{"id":"https://openalex.org/W2057781592","doi":"https://doi.org/10.1145/2445196.2445461","title":"Test-first Java for beginners (abstract only)","display_name":"Test-first Java for beginners (abstract only)","publication_year":2013,"publication_date":"2013-03-06","ids":{"openalex":"https://openalex.org/W2057781592","doi":"https://doi.org/10.1145/2445196.2445461","mag":"2057781592"},"language":"en","primary_location":{"id":"doi:10.1145/2445196.2445461","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2445196.2445461","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceeding of the 44th ACM technical symposium on Computer science education","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079551786","display_name":"Viera K. Proulx","orcid":null},"institutions":[{"id":"https://openalex.org/I12912129","display_name":"Northeastern University","ror":"https://ror.org/04t5xt781","country_code":"US","type":"education","lineage":["https://openalex.org/I12912129"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Viera K. Proulx","raw_affiliation_strings":["Northeastern University, Boston, MA, USA"],"affiliations":[{"raw_affiliation_string":"Northeastern University, Boston, MA, USA","institution_ids":["https://openalex.org/I12912129"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5079551786"],"corresponding_institution_ids":["https://openalex.org/I12912129"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.1702432,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"745","last_page":"745"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9735000133514404,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9334999918937683,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.743444561958313},{"id":"https://openalex.org/keywords/java","display_name":"Java","score":0.7026498317718506},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5671353936195374},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.567078709602356},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.517665445804596},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5042275190353394},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.4991168975830078},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.45863187313079834},{"id":"https://openalex.org/keywords/software-testing","display_name":"Software testing","score":0.43166399002075195},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4177209734916687},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.40836983919143677},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3855981230735779},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.21021637320518494},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12037760019302368}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.743444561958313},{"id":"https://openalex.org/C548217200","wikidata":"https://www.wikidata.org/wiki/Q251","display_name":"Java","level":2,"score":0.7026498317718506},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5671353936195374},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.567078709602356},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.517665445804596},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5042275190353394},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.4991168975830078},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.45863187313079834},{"id":"https://openalex.org/C2984328558","wikidata":"https://www.wikidata.org/wiki/Q188522","display_name":"Software testing","level":3,"score":0.43166399002075195},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4177209734916687},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.40836983919143677},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3855981230735779},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.21021637320518494},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12037760019302368},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2445196.2445461","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2445196.2445461","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceeding of the 44th ACM technical symposium on Computer science education","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/4","display_name":"Quality Education","score":0.5299999713897705}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2038917144"],"related_works":["https://openalex.org/W2393524141","https://openalex.org/W2365130684","https://openalex.org/W2370255574","https://openalex.org/W2169676947","https://openalex.org/W2906367154","https://openalex.org/W2106502108","https://openalex.org/W2783560053","https://openalex.org/W2098899017","https://openalex.org/W2381807899","https://openalex.org/W2382598150"],"abstract_inverted_index":{"Test-First":[0],"Design":[1],"is":[2],"well-regarded":[3],"process":[4],"among":[5],"software":[6],"developers.":[7],"Practitioner":[8],"report":[9],"that":[10],"it":[11],"encourages":[12],"better":[13],"program":[14],"design,":[15],"improves":[16],"the":[17,23],"testability":[18],"and":[19,21],"reliability,":[20],"reduces":[22],"stress.":[24]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}