{"id":"https://openalex.org/W1980602225","doi":"https://doi.org/10.1145/2392616.2392619","title":"Reconfigurable Fault Tolerance","display_name":"Reconfigurable Fault Tolerance","publication_year":2012,"publication_date":"2012-12-01","ids":{"openalex":"https://openalex.org/W1980602225","doi":"https://doi.org/10.1145/2392616.2392619","mag":"1980602225"},"language":"en","primary_location":{"id":"doi:10.1145/2392616.2392619","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2392616.2392619","pdf_url":null,"source":{"id":"https://openalex.org/S112809824","display_name":"ACM Transactions on Reconfigurable Technology and Systems","issn_l":"1936-7406","issn":["1936-7406","1936-7414"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Reconfigurable Technology and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112485835","display_name":"Adam Jacobs","orcid":null},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Adam Jacobs","raw_affiliation_strings":["University of Florida","[University of Florida]"],"affiliations":[{"raw_affiliation_string":"University of Florida","institution_ids":["https://openalex.org/I33213144"]},{"raw_affiliation_string":"[University of Florida]","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023364727","display_name":"Grzegorz Cieslewski","orcid":null},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Grzegorz Cieslewski","raw_affiliation_strings":["University of Florida","[University of Florida]"],"affiliations":[{"raw_affiliation_string":"University of Florida","institution_ids":["https://openalex.org/I33213144"]},{"raw_affiliation_string":"[University of Florida]","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082898376","display_name":"Alan D. George","orcid":"https://orcid.org/0000-0001-9665-2879"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alan D. George","raw_affiliation_strings":["University of Florida","[University of Florida]"],"affiliations":[{"raw_affiliation_string":"University of Florida","institution_ids":["https://openalex.org/I33213144"]},{"raw_affiliation_string":"[University of Florida]","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102928781","display_name":"Ross Gordon","orcid":"https://orcid.org/0000-0003-1034-8695"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ann Gordon-Ross","raw_affiliation_strings":["University of Florida","[University of Florida]"],"affiliations":[{"raw_affiliation_string":"University of Florida","institution_ids":["https://openalex.org/I33213144"]},{"raw_affiliation_string":"[University of Florida]","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103359149","display_name":"Herman Lam","orcid":null},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Herman Lam","raw_affiliation_strings":["University of Florida","[University of Florida]"],"affiliations":[{"raw_affiliation_string":"University of Florida","institution_ids":["https://openalex.org/I33213144"]},{"raw_affiliation_string":"[University of Florida]","institution_ids":["https://openalex.org/I33213144"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5112485835"],"corresponding_institution_ids":["https://openalex.org/I33213144"],"apc_list":null,"apc_paid":null,"fwci":5.6466,"has_fulltext":false,"cited_by_count":70,"citation_normalized_percentile":{"value":0.96202191,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"5","issue":"4","first_page":"1","last_page":"30"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9911999702453613,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.7990423440933228},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7857909202575684},{"id":"https://openalex.org/keywords/triple-modular-redundancy","display_name":"Triple modular redundancy","score":0.7547967433929443},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7104637622833252},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7041674852371216},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6065972447395325},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5721798539161682},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.4669654667377472},{"id":"https://openalex.org/keywords/backup","display_name":"Backup","score":0.4633529484272003},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.4257192313671112},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.3451669216156006},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3292815685272217},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3200153708457947},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.25672098994255066},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.2555384635925293},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.10015732049942017},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.07880643010139465}],"concepts":[{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.7990423440933228},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7857909202575684},{"id":"https://openalex.org/C196371267","wikidata":"https://www.wikidata.org/wiki/Q3998979","display_name":"Triple modular redundancy","level":3,"score":0.7547967433929443},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7104637622833252},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7041674852371216},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6065972447395325},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5721798539161682},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.4669654667377472},{"id":"https://openalex.org/C2780945871","wikidata":"https://www.wikidata.org/wiki/Q194274","display_name":"Backup","level":2,"score":0.4633529484272003},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.4257192313671112},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.3451669216156006},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3292815685272217},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3200153708457947},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.25672098994255066},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.2555384635925293},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.10015732049942017},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.07880643010139465},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2392616.2392619","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2392616.2392619","pdf_url":null,"source":{"id":"https://openalex.org/S112809824","display_name":"ACM Transactions on Reconfigurable Technology and Systems","issn_l":"1936-7406","issn":["1936-7406","1936-7414"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Reconfigurable Technology and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G818933388","display_name":null,"funder_award_id":"EEC-0642422","funder_id":"https://openalex.org/F4320337394","funder_display_name":"Division of Engineering Education and Centers"}],"funders":[{"id":"https://openalex.org/F4320337394","display_name":"Division of Engineering Education and Centers","ror":"https://ror.org/050rnw378"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W48552920","https://openalex.org/W73207826","https://openalex.org/W180647260","https://openalex.org/W789253526","https://openalex.org/W1533071485","https://openalex.org/W1645926441","https://openalex.org/W1833680562","https://openalex.org/W1906110979","https://openalex.org/W1965619817","https://openalex.org/W1975426490","https://openalex.org/W1998280358","https://openalex.org/W2001104504","https://openalex.org/W2013144508","https://openalex.org/W2042544282","https://openalex.org/W2049836768","https://openalex.org/W2054254680","https://openalex.org/W2060394017","https://openalex.org/W2076186064","https://openalex.org/W2083613288","https://openalex.org/W2088559447","https://openalex.org/W2096927458","https://openalex.org/W2097719961","https://openalex.org/W2115722171","https://openalex.org/W2116549540","https://openalex.org/W2123437881","https://openalex.org/W2131221147","https://openalex.org/W2133041134","https://openalex.org/W2144395569","https://openalex.org/W2151961246","https://openalex.org/W2153391470","https://openalex.org/W2155101190","https://openalex.org/W2159288039","https://openalex.org/W2159941801","https://openalex.org/W2163131937","https://openalex.org/W2168755708","https://openalex.org/W2474556993","https://openalex.org/W3170789541","https://openalex.org/W4239606945","https://openalex.org/W4255255775","https://openalex.org/W6721001011"],"related_works":["https://openalex.org/W2102538861","https://openalex.org/W2765704306","https://openalex.org/W2123934961","https://openalex.org/W1540420234","https://openalex.org/W3208260600","https://openalex.org/W2065552285","https://openalex.org/W2051386096","https://openalex.org/W2062230033","https://openalex.org/W2051487197","https://openalex.org/W2271512713"],"abstract_inverted_index":{"Commercial":[0],"SRAM-based,":[1],"field-programmable":[2],"gate":[3],"arrays":[4],"(FPGAs)":[5],"have":[6],"the":[7,14,94,170,184],"potential":[8],"to":[9,17,27,41,59,81,114,118,168,192],"provide":[10],"space":[11],"applications":[12],"with":[13],"necessary":[15],"performance":[16],"meet":[18],"next-generation":[19],"mission":[20],"requirements.":[21,56],"However,":[22],"mitigating":[23],"an":[24,105,135],"FPGA\u2019s":[25],"susceptibility":[26],"single-event":[28],"upset":[29,131,136,186],"(SEU)":[30],"radiation":[31,43,67,96,143],"is":[32],"challenging.":[33],"Triple-modular":[34],"redundancy":[35,88],"(TMR)":[36],"techniques":[37,113],"are":[38],"traditionally":[39],"used":[40],"mitigate":[42],"effects,":[44],"but":[45],"TMR":[46],"incurs":[47],"substantial":[48],"overheads":[49,62],"such":[50],"as":[51],"increased":[52],"area":[53],"and":[54,89,122,157,173,183],"power":[55],"In":[57],"order":[58],"reduce":[60],"these":[61],"while":[63],"still":[64],"providing":[65],"sufficient":[66],"mitigation,":[68],"we":[69,133],"propose":[70,134],"a":[71,84,150,164],"reconfigurable":[72,112],"fault":[73,90],"tolerance":[74],"(RFT)":[75],"framework":[76,103,199],"that":[77,109,140],"enables":[78],"system":[79],"designers":[80],"dynamically":[82],"adjust":[83],"system\u2019s":[85],"level":[86],"of":[87,152],"mitigation":[91],"based":[92],"on":[93,163],"varying":[95],"incurred":[97],"at":[98],"different":[99],"orbital":[100],"positions.":[101],"This":[102],"includes":[104],"adaptive":[106],"hardware":[107,181],"architecture":[108,172,182],"leverages":[110],"FPGA":[111],"enable":[115],"significant":[116],"processing":[117],"be":[119],"performed":[120],"efficiently":[121],"reliably":[123],"when":[124],"environmental":[125],"factors":[126],"permit.":[127],"To":[128],"accurately":[129],"estimate":[130,193],"rates,":[132],"rate":[137],"modeling":[138,191],"tool":[139],"captures":[141],"time-varying":[142],"effects":[144],"for":[145,200],"arbitrary":[146],"satellite":[147],"orbits":[148],"using":[149,188,197],"collection":[151],"existing,":[153],"publically":[154],"available":[155],"tools":[156],"models.":[158,176],"We":[159,177],"perform":[160],"fault-injection":[161],"testing":[162],"prototype":[165],"RFT":[166,171,174,180],"platform":[167],"validate":[169],"performability":[175,194],"combine":[178],"our":[179,198],"modeled":[185],"rates":[187],"phased-mission":[189],"Markov":[190],"gains":[195],"achievable":[196],"two":[201],"case-study":[202],"orbits.":[203]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":11},{"year":2016,"cited_by_count":10},{"year":2015,"cited_by_count":12},{"year":2014,"cited_by_count":9},{"year":2013,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}