{"id":"https://openalex.org/W2109986557","doi":"https://doi.org/10.1145/2429384.2429391","title":"Small-delay-fault ATPG with waveform accuracy","display_name":"Small-delay-fault ATPG with waveform accuracy","publication_year":2012,"publication_date":"2012-11-05","ids":{"openalex":"https://openalex.org/W2109986557","doi":"https://doi.org/10.1145/2429384.2429391","mag":"2109986557"},"language":"en","primary_location":{"id":"doi:10.1145/2429384.2429391","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2429384.2429391","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the International Conference on Computer-Aided Design","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111203264","display_name":"Matthias Sauer","orcid":null},"institutions":[{"id":"https://openalex.org/I161046081","display_name":"University of Freiburg","ror":"https://ror.org/0245cg223","country_code":"DE","type":"education","lineage":["https://openalex.org/I161046081"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Matthias Sauer","raw_affiliation_strings":["Albert-Ludwigs-University Freiburg, Freiburg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Albert-Ludwigs-University Freiburg, Freiburg, Germany","institution_ids":["https://openalex.org/I161046081"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109113395","display_name":"Alexander Czutro","orcid":null},"institutions":[{"id":"https://openalex.org/I161046081","display_name":"University of Freiburg","ror":"https://ror.org/0245cg223","country_code":"DE","type":"education","lineage":["https://openalex.org/I161046081"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Alexander Czutro","raw_affiliation_strings":["Albert-Ludwigs-University Freiburg, Freiburg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Albert-Ludwigs-University Freiburg, Freiburg, Germany","institution_ids":["https://openalex.org/I161046081"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027416202","display_name":"Ilia Polian","orcid":"https://orcid.org/0000-0002-6563-2725"},"institutions":[{"id":"https://openalex.org/I186354981","display_name":"University of Passau","ror":"https://ror.org/05ydjnb78","country_code":"DE","type":"education","lineage":["https://openalex.org/I186354981"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ilia Polian","raw_affiliation_strings":["University of Passau, Passau, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Passau, Passau, Germany","institution_ids":["https://openalex.org/I186354981"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038861833","display_name":"Bernd Becker","orcid":"https://orcid.org/0000-0003-4031-3258"},"institutions":[{"id":"https://openalex.org/I161046081","display_name":"University of Freiburg","ror":"https://ror.org/0245cg223","country_code":"DE","type":"education","lineage":["https://openalex.org/I161046081"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Bernd Becker","raw_affiliation_strings":["Albert-Ludwigs-University Freiburg, Freiburg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Albert-Ludwigs-University Freiburg, Freiburg, Germany","institution_ids":["https://openalex.org/I161046081"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":48,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"30","last_page":"36"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.859540581703186},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6861497163772583},{"id":"https://openalex.org/keywords/false-positive-paradox","display_name":"False positive paradox","score":0.6276564002037048},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5970481634140015},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5877238512039185},{"id":"https://openalex.org/keywords/boolean-satisfiability-problem","display_name":"Boolean satisfiability problem","score":0.5271430015563965},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.5093356370925903},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4986851215362549},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.48420217633247375},{"id":"https://openalex.org/keywords/satisfiability","display_name":"Satisfiability","score":0.46702101826667786},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.4397154152393341},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.4396580755710602},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2976946234703064},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.12753957509994507},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11780485510826111}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.859540581703186},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6861497163772583},{"id":"https://openalex.org/C64869954","wikidata":"https://www.wikidata.org/wiki/Q1859747","display_name":"False positive paradox","level":2,"score":0.6276564002037048},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5970481634140015},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5877238512039185},{"id":"https://openalex.org/C6943359","wikidata":"https://www.wikidata.org/wiki/Q875276","display_name":"Boolean satisfiability problem","level":2,"score":0.5271430015563965},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.5093356370925903},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4986851215362549},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.48420217633247375},{"id":"https://openalex.org/C168773769","wikidata":"https://www.wikidata.org/wiki/Q1350299","display_name":"Satisfiability","level":2,"score":0.46702101826667786},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.4397154152393341},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.4396580755710602},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2976946234703064},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12753957509994507},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11780485510826111},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2429384.2429391","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2429384.2429391","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the International Conference on Computer-Aided Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3128059425","display_name":null,"funder_award_id":"GRK 1103BE 1176-15/2PO 1220-2/2","funder_id":"https://openalex.org/F4320320879","funder_display_name":"Deutsche Forschungsgemeinschaft"}],"funders":[{"id":"https://openalex.org/F4320320879","display_name":"Deutsche Forschungsgemeinschaft","ror":"https://ror.org/018mejw64"},{"id":"https://openalex.org/F4320321421","display_name":"Albert-Ludwigs-Universit\u00e4t Freiburg","ror":"https://ror.org/0245cg223"},{"id":"https://openalex.org/F4320325850","display_name":"Universit\u00e4t Stuttgart","ror":"https://ror.org/04vnq7t77"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W13277579","https://openalex.org/W193675003","https://openalex.org/W1503570386","https://openalex.org/W1558754093","https://openalex.org/W1950282396","https://openalex.org/W2009778415","https://openalex.org/W2048373673","https://openalex.org/W2059158944","https://openalex.org/W2093652003","https://openalex.org/W2095754347","https://openalex.org/W2097410912","https://openalex.org/W2116840443","https://openalex.org/W2125148189","https://openalex.org/W2139772579","https://openalex.org/W2140004775","https://openalex.org/W2145445699","https://openalex.org/W2150754796","https://openalex.org/W2151275401","https://openalex.org/W2154695555","https://openalex.org/W2156640787","https://openalex.org/W2160444875","https://openalex.org/W2161054100","https://openalex.org/W2164777834","https://openalex.org/W2169103267","https://openalex.org/W2505156323","https://openalex.org/W6600530048","https://openalex.org/W6601206172","https://openalex.org/W6684925917"],"related_works":["https://openalex.org/W2340957901","https://openalex.org/W4256030018","https://openalex.org/W2147400189","https://openalex.org/W3147038789","https://openalex.org/W2068571131","https://openalex.org/W2115005577","https://openalex.org/W1555400249","https://openalex.org/W2952274626","https://openalex.org/W2092357065","https://openalex.org/W2913077774"],"abstract_inverted_index":{"The":[0,85,98],"detection":[1],"of":[2,14,23,82,95,106,137,171,185],"small-delay":[3,155,180],"faults":[4,52,59],"is":[5,100,118,165,168,189,195],"traditionally":[6],"performed":[7],"by":[8,111],"sensitizing":[9],"transitions":[10],"on":[11,78,102],"a":[12,112,160,174],"path":[13,138],"sufficient":[15],"length":[16],"from":[17],"an":[18,21,66,103],"input":[19],"to":[20,182],"output":[22],"the":[24,28,83,107,121,148,163,183,190],"circuit":[25],"going":[26],"through":[27],"fault":[29,156,164],"site.":[30],"While":[31],"this":[32,188],"approach":[33],"allows":[34],"efficient":[35],"test":[36,68,108,161],"generation":[37,70,109],"algorithms,":[38],"it":[39],"may":[40],"result":[41],"in":[42,120,153],"false":[43,46,142,145],"positives":[44,143],"and":[45,75,93,117,129,144,167,198],"negatives":[47,146],"as":[48,55,62],"well,":[49],"i.e.":[50],"undetected":[51],"are":[53,60],"classified":[54,61],"detected":[56],"or":[57],"detectable":[58],"undetectable.":[63],"We":[64],"present":[65],"automatic":[67],"pattern":[69],"algorithm":[71,99,193],"which":[72],"considers":[73],"waveforms":[74],"their":[76],"propagation":[77],"each":[79,91],"relevant":[80],"line":[81],"circuit.":[84],"model":[86],"incorporates":[87],"individual":[88],"delays":[89],"for":[90,126,178],"gate":[92],"filtering":[94],"small":[96],"glitches.":[97],"based":[101],"optimized":[104],"encoding":[105],"problem":[110],"Boolean":[113],"satisfiability":[114],"(SAT)":[115],"instance":[116],"implemented":[119],"tool":[122],"WaveSAT.":[123],"Experimental":[124],"results":[125],"ISCAS-85,":[127],"ITC-99":[128],"industrial":[130],"circuits":[131],"show":[132],"that":[133,194],"no":[134],"known":[135],"definition":[136],"sensitization":[139],"can":[140],"eliminate":[141],"at":[147],"same":[149],"time,":[150],"thus":[151],"resulting":[152],"inadequate":[154],"detection.":[157],"WaveSAT":[158],"generates":[159],"if":[162],"testable":[166],"also":[169],"capable":[170],"automatically":[172],"generating":[173],"formal":[175],"redundancy":[176],"proof":[177],"undetectable":[179],"faults;":[181],"best":[184],"our":[186],"knowledge":[187],"first":[191],"such":[192],"both":[196],"scalable":[197],"complete.":[199]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":7},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":5},{"year":2014,"cited_by_count":15},{"year":2013,"cited_by_count":6}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}