{"id":"https://openalex.org/W2071439051","doi":"https://doi.org/10.1145/2228360.2228474","title":"PowerField","display_name":"PowerField","publication_year":2012,"publication_date":"2012-05-31","ids":{"openalex":"https://openalex.org/W2071439051","doi":"https://doi.org/10.1145/2228360.2228474","mag":"2071439051"},"language":"en","primary_location":{"id":"doi:10.1145/2228360.2228474","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2228360.2228474","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 49th Annual Design Automation Conference","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112428788","display_name":"Seungwook Paek","orcid":null},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seungwook Paek","raw_affiliation_strings":["KAIST, Daejeon, Korea","Department of Electrical Engineering, KAIST, Daejeon, 305-701 Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Electrical Engineering, KAIST, Daejeon, 305-701 Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103797868","display_name":"Seok\u2010Hwan Moon","orcid":"https://orcid.org/0009-0008-8357-4531"},"institutions":[{"id":"https://openalex.org/I142401562","display_name":"Electronics and Telecommunications Research Institute","ror":"https://ror.org/03ysstz10","country_code":"KR","type":"facility","lineage":["https://openalex.org/I142401562","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seok-Hwan Moon","raw_affiliation_strings":["ETRI, Daejeon, Korea","Convergence Components & Materials Research Lab., ETRI Daejeon, 305-700, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ETRI, Daejeon, Korea","institution_ids":["https://openalex.org/I142401562"]},{"raw_affiliation_string":"Convergence Components & Materials Research Lab., ETRI Daejeon, 305-700, Korea","institution_ids":["https://openalex.org/I142401562"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052060904","display_name":"Wongyu Shin","orcid":"https://orcid.org/0000-0003-2485-3262"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Wongyu Shin","raw_affiliation_strings":["KAIST, Daejeon, Korea","Department of Electrical Engineering, KAIST, Daejeon, 305-701 Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Electrical Engineering, KAIST, Daejeon, 305-701 Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013362846","display_name":"Jaehyeong Sim","orcid":"https://orcid.org/0000-0001-8722-8486"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaehyeong Sim","raw_affiliation_strings":["KAIST, Daejeon, Korea","Department of Electrical Engineering, KAIST, Daejeon, 305-701 Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Electrical Engineering, KAIST, Daejeon, 305-701 Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052390471","display_name":"Lee\u2010Sup Kim","orcid":"https://orcid.org/0000-0001-9585-4591"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Lee-Sup Kim","raw_affiliation_strings":["KAIST, Daejeon, Korea","Department of Electrical Engineering, KAIST, Daejeon, 305-701 Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Electrical Engineering, KAIST, Daejeon, 305-701 Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4123,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.57573655,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"630","last_page":"635"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.8381698131561279},{"id":"https://openalex.org/keywords/maximum-a-posteriori-estimation","display_name":"Maximum a posteriori estimation","score":0.6204257607460022},{"id":"https://openalex.org/keywords/a-priori-and-a-posteriori","display_name":"A priori and a posteriori","score":0.5610102415084839},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.553418755531311},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5383440256118774},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5340050458908081},{"id":"https://openalex.org/keywords/steady-state","display_name":"Steady state (chemistry)","score":0.4965422749519348},{"id":"https://openalex.org/keywords/transient-analysis","display_name":"Transient analysis","score":0.4796343445777893},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.4680485427379608},{"id":"https://openalex.org/keywords/markov-process","display_name":"Markov process","score":0.46237632632255554},{"id":"https://openalex.org/keywords/markov-random-field","display_name":"Markov random field","score":0.4392547011375427},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.39095374941825867},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.26325225830078125},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.25085633993148804},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.22764185070991516},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.21544212102890015},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18212345242500305},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1374811828136444},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11337733268737793},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.10550549626350403},{"id":"https://openalex.org/keywords/maximum-likelihood","display_name":"Maximum likelihood","score":0.07739418745040894}],"concepts":[{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.8381698131561279},{"id":"https://openalex.org/C9810830","wikidata":"https://www.wikidata.org/wiki/Q635384","display_name":"Maximum a posteriori estimation","level":3,"score":0.6204257607460022},{"id":"https://openalex.org/C75553542","wikidata":"https://www.wikidata.org/wiki/Q178161","display_name":"A priori and a posteriori","level":2,"score":0.5610102415084839},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.553418755531311},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5383440256118774},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5340050458908081},{"id":"https://openalex.org/C8171440","wikidata":"https://www.wikidata.org/wiki/Q903414","display_name":"Steady state (chemistry)","level":2,"score":0.4965422749519348},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.4796343445777893},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.4680485427379608},{"id":"https://openalex.org/C159886148","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov process","level":2,"score":0.46237632632255554},{"id":"https://openalex.org/C2778045648","wikidata":"https://www.wikidata.org/wiki/Q176827","display_name":"Markov random field","level":4,"score":0.4392547011375427},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.39095374941825867},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.26325225830078125},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.25085633993148804},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.22764185070991516},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21544212102890015},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18212345242500305},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1374811828136444},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11337733268737793},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.10550549626350403},{"id":"https://openalex.org/C49781872","wikidata":"https://www.wikidata.org/wiki/Q1045555","display_name":"Maximum likelihood","level":2,"score":0.07739418745040894},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2228360.2228474","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2228360.2228474","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 49th Annual Design Automation Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.9100000262260437,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G1609645719","display_name":null,"funder_award_id":"2011-00003202011-0018357IDEC","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1490268218","https://openalex.org/W1567885833","https://openalex.org/W1976120012","https://openalex.org/W1999232629","https://openalex.org/W2049114603","https://openalex.org/W2089934290","https://openalex.org/W2102913618","https://openalex.org/W2103749478","https://openalex.org/W2112996550","https://openalex.org/W2116295078","https://openalex.org/W2121781154","https://openalex.org/W2123801699","https://openalex.org/W2129960401","https://openalex.org/W2136281672","https://openalex.org/W2143516773","https://openalex.org/W2153110463","https://openalex.org/W2163947402","https://openalex.org/W4235067174","https://openalex.org/W4285719527","https://openalex.org/W6672933606"],"related_works":["https://openalex.org/W2097090565","https://openalex.org/W2008444830","https://openalex.org/W2804375118","https://openalex.org/W2112506753","https://openalex.org/W2029809897","https://openalex.org/W2132110568","https://openalex.org/W2160831725","https://openalex.org/W1495937069","https://openalex.org/W1522441193","https://openalex.org/W2180905035"],"abstract_inverted_index":{"Transient":[0],"temperature-to-power":[1],"conversion":[2],"is":[3,38,62,70],"as":[4,6],"important":[5],"steady-state":[7],"analysis":[8,37,93],"since":[9],"power":[10,28,60],"distributions":[11],"tend":[12],"to":[13,23,40,52,106],"change":[14],"dynamically.":[15],"In":[16],"this":[17],"work,":[18],"we":[19,44],"propose":[20],"PowerField":[21,86],"framework":[22,51],"find":[24],"the":[25,35,54,66,88,95],"most":[26,58],"probable":[27,59],"distribution":[29],"from":[30],"consecutive":[31],"thermal":[32,42,76,82],"images.":[33],"Since":[34],"transient":[36,75,92],"vulnerable":[39],"spatio-temporal":[41],"noise,":[43],"adopted":[45],"a":[46,81,107],"maximum-a-posteriori":[47],"Markov":[48],"random":[49],"field":[50],"enhance":[53],"noise":[55],"immunity.":[56],"The":[57],"map":[61],"obtained":[63],"by":[64,97],"minimizing":[65],"energy":[67],"function":[68],"which":[69],"calculated":[71],"using":[72],"an":[73],"approximated":[74],"equation.":[77],"Experimental":[78],"results":[79],"with":[80],"simulator":[83],"shows":[84],"that":[85],"outperforms":[87],"previous":[89],"method":[90,105],"in":[91],"reducing":[94],"error":[96],"half":[98],"on":[99],"average.":[100],"We":[101],"also":[102],"applied":[103],"our":[104],"real":[108],"silicon":[109],"achieving":[110],"90.7%":[111],"accuracy.":[112]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2016-06-24T00:00:00"}