{"id":"https://openalex.org/W1974291029","doi":"https://doi.org/10.1145/2463209.2488881","title":"Simulation knowledge extraction and reuse in constrained random processor verification","display_name":"Simulation knowledge extraction and reuse in constrained random processor verification","publication_year":2013,"publication_date":"2013-05-28","ids":{"openalex":"https://openalex.org/W1974291029","doi":"https://doi.org/10.1145/2463209.2488881","mag":"1974291029"},"language":"en","primary_location":{"id":"doi:10.1145/2463209.2488881","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2463209.2488881","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 50th Annual Design Automation Conference","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100344172","display_name":"Wen Chen","orcid":"https://orcid.org/0000-0002-6721-6266"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wen Chen","raw_affiliation_strings":["University of California - Santa Barbara","University of California Santa Barbara Santa Barbara, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California - Santa Barbara","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"University of California Santa Barbara Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100369642","display_name":"Li-C. Wang","orcid":"https://orcid.org/0000-0003-4851-8004"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Li-Chung Wang","raw_affiliation_strings":["University of California - Santa Barbara","University of California Santa Barbara Santa Barbara, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California - Santa Barbara","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"University of California Santa Barbara Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Jay Bhadra","orcid":null},"institutions":[{"id":"https://openalex.org/I100625452","display_name":"ON Semiconductor (United States)","ror":"https://ror.org/03nw6pt28","country_code":"US","type":"company","lineage":["https://openalex.org/I100625452"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jay Bhadra","raw_affiliation_strings":["Freescale Semiconduction Inc","Freescale Semiconduction Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Freescale Semiconduction Inc","institution_ids":["https://openalex.org/I100625452"]},{"raw_affiliation_string":"Freescale Semiconduction Inc., Austin, TX, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011349515","display_name":"Magdy S. Abadir","orcid":"https://orcid.org/0000-0003-4046-2472"},"institutions":[{"id":"https://openalex.org/I100625452","display_name":"ON Semiconductor (United States)","ror":"https://ror.org/03nw6pt28","country_code":"US","type":"company","lineage":["https://openalex.org/I100625452"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Magdy Abadir","raw_affiliation_strings":["Freescale Semiconduction Inc","Freescale Semiconduction Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Freescale Semiconduction Inc","institution_ids":["https://openalex.org/I100625452"]},{"raw_affiliation_string":"Freescale Semiconduction Inc., Austin, TX, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":31,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8232355713844299},{"id":"https://openalex.org/keywords/reuse","display_name":"Reuse","score":0.8023322820663452},{"id":"https://openalex.org/keywords/template","display_name":"Template","score":0.5605157613754272},{"id":"https://openalex.org/keywords/random-testing","display_name":"Random testing","score":0.5038647055625916},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4379817247390747},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.36236897110939026},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.35329878330230713},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.3210160434246063},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.31890469789505005},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.28281381726264954},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.2668098211288452},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.24236178398132324},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.0856812596321106}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8232355713844299},{"id":"https://openalex.org/C206588197","wikidata":"https://www.wikidata.org/wiki/Q846574","display_name":"Reuse","level":2,"score":0.8023322820663452},{"id":"https://openalex.org/C82714645","wikidata":"https://www.wikidata.org/wiki/Q438331","display_name":"Template","level":2,"score":0.5605157613754272},{"id":"https://openalex.org/C106159264","wikidata":"https://www.wikidata.org/wiki/Q17146789","display_name":"Random testing","level":4,"score":0.5038647055625916},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4379817247390747},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.36236897110939026},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.35329878330230713},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.3210160434246063},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.31890469789505005},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.28281381726264954},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.2668098211288452},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.24236178398132324},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0856812596321106},{"id":"https://openalex.org/C548081761","wikidata":"https://www.wikidata.org/wiki/Q180388","display_name":"Waste management","level":1,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2463209.2488881","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2463209.2488881","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 50th Annual Design Automation Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1487086790","https://openalex.org/W1585743408","https://openalex.org/W1848866101","https://openalex.org/W1970899955","https://openalex.org/W2038272084","https://openalex.org/W2069736170","https://openalex.org/W2081852086","https://openalex.org/W2084666366","https://openalex.org/W2096842682","https://openalex.org/W2098165956","https://openalex.org/W2113340410","https://openalex.org/W2117874980","https://openalex.org/W2131736714","https://openalex.org/W2136000097","https://openalex.org/W2998617017","https://openalex.org/W4251008063"],"related_works":["https://openalex.org/W2147116815","https://openalex.org/W2527390967","https://openalex.org/W2102816555","https://openalex.org/W3155744979","https://openalex.org/W2405583496","https://openalex.org/W2547155723","https://openalex.org/W4295918990","https://openalex.org/W2240631859","https://openalex.org/W2079626666","https://openalex.org/W2024254950"],"abstract_inverted_index":{"This":[0],"work":[1],"proposes":[2],"a":[3,54],"methodology":[4],"of":[5,23,53],"knowledge":[6,31,73],"extraction":[7],"from":[8,75],"constrained-random":[9,38,76],"simulation":[10],"data.":[11],"Feature-based":[12],"analysis":[13],"is":[14],"employed":[15],"to":[16,36,84,92],"extract":[17],"rules":[18],"describing":[19],"the":[20,50,61,72,81,86],"unique":[21],"properties":[22],"novel":[24],"assembly":[25],"programs":[26],"hitting":[27],"special":[28],"conditions.":[29],"The":[30,44,65],"learned":[32],"can":[33,79],"be":[34],"reused":[35],"guide":[37],"test":[39,82],"generation":[40],"towards":[41],"uncovered":[42],"corners.":[43],"experiments":[45],"are":[46,90],"conducted":[47],"based":[48],"on":[49],"verification":[51,63],"environment":[52],"commercial":[55],"processor":[56],"design,":[57],"in":[58],"parallel":[59],"with":[60],"on-going":[62],"efforts.":[64],"experimental":[66],"results":[67],"show":[68],"that":[69,88],"by":[70,94],"leveraging":[71],"extracted":[74],"simulation,":[77],"we":[78],"improve":[80],"templates":[83],"activate":[85,93],"assertions":[87],"otherwise":[89],"difficult":[91],"extensive":[95],"simulation.":[96]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}