":0.9458,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.80085238,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"13","last_page":"20"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8300519585609436},{"id":"https://openalex.org/keywords/boosting","display_name":"Boosting (machine learning)","score":0.6436073780059814},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.61968594789505},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5498261451721191},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.49737241864204407},{"id":"https://openalex.org/keywords/execution-time","display_name":"Execution time","score":0.4472653269767761},{"id":"https://openalex.org/keywords/hotspot","display_name":"Hotspot (geology)","score":0.42801088094711304},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4234501123428345},{"id":"https://openalex.org/keywords/control-flow","display_name":"Control flow","score":0.4154047966003418},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3920063078403473},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.36829787492752075},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.35233038663864136},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.34912630915641785},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.16035127639770508},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10404202342033386},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.08583998680114746},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.06641620397567749}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8300519585609436},{"id":"https://openalex.org/C46686674","wikidata":"https://www.wikidata.org/wiki/Q466303","display_name":"Boosting (machine learning)","level":2,"score":0.6436073780059814},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.61968594789505},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5498261451721191},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.49737241864204407},{"id":"https://openalex.org/C2989134064","wikidata":"https://www.wikidata.org/wiki/Q288510","display_name":"Execution time","level":2,"score":0.4472653269767761},{"id":"https://openalex.org/C146481406","wikidata":"https://www.wikidata.org/wiki/Q105131","display_name":"Hotspot (geology)","level":2,"score":0.42801088094711304},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4234501123428345},{"id":"https://openalex.org/C160191386","wikidata":"https://www.wikidata.org/wiki/Q868299","display_name":"Control flow","level":2,"score":0.4154047966003418},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3920063078403473},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.36829787492752075},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.35233038663864136},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.34912630915641785},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.16035127639770508},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10404202342033386},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.08583998680114746},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.06641620397567749},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C8058405","wikidata":"https://www.wikidata.org/wiki/Q46255","display_name":"Geophysics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2491899.2465562","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2491899.2465562","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 14th ACM SIGPLAN/SIGBED conference on Languages, compilers and tools for embedded systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.6000000238418579,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1686420892","https://openalex.org/W1825716325","https://openalex.org/W2021010544","https://openalex.org/W2034593585","https://openalex.org/W2054569285","https://openalex.org/W2086551977","https://openalex.org/W2095667776","https://openalex.org/W2102480715","https://openalex.org/W2104086123","https://openalex.org/W2104225326","https://openalex.org/W2112360707","https://openalex.org/W2114067856","https://openalex.org/W2116015411","https://openalex.org/W2116059696","https://openalex.org/W2117285153","https://openalex.org/W2117747343","https://openalex.org/W2124153277","https://openalex.org/W2133000954","https://openalex.org/W2146879484","https://openalex.org/W2150244954","https://openalex.org/W4243863555"],"related_works":["https://openalex.org/W2125652721","https://openalex.org/W1540371141","https://openalex.org/W1549363203","https://openalex.org/W2147697413","https://openalex.org/W2154063878","https://openalex.org/W4231274751","https://openalex.org/W2556012038","https://openalex.org/W2058158409","https://openalex.org/W2962722502","https://openalex.org/W2390438373"],"abstract_inverted_index":{"While":[0],"the":[1,9,49,52,101,116,121,135,141,151,159,170,178,184,189],"unending":[2],"technology":[3],"scaling":[4],"has":[5],"brought":[6],"reliability":[7],"to":[8,27,58,79,165],"forefront":[10],"of":[11,13,39,48,104,127,169,177,182],"concerns":[12],"semiconductor":[14],"industry,":[15],"fault":[16,32,108,194],"tolerance":[17,33],"techniques":[18,50],"are":[19,146],"still":[20],"rarely":[21],"incorporated":[22],"into":[23],"existing":[24],"designs":[25],"due":[26],"their":[28],"high":[29],"overhead.":[30],"One":[31],"scheme":[34],"that":[35,82,99,138,158],"receives":[36],"a":[37,55,113],"lot":[38],"research":[40],"attention":[41],"is":[42,163],"duplication":[43],"and":[44,70,110,123,131,173],"checkpointing.":[45,111],"However,":[46],"most":[47],"in":[51,68,94],"category":[53],"employ":[54],"blind":[56],"strategy":[57],"compare":[59],"instruction":[60,105,136],"results,":[61],"therefore":[62],"not":[63],"only":[64,134],"generating":[65],"large":[66],"overhead":[67,172],"buffering":[69],"verifying":[71],"these":[72,90],"values,":[73],"but":[74],"also":[75],"inducing":[76],"unnecessary":[77],"rollbacks":[78],"recover":[80],"faults":[81,181,186],"will":[83],"never":[84],"influence":[85,140],"subsequent":[86],"execution.":[87],"To":[88],"tackle":[89],"issues,":[91],"we":[92],"introduce":[93],"this":[95],"paper":[96],"an":[97],"approach":[98],"identifies":[100,120],"minimum":[102],"set":[103],"results":[106,137,144],"for":[107],"detection":[109],"For":[112],"given":[114],"application,":[115],"proposed":[117,160],"technique":[118,162],"first":[119],"control":[122],"data":[124],"flow":[125],"information":[126],"each":[128],"execution":[129],"hotspot,":[130],"then":[132],"selects":[133],"either":[139],"final":[142],"program":[143],"or":[145],"needed":[147],"during":[148],"re-execution":[149],"as":[150],"comparison":[152,171],"set.":[153],"Our":[154],"experimental":[155],"studies":[156],"demonstrate":[157],"hotspot-targeting":[161],"able":[164],"reduce":[166],"nearly":[167],"88%":[168],"mask":[174],"over":[175],"38%":[176],"total":[179],"injected":[180,185],"all":[183],"while":[187],"at":[188],"same":[190],"time":[191],"delivering":[192],"full":[193],"coverage.":[195]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}