{"id":"https://openalex.org/W2089160800","doi":"https://doi.org/10.1145/2429384.2429493","title":"Active compensation technique for the thin-film transistor variations and OLED aging of mobile device displays","display_name":"Active compensation technique for the thin-film transistor variations and OLED aging of mobile device displays","publication_year":2012,"publication_date":"2012-11-05","ids":{"openalex":"https://openalex.org/W2089160800","doi":"https://doi.org/10.1145/2429384.2429493","mag":"2089160800"},"language":"en","primary_location":{"id":"doi:10.1145/2429384.2429493","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2429384.2429493","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the International Conference on Computer-Aided Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014546196","display_name":"Xiang Chen","orcid":"https://orcid.org/0000-0001-5100-1482"},"institutions":[{"id":"https://openalex.org/I170201317","display_name":"University of Pittsburgh","ror":"https://ror.org/01an3r305","country_code":"US","type":"education","lineage":["https://openalex.org/I170201317"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Xiang Chen","raw_affiliation_strings":["University of Pittsburgh, Pittsburgh, PA","Department of Electrical and Computer Engineering, University of Pittsburgh Pittsburgh, PA, USA 15261"],"affiliations":[{"raw_affiliation_string":"University of Pittsburgh, Pittsburgh, PA","institution_ids":["https://openalex.org/I170201317"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Pittsburgh Pittsburgh, PA, USA 15261","institution_ids":["https://openalex.org/I170201317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000748332","display_name":"Beiye Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I170201317","display_name":"University of Pittsburgh","ror":"https://ror.org/01an3r305","country_code":"US","type":"education","lineage":["https://openalex.org/I170201317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Beiye Liu","raw_affiliation_strings":["University of Pittsburgh, Pittsburgh, PA","Department of Electrical and Computer Engineering, University of Pittsburgh Pittsburgh, PA, USA 15261"],"affiliations":[{"raw_affiliation_string":"University of Pittsburgh, Pittsburgh, PA","institution_ids":["https://openalex.org/I170201317"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Pittsburgh Pittsburgh, PA, USA 15261","institution_ids":["https://openalex.org/I170201317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058073627","display_name":"Yiran Chen","orcid":"https://orcid.org/0000-0002-1486-8412"},"institutions":[{"id":"https://openalex.org/I170201317","display_name":"University of Pittsburgh","ror":"https://ror.org/01an3r305","country_code":"US","type":"education","lineage":["https://openalex.org/I170201317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yiran Chen","raw_affiliation_strings":["University of Pittsburgh, Pittsburgh, PA","Department of Electrical and Computer Engineering, University of Pittsburgh Pittsburgh, PA, USA 15261"],"affiliations":[{"raw_affiliation_string":"University of Pittsburgh, Pittsburgh, PA","institution_ids":["https://openalex.org/I170201317"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Pittsburgh Pittsburgh, PA, USA 15261","institution_ids":["https://openalex.org/I170201317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103092947","display_name":"Mengying Zhao","orcid":"https://orcid.org/0000-0001-7891-5436"},"institutions":[{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Mengying Zhao","raw_affiliation_strings":["City University of Hong Kong, Hong Kong, China","Department of Computer Science, City University of Hong Kong, Hong Kong, China 999077"],"affiliations":[{"raw_affiliation_string":"City University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I168719708"]},{"raw_affiliation_string":"Department of Computer Science, City University of Hong Kong, Hong Kong, China 999077","institution_ids":["https://openalex.org/I168719708"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101441768","display_name":"Chun Jason Xue","orcid":"https://orcid.org/0000-0002-6431-9868"},"institutions":[{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Chun Jason Xue","raw_affiliation_strings":["City University of Hong Kong, Hong Kong, China","Department of Computer Science, City University of Hong Kong, Hong Kong, China 999077"],"affiliations":[{"raw_affiliation_string":"City University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I168719708"]},{"raw_affiliation_string":"Department of Computer Science, City University of Hong Kong, Hong Kong, China 999077","institution_ids":["https://openalex.org/I168719708"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100750078","display_name":"Xiaojun Guo","orcid":"https://orcid.org/0000-0003-3946-9458"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaojun Guo","raw_affiliation_strings":["Shanghai Jiao Tong University, Shanghai, China","School of Electronic, Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China 200240#TAB#"],"affiliations":[{"raw_affiliation_string":"Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"School of Electronic, Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China 200240#TAB#","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5014546196"],"corresponding_institution_ids":["https://openalex.org/I170201317"],"apc_list":null,"apc_paid":null,"fwci":0.2455,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.61311907,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10611","display_name":"Organic Light-Emitting Diodes Research","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9860000014305115,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/thin-film-transistor","display_name":"Thin-film transistor","score":0.9219334125518799},{"id":"https://openalex.org/keywords/oled","display_name":"OLED","score":0.8867541551589966},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.6160625219345093},{"id":"https://openalex.org/keywords/mobile-device","display_name":"Mobile device","score":0.6139591932296753},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5915400385856628},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5811333656311035},{"id":"https://openalex.org/keywords/flat-panel-display","display_name":"Flat panel display","score":0.516465425491333},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.46457940340042114},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.45374685525894165},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.4464522898197174},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4361081123352051},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4353242814540863},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.4277438223361969},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3834618330001831},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.31678712368011475},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.19801238179206848},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.15064755082130432},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14221304655075073},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09487831592559814},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.070680171251297}],"concepts":[{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.9219334125518799},{"id":"https://openalex.org/C150759737","wikidata":"https://www.wikidata.org/wiki/Q209593","display_name":"OLED","level":3,"score":0.8867541551589966},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.6160625219345093},{"id":"https://openalex.org/C186967261","wikidata":"https://www.wikidata.org/wiki/Q5082128","display_name":"Mobile device","level":2,"score":0.6139591932296753},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5915400385856628},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5811333656311035},{"id":"https://openalex.org/C2780526400","wikidata":"https://www.wikidata.org/wiki/Q125171","display_name":"Flat panel display","level":2,"score":0.516465425491333},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.46457940340042114},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.45374685525894165},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.4464522898197174},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4361081123352051},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4353242814540863},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.4277438223361969},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3834618330001831},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.31678712368011475},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.19801238179206848},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.15064755082130432},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14221304655075073},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09487831592559814},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.070680171251297},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2429384.2429493","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2429384.2429493","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the International Conference on Computer-Aided Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G8091958298","display_name":null,"funder_award_id":"CityU 123811CityU 123210","funder_id":"https://openalex.org/F4320321592","funder_display_name":"Research Grants Council, University Grants Committee"}],"funders":[{"id":"https://openalex.org/F4320321592","display_name":"Research Grants Council, University Grants Committee","ror":"https://ror.org/00djwmt25"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1882695162","https://openalex.org/W1971625441","https://openalex.org/W1979838208","https://openalex.org/W2001154320","https://openalex.org/W2022410226","https://openalex.org/W2055614185","https://openalex.org/W2058256062","https://openalex.org/W2063622053","https://openalex.org/W2072486247","https://openalex.org/W2114392649","https://openalex.org/W2122545612","https://openalex.org/W2130208263","https://openalex.org/W2132420897","https://openalex.org/W2139320080","https://openalex.org/W2140609839","https://openalex.org/W2143848687","https://openalex.org/W2154486703","https://openalex.org/W2157591936","https://openalex.org/W2170489687","https://openalex.org/W3145425974","https://openalex.org/W6664148185"],"related_works":["https://openalex.org/W2383635002","https://openalex.org/W2043482736","https://openalex.org/W2092967817","https://openalex.org/W1972415538","https://openalex.org/W2595891850","https://openalex.org/W2120973318","https://openalex.org/W2031149689","https://openalex.org/W2393940638","https://openalex.org/W2155908773","https://openalex.org/W4243386552"],"abstract_inverted_index":{"OLED":[0,22,47,56,138,163],"is":[1,98,110,132,159,167],"becoming":[2],"the":[3,18,26,30,44,52,72,120,124,147,154,157,162],"main":[4],"stream":[5],"display":[6,27,48,114,145,164],"for":[7,119,127,137,142],"mobile":[8,34,104,144],"devices.":[9],"The":[10,106],"process":[11,129],"variations":[12,54],"of":[13,21,46],"thin-film":[14],"transistors":[15],"(TFT)":[16],"and":[17,29,55,70,75,93,135,161],"aging":[19,58,139],"degradation":[20],"devices":[23,35],"severely":[24],"impact":[25],"quality":[28],"user":[31],"experience":[32],"on":[33,87],"throughout":[36],"lifetime.":[37],"In":[38],"this":[39],"paper,":[40],"we":[41,61],"quantitatively":[42],"study":[43],"nonuniformity":[45,73,158],"panels":[49],"incurred":[50],"by":[51],"TFT":[53,128],"cell":[57],"effect.":[59],"Furthermore,":[60],"develop":[62],"a":[63],"pixel":[64],"level":[65],"sensing":[66,122],"circuit":[67],"that":[68],"detects":[69],"quantifies":[71],"condition":[74],"corresponding":[76],"compensating":[77],"technique.":[78],"This":[79],"proposed":[80,107,121,155],"technique":[81],"can":[82],"be":[83,101],"actively":[84],"invoked":[85],"based":[86],"various":[88],"conditions":[89],"with":[90,103,112],"flexible":[91],"configuration":[92],"minimal":[94],"extra":[95],"overhead,":[96],"which":[97],"suitable":[99],"to":[100],"integrated":[102],"displays.":[105],"technique's":[108],"performance":[109],"simulated":[111],"different":[113],"contents.":[115],"Experiments":[116],"show":[117],"that:":[118],"circuit,":[123],"error":[125],"rate":[126,149],"variation":[130],"evaluation":[131],"only":[133],"4.7%~7.9%,":[134],"0.29%~7.6%":[136],"degradation.":[140],"And":[141],"typical":[143],"content,":[146],"compensation":[148],"reaches":[150],"94.04%~100%.":[151],"After":[152],"applying":[153],"techniques,":[156],"unrecognizable":[160],"panel's":[165],"lifespan":[166],"highly":[168],"extended.":[169]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}