{"id":"https://openalex.org/W1996776201","doi":"https://doi.org/10.1145/2422094.2422100","title":"Thermal Characterization of Test Techniques for FinFET and 3D Integrated Circuits","display_name":"Thermal Characterization of Test Techniques for FinFET and 3D Integrated Circuits","publication_year":2013,"publication_date":"2013-02-01","ids":{"openalex":"https://openalex.org/W1996776201","doi":"https://doi.org/10.1145/2422094.2422100","mag":"1996776201"},"language":"en","primary_location":{"id":"doi:10.1145/2422094.2422100","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2422094.2422100","pdf_url":null,"source":{"id":"https://openalex.org/S96198239","display_name":"ACM Journal on Emerging Technologies in Computing Systems","issn_l":"1550-4832","issn":["1550-4832","1550-4840"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Journal on Emerging Technologies in Computing Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084200290","display_name":"Aoxiang Tang","orcid":null},"institutions":[{"id":"https://openalex.org/I20089843","display_name":"Princeton University","ror":"https://ror.org/00hx57361","country_code":"US","type":"education","lineage":["https://openalex.org/I20089843"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Aoxiang Tang","raw_affiliation_strings":["Princeton University"],"affiliations":[{"raw_affiliation_string":"Princeton University","institution_ids":["https://openalex.org/I20089843"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086131079","display_name":"Niraj K. Jha","orcid":"https://orcid.org/0000-0002-1539-0369"},"institutions":[{"id":"https://openalex.org/I20089843","display_name":"Princeton University","ror":"https://ror.org/00hx57361","country_code":"US","type":"education","lineage":["https://openalex.org/I20089843"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Niraj K. Jha","raw_affiliation_strings":["Princeton University"],"affiliations":[{"raw_affiliation_string":"Princeton University","institution_ids":["https://openalex.org/I20089843"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5084200290"],"corresponding_institution_ids":["https://openalex.org/I20089843"],"apc_list":null,"apc_paid":null,"fwci":0.9456,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.7468976,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"9","issue":"1","first_page":"1","last_page":"16"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.6257550716400146},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6223313212394714},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.6206234097480774},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5532007217407227},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5277719497680664},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.49666935205459595},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.47251778841018677},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.38980215787887573},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.35248011350631714},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3401109576225281},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3400964140892029},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3389469385147095},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09023025631904602},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08703693747520447}],"concepts":[{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.6257550716400146},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6223313212394714},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.6206234097480774},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5532007217407227},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5277719497680664},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.49666935205459595},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.47251778841018677},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.38980215787887573},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.35248011350631714},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3401109576225281},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3400964140892029},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3389469385147095},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09023025631904602},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08703693747520447},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2422094.2422100","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2422094.2422100","pdf_url":null,"source":{"id":"https://openalex.org/S96198239","display_name":"ACM Journal on Emerging Technologies in Computing Systems","issn_l":"1550-4832","issn":["1550-4832","1550-4840"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Journal on Emerging Technologies in Computing Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8999999761581421,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":54,"referenced_works":["https://openalex.org/W1489111899","https://openalex.org/W1491971472","https://openalex.org/W1503570386","https://openalex.org/W1547760662","https://openalex.org/W1556387124","https://openalex.org/W1559796829","https://openalex.org/W1561562902","https://openalex.org/W1606262091","https://openalex.org/W1823875934","https://openalex.org/W1843801354","https://openalex.org/W1967136720","https://openalex.org/W2058283199","https://openalex.org/W2059325646","https://openalex.org/W2095596186","https://openalex.org/W2096554329","https://openalex.org/W2100728262","https://openalex.org/W2105874609","https://openalex.org/W2106542123","https://openalex.org/W2106759508","https://openalex.org/W2106904411","https://openalex.org/W2108159395","https://openalex.org/W2109596500","https://openalex.org/W2111569953","https://openalex.org/W2114978747","https://openalex.org/W2119691242","https://openalex.org/W2120985183","https://openalex.org/W2121200165","https://openalex.org/W2125054260","https://openalex.org/W2128665979","https://openalex.org/W2129785295","https://openalex.org/W2129960401","https://openalex.org/W2131487004","https://openalex.org/W2133640956","https://openalex.org/W2134917771","https://openalex.org/W2138284668","https://openalex.org/W2141083751","https://openalex.org/W2141866079","https://openalex.org/W2147563705","https://openalex.org/W2150368362","https://openalex.org/W2152165066","https://openalex.org/W2153865810","https://openalex.org/W2159850878","https://openalex.org/W2160580687","https://openalex.org/W2164071460","https://openalex.org/W2167756350","https://openalex.org/W2544965182","https://openalex.org/W2549644881","https://openalex.org/W2603178913","https://openalex.org/W3151144990","https://openalex.org/W4235859794","https://openalex.org/W4236912958","https://openalex.org/W4248309809","https://openalex.org/W4250395788","https://openalex.org/W4298093392"],"related_works":["https://openalex.org/W2204879205","https://openalex.org/W2096437374","https://openalex.org/W1943174035","https://openalex.org/W1928481607","https://openalex.org/W3135165657","https://openalex.org/W1485582195","https://openalex.org/W2108167458","https://openalex.org/W3215142653","https://openalex.org/W1487051936","https://openalex.org/W194748710"],"abstract_inverted_index":{"Power":[0],"consumption":[1,237,257],"has":[2],"become":[3],"a":[4,57,106,145,172],"very":[5],"important":[6,129],"consideration":[7],"during":[8,24],"integrated":[9],"circuit":[10],"(IC)":[11],"design":[12],"and":[13,135,157,163,209,227,233,238],"test.":[14,139],"During":[15],"test,":[16,252],"it":[17,127],"can":[18,124],"far":[19],"exceed":[20],"the":[21,33,46,70,102,114,181,184,247,255],"values":[22],"reached":[23],"normal":[25],"operation":[26],"and,":[27,75],"thus,":[28],"lead":[29],"to":[30,45,69,79,86,112,130,245],"temperatures":[31,223],"above":[32],"allowed":[34],"threshold.":[35],"Without":[36],"appropriate":[37],"temperature":[38,248],"reduction,":[39],"permanent":[40],"damage":[41],"may":[42,52],"be":[43,53,125,243],"caused":[44],"IC":[47,99,109],"or":[48],"invalid":[49],"test":[50,122,152,197,239],"results":[51,219],"obtained.":[54],"FinFET":[55,90,134,162,166,173,207],"is":[56,84,97,110,128,178,258],"double-gate":[58,188],"field-effect":[59],"transistor":[60],"(DG-FET)":[61],"that":[62,177,221,234],"was":[63],"introduced":[64],"commercially":[65],"in":[66],"2012.":[67],"Due":[68],"vertical":[71],"nature":[72,104],"of":[73,105,150,171,183,186,204,213,249],"FinFETs":[74],"hence,":[76],"weaker":[77],"ability":[78],"dissipate":[80],"heat,":[81],"this":[82,141],"problem":[83,116],"likely":[85,111],"get":[87],"worse":[88],"for":[89,147,161,194,206,215],"circuits.":[91],"Another":[92],"technology":[93],"rapidly":[94],"gaining":[95],"popularity":[96],"3D":[98,108,136,164,216],"integration.":[100],"Unfortunately,":[101],"compact":[103],"multidie":[107],"aggravate":[113],"temperature-during-test":[115],"even":[117],"further.":[118],"Hence,":[119],"before":[120],"temperature-aware":[121],"methodologies":[123],"developed,":[126],"thermally":[131],"analyze":[132],"both":[133,235],"circuits":[137,195,208,250],"under":[138,196,225,231,251],"In":[140],"article,":[142],"we":[143],"present":[144],"methodology":[146],"thermal":[148,167],"characterization":[149,168],"various":[151],"techniques,":[153],"such":[154],"as":[155],"scan":[156],"built-in":[158],"self-test":[159],"(BIST),":[160],"ICs.":[165,217],"makes":[169],"use":[170],"standard":[174],"cell":[175],"library":[176],"characterized":[179],"with":[180],"help":[182],"University":[185,203,212],"Florida":[187],"(UFDG)":[189],"SPICE":[190],"model.":[191],"Thermal":[192],"profiles":[193],"are":[198],"produced":[199],"by":[200],"ISAC2":[201],"from":[202,211],"Colorado":[205],"HotSpot":[210],"Virginia":[214],"Experimental":[218],"indicate":[220],"high":[222],"result":[224],"BIST":[226],"much":[228],"less":[229],"often":[230],"scan,":[232],"power":[236,256],"application":[240],"time":[241],"should":[242],"reduced":[244],"lower":[246],"just":[253],"reducing":[254],"not":[259],"enough.":[260]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}