{"id":"https://openalex.org/W2078287369","doi":"https://doi.org/10.1145/2435264.2435280","title":"Fully-functional FPGA prototype with fine-grain programmable body biasing","display_name":"Fully-functional FPGA prototype with fine-grain programmable body biasing","publication_year":2013,"publication_date":"2013-02-11","ids":{"openalex":"https://openalex.org/W2078287369","doi":"https://doi.org/10.1145/2435264.2435280","mag":"2078287369"},"language":"en","primary_location":{"id":"doi:10.1145/2435264.2435280","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2435264.2435280","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the ACM/SIGDA international symposium on Field programmable gate arrays","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049602728","display_name":"Masakazu Hioki","orcid":"https://orcid.org/0000-0002-5641-9252"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Masakazu Hioki","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan","National Institute of Advanced Industrial Science and Technology (AIST) , Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST) , Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110235024","display_name":"Toshihiro Sekigawa","orcid":null},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshihiro Sekigawa","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan","National Institute of Advanced Industrial Science and Technology (AIST) , Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST) , Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105820724","display_name":"Tadashi Nakagawa","orcid":"https://orcid.org/0000-0001-8872-6129"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tadashi Nakagawa","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan","National Institute of Advanced Industrial Science and Technology (AIST) , Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST) , Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111904254","display_name":"Hanpei Koike","orcid":null},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hanpei Koike","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan","National Institute of Advanced Industrial Science and Technology (AIST) , Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST) , Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110465575","display_name":"Yohei Matsumoto","orcid":null},"institutions":[{"id":"https://openalex.org/I48840829","display_name":"Tokyo University of Marine Science and Technology","ror":"https://ror.org/048nxq511","country_code":"JP","type":"education","lineage":["https://openalex.org/I48840829"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yohei Matsumoto","raw_affiliation_strings":["Tokyo University of Marine Science and Technology, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Tokyo University of Marine Science and Technology, Tokyo, Japan","institution_ids":["https://openalex.org/I48840829"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111904253","display_name":"Takashi Kawanami","orcid":null},"institutions":[{"id":"https://openalex.org/I125852741","display_name":"Kanazawa Institute of Technology","ror":"https://ror.org/02ws33e43","country_code":"JP","type":"education","lineage":["https://openalex.org/I125852741"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takashi Kawanami","raw_affiliation_strings":["Kanazawa Institute of Technology, Kanazawa, Japan"],"affiliations":[{"raw_affiliation_string":"Kanazawa Institute of Technology, Kanazawa, Japan","institution_ids":["https://openalex.org/I125852741"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054071085","display_name":"Toshiyuki Tsutsumi","orcid":"https://orcid.org/0000-0002-3566-390X"},"institutions":[{"id":"https://openalex.org/I16656306","display_name":"Meiji University","ror":"https://ror.org/02rqvrp93","country_code":"JP","type":"education","lineage":["https://openalex.org/I16656306"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshiyuki Tsutsumi","raw_affiliation_strings":["Meiji University, Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"Meiji University, Kawasaki, Japan","institution_ids":["https://openalex.org/I16656306"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5049602728"],"corresponding_institution_ids":["https://openalex.org/I73613424"],"apc_list":null,"apc_paid":null,"fwci":1.8916,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.87290811,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"73","last_page":"80"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.745903730392456},{"id":"https://openalex.org/keywords/ring-oscillator","display_name":"Ring oscillator","score":0.5471658706665039},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5148395895957947},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.4528256058692932},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.43993157148361206},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.42620429396629333},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4195736348628998},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39550304412841797},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.3822650909423828},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.38105714321136475},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3535703420639038},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3513275980949402},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2703624367713928},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2115687131881714},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.18152517080307007}],"concepts":[{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.745903730392456},{"id":"https://openalex.org/C104111718","wikidata":"https://www.wikidata.org/wiki/Q2153973","display_name":"Ring oscillator","level":3,"score":0.5471658706665039},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5148395895957947},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.4528256058692932},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.43993157148361206},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.42620429396629333},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4195736348628998},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39550304412841797},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.3822650909423828},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.38105714321136475},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3535703420639038},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3513275980949402},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2703624367713928},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2115687131881714},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.18152517080307007}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2435264.2435280","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2435264.2435280","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the ACM/SIGDA international symposium on Field programmable gate arrays","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.6499999761581421,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1515491391","https://openalex.org/W1603708675","https://openalex.org/W2008694370","https://openalex.org/W2022698427","https://openalex.org/W2035847677","https://openalex.org/W2109677689","https://openalex.org/W2124090880","https://openalex.org/W2137769675","https://openalex.org/W2137978438","https://openalex.org/W2138840350","https://openalex.org/W2141519923","https://openalex.org/W2151731855"],"related_works":["https://openalex.org/W2069427488","https://openalex.org/W4281694563","https://openalex.org/W2080696413","https://openalex.org/W2163182355","https://openalex.org/W1506140395","https://openalex.org/W4232799642","https://openalex.org/W2912082923","https://openalex.org/W3195700791","https://openalex.org/W3018478474","https://openalex.org/W4226436952"],"abstract_inverted_index":{"A":[0],"fully-functional":[1],"FPGA":[2,91,100,191],"prototype":[3],"chip":[4],"in":[5,46,107],"which":[6,62],"the":[7,34,90,98,102,123,149,152,157,165,176,183,206,211,224],"programmable":[8,79,178],"body":[9,80,118,179,196,213,226],"bias":[10,81,119,180,197],"voltage":[11,120,137,141],"can":[12],"be":[13],"individually":[14],"applied":[15],"to":[16,130,142,203],"elemental":[17],"circuits":[18,53],"such":[19],"as":[20,67,69,164],"MUXes,":[21],"LUT":[22],"and":[23,33,41,71,83,138,148],"DFF":[24],"is":[25],"fabricated":[26,99],"using":[27],"low-power":[28],"90-nm":[29],"bulk":[30],"CMOS":[31],"technology":[32],"area":[35],"overhead,":[36],"dynamic":[37],"current,":[38],"static":[39,103,124,220],"current":[40,104,125,221],"operational":[42],"speed":[43],"are":[44,54,170],"evaluated":[45],"silicon.":[47],"In":[48,109],"measurements,":[49],"10":[50],"ISCAS":[51],"benchmark":[52],"implemented":[55,189],"by":[56,105,112,133,192,209,223],"employing":[57],"newly":[58],"developed":[59],"CAD":[60],"tools":[61],"consist":[63],"of":[64,89,151,161,186,201,219],"VT":[65],"mapper":[66],"well":[68],"placer":[70],"router.":[72],"Mask":[73],"layout":[74],"shows":[75],"that":[76,97],"well-separated":[77],"margins,":[78],"circuits,":[82],"additional":[84],"configuration":[85],"memories":[86],"occupy":[87],"54%":[88],"tile":[92],"area.":[93],"Measurement":[94],"results":[95],"show":[96],"reduces":[101],"91.4%":[106],"average.":[108],"addition,":[110],"evaluations":[111],"implementing":[113],"ring":[114,187],"oscillator":[115,188],"with":[116],"various":[117],"pairs":[121],"demonstrate":[122],"reduction":[126],"from":[127],"23.1":[128],"uA":[129,132],"1.0":[131],"assigning":[134],"low":[135,172],"threshold":[136,140,173],"high":[139],"MOSFETs":[143,169,204],"on":[144,190,205],"a":[145],"critical":[146],"path":[147,208],"rest":[150],"MOSFETs,":[153],"respectively":[154],"while":[155,199],"maintaining":[156],"same":[158],"oscillation":[159,184],"frequency":[160,166,185],"6.6":[162],"MHz":[163],"when":[167],"all":[168],"assigned":[171],"voltage.":[174],"Moreover":[175],"fine-grain":[177],"technique":[181],"accelerates":[182],"aggressively":[193],"applying":[194,210],"forward":[195,225],"voltage,":[198],"assignment":[200],"HVT":[202],"non-critical":[207],"reverse":[212],"biasing":[214],"effectively":[215],"suppresses":[216],"exponential":[217],"increase":[218],"caused":[222],"biasing.":[227]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}