{"id":"https://openalex.org/W2150267144","doi":"https://doi.org/10.1145/2150976.2150990","title":"Relyzer","display_name":"Relyzer","publication_year":2012,"publication_date":"2012-03-03","ids":{"openalex":"https://openalex.org/W2150267144","doi":"https://doi.org/10.1145/2150976.2150990","mag":"2150267144"},"language":"en","primary_location":{"id":"doi:10.1145/2150976.2150990","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2150976.2150990","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the seventeenth international conference on Architectural Support for Programming Languages and Operating Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054590774","display_name":"Siva Kumar Sastry Hari","orcid":"https://orcid.org/0000-0001-8346-7981"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Siva Kumar Sastry Hari","raw_affiliation_strings":["University of Illinois at Urbana Chamapign, Urbana, IL, USA"],"affiliations":[{"raw_affiliation_string":"University of Illinois at Urbana Chamapign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086111967","display_name":"Sarita V. Adve","orcid":"https://orcid.org/0000-0002-3403-5119"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sarita V. Adve","raw_affiliation_strings":["University of Illinois at Urbana Chamapign, Urbana, IL, USA"],"affiliations":[{"raw_affiliation_string":"University of Illinois at Urbana Chamapign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034055695","display_name":"Helia Naeimi","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Helia Naeimi","raw_affiliation_strings":["Intel, Santa Clara, CA, USA"],"affiliations":[{"raw_affiliation_string":"Intel, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101419530","display_name":"Pradeep Ramachandran","orcid":"https://orcid.org/0000-0002-1844-609X"},"institutions":[{"id":"https://openalex.org/I4210146682","display_name":"Intel (India)","ror":"https://ror.org/04f2n1245","country_code":"IN","type":"company","lineage":["https://openalex.org/I1343180700","https://openalex.org/I4210146682"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Pradeep Ramachandran","raw_affiliation_strings":["Intel, Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Intel, Bangalore, India","institution_ids":["https://openalex.org/I4210146682"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5054590774"],"corresponding_institution_ids":["https://openalex.org/I157725225"],"apc_list":null,"apc_paid":null,"fwci":10.7173,"has_fulltext":false,"cited_by_count":146,"citation_normalized_percentile":{"value":0.98689395,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":null,"issue":null,"first_page":"123","last_page":"134"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7376468181610107},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7186251878738403},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.6848062872886658},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5941985249519348},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.5733543634414673},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4929776191711426},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4880925416946411},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4761909544467926},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.45789769291877747},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.45747020840644836},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.4543137550354004},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.426535964012146},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.4153207242488861},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.14772102236747742},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10063183307647705},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.08578282594680786}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7376468181610107},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7186251878738403},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.6848062872886658},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5941985249519348},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.5733543634414673},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4929776191711426},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4880925416946411},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4761909544467926},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.45789769291877747},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.45747020840644836},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.4543137550354004},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.426535964012146},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.4153207242488861},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.14772102236747742},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10063183307647705},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.08578282594680786},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2150976.2150990","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2150976.2150990","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the seventeenth international conference on Architectural Support for Programming Languages and Operating Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8100000023841858,"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W260873559","https://openalex.org/W1523125571","https://openalex.org/W1554885925","https://openalex.org/W1586809517","https://openalex.org/W2002003432","https://openalex.org/W2036853599","https://openalex.org/W2097294189","https://openalex.org/W2099123934","https://openalex.org/W2100866260","https://openalex.org/W2101580666","https://openalex.org/W2105372251","https://openalex.org/W2108557605","https://openalex.org/W2112648765","https://openalex.org/W2115081151","https://openalex.org/W2123907700","https://openalex.org/W2125169487","https://openalex.org/W2128941141","https://openalex.org/W2132362854","https://openalex.org/W2135470160","https://openalex.org/W2145021036","https://openalex.org/W2147280888","https://openalex.org/W2148162182","https://openalex.org/W2159889776","https://openalex.org/W2164264749","https://openalex.org/W2911327665","https://openalex.org/W4255519882"],"related_works":["https://openalex.org/W2130922779","https://openalex.org/W2607474334","https://openalex.org/W2138861322","https://openalex.org/W188714996","https://openalex.org/W1520834112","https://openalex.org/W2121043529","https://openalex.org/W2083209667","https://openalex.org/W3155997325","https://openalex.org/W2742111403","https://openalex.org/W764083103"],"abstract_inverted_index":{"Future":[0],"microprocessors":[1],"need":[2],"low-cost":[3,24],"solutions":[4],"for":[5,111],"reliable":[6],"operation":[7],"in":[8,56,92],"the":[9,51,78,93,100,143,146],"presence":[10],"of":[11,26,29,64,80,103,133,145,154],"failure-prone":[12],"devices.":[13],"A":[14],"promising":[15],"approach":[16],"is":[17,107,116],"to":[18,119,160],"detect":[19],"hardware":[20,86],"faults":[21,48,149],"by":[22],"deploying":[23],"monitors":[25],"software-level":[27],"symptoms":[28],"such":[30],"faults.":[31,123,134],"Recently,":[32],"researchers":[33],"have":[34],"shown":[35],"these":[36],"mechanisms":[37],"work":[38,125],"well,":[39],"but":[40],"there":[41],"remains":[42],"a":[43,81,85,89,129],"non-negligible":[44],"risk":[45],"that":[46],"several":[47],"may":[49,157],"escape":[50],"symptom":[52],"detectors":[53,66],"and":[54,162],"result":[55],"silent":[57],"data":[58],"corruptions":[59],"(SDCs).":[60],"Most":[61],"prior":[62],"evaluations":[63],"symptom-based":[65],"perform":[67],"fault":[68,82,97,105],"injection":[69],"campaigns":[70],"on":[71,142],"application":[72,104,147],"benchmarks,":[73],"where":[74,148],"each":[75],"run":[76],"simulates":[77],"impact":[79],"injected":[83],"at":[84,88],"site":[87],"certain":[90],"point":[91],"application's":[94],"execution":[95],"(application":[96],"site).":[98],"Since":[99],"total":[101],"number":[102],"sites":[106],"very":[108],"large":[109],"(trillions":[110],"standard":[112],"benchmark":[113],"suites),":[114],"it":[115],"not":[117,138,151],"feasible":[118],"study":[120],"all":[121],"possible":[122],"Previous":[124],"therefore":[126],"typically":[127],"studies":[128,136],"randomly":[130],"selected":[131],"sample":[132],"Such":[135],"do":[137],"provide":[139],"any":[140],"feedback":[141],"portions":[144],"were":[150],"injected.":[152],"Some":[153],"those":[155],"instructions":[156],"be":[158],"vulnerable":[159],"SDCs,":[161],"identifying":[163],"them":[164,168],"could":[165],"allow":[166],"protecting":[167],"through":[169],"other":[170],"means":[171],"if":[172],"needed.":[173]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":10},{"year":2020,"cited_by_count":11},{"year":2019,"cited_by_count":13},{"year":2018,"cited_by_count":21},{"year":2017,"cited_by_count":15},{"year":2016,"cited_by_count":14},{"year":2015,"cited_by_count":15},{"year":2014,"cited_by_count":16},{"year":2013,"cited_by_count":8},{"year":2012,"cited_by_count":4}],"updated_date":"2026-03-17T09:09:15.849793","created_date":"2016-06-24T00:00:00"}