{"id":"https://openalex.org/W2051357347","doi":"https://doi.org/10.1145/2463209.2488822","title":"Multidimensional analog test metrics estimation using extreme value theory and statistical blockade","display_name":"Multidimensional analog test metrics estimation using extreme value theory and statistical blockade","publication_year":2013,"publication_date":"2013-05-28","ids":{"openalex":"https://openalex.org/W2051357347","doi":"https://doi.org/10.1145/2463209.2488822","mag":"2051357347"},"language":"en","primary_location":{"id":"doi:10.1145/2463209.2488822","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2463209.2488822","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 50th Annual Design Automation Conference","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091734149","display_name":"Haralampos\u2010G. Stratigopoulos","orcid":"https://orcid.org/0000-0002-9943-5607"},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I177483745","display_name":"Universit\u00e9 Joseph Fourier","ror":"https://ror.org/02aj0kh94","country_code":"FR","type":"education","lineage":["https://openalex.org/I177483745"]},{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Haralampos-G. Stratigopoulos","raw_affiliation_strings":["TIMA Laboratory (CNRS - Grenoble INP - UJF), Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TIMA Laboratory (CNRS - Grenoble INP - UJF), Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I177483745","https://openalex.org/I4210087012","https://openalex.org/I899635006"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107399967","display_name":"Pierre Faubet","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Pierre Faubet","raw_affiliation_strings":["Infiniscale S.A., Grenoble-Montbonnot, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Infiniscale S.A., Grenoble-Montbonnot, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100479272","display_name":"Yoann Courant","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yoann Courant","raw_affiliation_strings":["Infiniscale S.A., Grenoble-Montbonnot, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Infiniscale S.A., Grenoble-Montbonnot, France","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110098133","display_name":"Firas Mohamed","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Firas Mohamed","raw_affiliation_strings":["Infiniscale S.A., Grenoble-Montbonnot, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Infiniscale S.A., Grenoble-Montbonnot, France","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.076,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.75522508,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11798","display_name":"Optimal Experimental Design Methods","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.7578291893005371},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6347863078117371},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5381840467453003},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.5048633217811584},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.49723222851753235},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.48644566535949707},{"id":"https://openalex.org/keywords/statistical-hypothesis-testing","display_name":"Statistical hypothesis testing","score":0.45692846179008484},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.44467663764953613},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.41649046540260315},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.34727227687835693},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.34101158380508423},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.32893896102905273},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.26270678639411926},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.20623335242271423},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15897318720817566}],"concepts":[{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.7578291893005371},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6347863078117371},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5381840467453003},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.5048633217811584},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.49723222851753235},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.48644566535949707},{"id":"https://openalex.org/C87007009","wikidata":"https://www.wikidata.org/wiki/Q210832","display_name":"Statistical hypothesis testing","level":2,"score":0.45692846179008484},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.44467663764953613},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.41649046540260315},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.34727227687835693},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.34101158380508423},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.32893896102905273},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.26270678639411926},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20623335242271423},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15897318720817566},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2463209.2488822","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2463209.2488822","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 50th Annual Design Automation Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1498464051","https://openalex.org/W1500657154","https://openalex.org/W1686846969","https://openalex.org/W1988733033","https://openalex.org/W2034650804","https://openalex.org/W2054559231","https://openalex.org/W2107756161","https://openalex.org/W2109824007","https://openalex.org/W2124372352","https://openalex.org/W2130282462","https://openalex.org/W2133229660","https://openalex.org/W2136007135","https://openalex.org/W2136081346","https://openalex.org/W2136522087","https://openalex.org/W2153437063","https://openalex.org/W2158683023","https://openalex.org/W2161195949","https://openalex.org/W2950090773","https://openalex.org/W4254512903"],"related_works":["https://openalex.org/W4285708951","https://openalex.org/W2147986372","https://openalex.org/W2543176856","https://openalex.org/W2157212570","https://openalex.org/W3088373974","https://openalex.org/W2624668974","https://openalex.org/W2806771822","https://openalex.org/W4230966676","https://openalex.org/W2799101079","https://openalex.org/W2111803469"],"abstract_inverted_index":{"The":[0,113],"high":[1],"cost":[2,80],"of":[3,19,39,88,129,135,139,150,158],"testing":[4],"certain":[5],"analog,":[6],"mixed-signal,":[7],"and":[8,106,121],"RF":[9],"circuits":[10,53],"has":[11],"driven":[12],"in":[13,143],"the":[14,17,25,43,49,86,101,144],"recent":[15],"years":[16],"development":[18],"alternative":[20,71,151],"low-cost":[21],"tests":[22,72,152],"to":[23,69,99],"replace":[24],"most":[26],"costly":[27],"or":[28,155],"even":[29],"all":[30,154],"standard":[31,159],"specification":[32,160],"tests.":[33,161],"However,":[34],"there":[35],"is":[36,75,82,115,133],"a":[37,97,126,148,156],"lack":[38],"solutions":[40],"for":[41,52],"evaluating":[42],"parametric":[44,102,140],"test":[45,50,64,79,90,103,141],"error,":[46],"that":[47,78],"is,":[48],"error":[51,104,142],"with":[54,108],"process":[55],"variations,":[56],"resulting":[57],"from":[58],"this":[59,62,93],"replacement.":[60],"For":[61],"reason,":[63],"engineers":[65],"are":[66],"often":[67],"reluctant":[68],"adopt":[70],"since":[73],"it":[74,132],"not":[76,83],"guaranteed":[77],"reduction":[81],"achieved":[84],"at":[85],"expense":[87],"sacrificing":[89],"quality.":[91],"In":[92],"paper,":[94],"we":[95],"present":[96],"technique":[98,114],"estimate":[100],"fast":[105],"reliably":[107],"parts":[109],"per":[110],"million":[111],"accuracy.":[112],"based":[116],"on":[117,125],"extreme":[118],"value":[119],"theory":[120],"statistical":[122],"blockade.":[123],"Relying":[124],"small":[127],"number":[128],"targeted":[130],"simulations,":[131],"capable":[134],"providing":[136],"accurate":[137],"estimates":[138],"general":[145],"scenario":[146],"where":[147],"set":[149],"replaces":[153],"subset":[157]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}