{"id":"https://openalex.org/W1990375983","doi":"https://doi.org/10.1145/2145694.2145761","title":"Early timing estimation for system-level design using FPGAs (abstract only)","display_name":"Early timing estimation for system-level design using FPGAs (abstract only)","publication_year":2012,"publication_date":"2012-02-22","ids":{"openalex":"https://openalex.org/W1990375983","doi":"https://doi.org/10.1145/2145694.2145761","mag":"1990375983"},"language":"en","primary_location":{"id":"doi:10.1145/2145694.2145761","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2145694.2145761","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the ACM/SIGDA international symposium on Field Programmable Gate Arrays","raw_type":"proceedings-article"},"type":"conference-abstract","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052699654","display_name":"Hugo A. Andrade","orcid":"https://orcid.org/0000-0002-4560-8859"},"institutions":[{"id":"https://openalex.org/I4210124763","display_name":"National Instruments (United States)","ror":"https://ror.org/026exqw73","country_code":"US","type":"company","lineage":["https://openalex.org/I4210117810","https://openalex.org/I4210124763"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hugo Andrade","raw_affiliation_strings":["National Instruments Corp., Berkeley, CA, USA","National Instruments Corporation, Berkeley, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Instruments Corp., Berkeley, CA, USA","institution_ids":["https://openalex.org/I4210124763"]},{"raw_affiliation_string":"National Instruments Corporation, Berkeley, CA, USA","institution_ids":["https://openalex.org/I4210124763"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073751792","display_name":"Arkadeb Ghosal","orcid":null},"institutions":[{"id":"https://openalex.org/I4210124763","display_name":"National Instruments (United States)","ror":"https://ror.org/026exqw73","country_code":"US","type":"company","lineage":["https://openalex.org/I4210117810","https://openalex.org/I4210124763"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arkadeb Ghosal","raw_affiliation_strings":["National Instruments Corp., Berkeley, CA, USA","National Instruments Corporation, Berkeley, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Instruments Corp., Berkeley, CA, USA","institution_ids":["https://openalex.org/I4210124763"]},{"raw_affiliation_string":"National Instruments Corporation, Berkeley, CA, USA","institution_ids":["https://openalex.org/I4210124763"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087751146","display_name":"Rhishikesh Limaye","orcid":null},"institutions":[{"id":"https://openalex.org/I4210124763","display_name":"National Instruments (United States)","ror":"https://ror.org/026exqw73","country_code":"US","type":"company","lineage":["https://openalex.org/I4210117810","https://openalex.org/I4210124763"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rhishikesh Limaye","raw_affiliation_strings":["National Instruments Corp., Berkeley, CA, USA","National Instruments Corporation, Berkeley, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Instruments Corp., Berkeley, CA, USA","institution_ids":["https://openalex.org/I4210124763"]},{"raw_affiliation_string":"National Instruments Corporation, Berkeley, CA, USA","institution_ids":["https://openalex.org/I4210124763"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107949535","display_name":"Sadia Malik","orcid":null},"institutions":[{"id":"https://openalex.org/I4210124763","display_name":"National Instruments (United States)","ror":"https://ror.org/026exqw73","country_code":"US","type":"company","lineage":["https://openalex.org/I4210117810","https://openalex.org/I4210124763"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sadia Malik","raw_affiliation_strings":["National Instruments Corp., Berkeley, CA, USA","National Instruments Corporation, Berkeley, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Instruments Corp., Berkeley, CA, USA","institution_ids":["https://openalex.org/I4210124763"]},{"raw_affiliation_string":"National Instruments Corporation, Berkeley, CA, USA","institution_ids":["https://openalex.org/I4210124763"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030140152","display_name":"Newton Petersen","orcid":null},"institutions":[{"id":"https://openalex.org/I117895437","display_name":"National Instruments (Ireland)","ror":"https://ror.org/03b4j0710","country_code":"IE","type":"company","lineage":["https://openalex.org/I117895437","https://openalex.org/I4210117810","https://openalex.org/I4210124763"]},{"id":"https://openalex.org/I4210124763","display_name":"National Instruments (United States)","ror":"https://ror.org/026exqw73","country_code":"US","type":"company","lineage":["https://openalex.org/I4210117810","https://openalex.org/I4210124763"]}],"countries":["IE","US"],"is_corresponding":false,"raw_author_name":"Newton Petersen","raw_affiliation_strings":["National Instruments Corp., Austin, TX, USA","[National Instruments Corporation Austin, TX, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Instruments Corp., Austin, TX, USA","institution_ids":["https://openalex.org/I4210124763"]},{"raw_affiliation_string":"[National Instruments Corporation Austin, TX, USA]","institution_ids":["https://openalex.org/I117895437"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069949620","display_name":"Kaushik Ravindran","orcid":null},"institutions":[{"id":"https://openalex.org/I4210124763","display_name":"National Instruments (United States)","ror":"https://ror.org/026exqw73","country_code":"US","type":"company","lineage":["https://openalex.org/I4210117810","https://openalex.org/I4210124763"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kaushik Ravindran","raw_affiliation_strings":["National Instruments Corp., Berkeley, CA, USA","National Instruments Corporation, Berkeley, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Instruments Corp., Berkeley, CA, USA","institution_ids":["https://openalex.org/I4210124763"]},{"raw_affiliation_string":"National Instruments Corporation, Berkeley, CA, USA","institution_ids":["https://openalex.org/I4210124763"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055632681","display_name":"Trung N. Tran","orcid":null},"institutions":[{"id":"https://openalex.org/I4210124763","display_name":"National Instruments (United States)","ror":"https://ror.org/026exqw73","country_code":"US","type":"company","lineage":["https://openalex.org/I4210117810","https://openalex.org/I4210124763"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Trung Tran","raw_affiliation_strings":["National Instruments Corp., Berkeley, CA, USA","National Instruments Corporation, Berkeley, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Instruments Corp., Berkeley, CA, USA","institution_ids":["https://openalex.org/I4210124763"]},{"raw_affiliation_string":"National Instruments Corporation, Berkeley, CA, USA","institution_ids":["https://openalex.org/I4210124763"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010220381","display_name":"Guoqiang Wang","orcid":"https://orcid.org/0000-0001-6277-5467"},"institutions":[{"id":"https://openalex.org/I4210124763","display_name":"National Instruments (United States)","ror":"https://ror.org/026exqw73","country_code":"US","type":"company","lineage":["https://openalex.org/I4210117810","https://openalex.org/I4210124763"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Guoqiang Wang","raw_affiliation_strings":["National Instruments Corp., Berkeley, CA, USA","National Instruments Corporation, Berkeley, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Instruments Corp., Berkeley, CA, USA","institution_ids":["https://openalex.org/I4210124763"]},{"raw_affiliation_string":"National Instruments Corporation, Berkeley, CA, USA","institution_ids":["https://openalex.org/I4210124763"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058811704","display_name":"Guang Yang","orcid":"https://orcid.org/0000-0003-3406-964X"},"institutions":[{"id":"https://openalex.org/I4210124763","display_name":"National Instruments (United States)","ror":"https://ror.org/026exqw73","country_code":"US","type":"company","lineage":["https://openalex.org/I4210117810","https://openalex.org/I4210124763"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Guang Yang","raw_affiliation_strings":["National Instruments Corp., Berkeley, CA, USA","National Instruments Corporation, Berkeley, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Instruments Corp., Berkeley, CA, USA","institution_ids":["https://openalex.org/I4210124763"]},{"raw_affiliation_string":"National Instruments Corporation, Berkeley, CA, USA","institution_ids":["https://openalex.org/I4210124763"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"271","last_page":"271"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8080645203590393},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.644345760345459},{"id":"https://openalex.org/keywords/high-level-synthesis","display_name":"High-level synthesis","score":0.6405879855155945},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.5952019095420837},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.526109516620636},{"id":"https://openalex.org/keywords/dataflow","display_name":"Dataflow","score":0.5055344104766846},{"id":"https://openalex.org/keywords/design-flow","display_name":"Design flow","score":0.5005395412445068},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.43526190519332886},{"id":"https://openalex.org/keywords/electronic-system-level-design-and-verification","display_name":"Electronic system-level design and verification","score":0.4345341920852661},{"id":"https://openalex.org/keywords/electronic-design-automation","display_name":"Electronic design automation","score":0.42979463934898376},{"id":"https://openalex.org/keywords/predictability","display_name":"Predictability","score":0.4130431115627289},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3424396812915802},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.26471906900405884}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8080645203590393},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.644345760345459},{"id":"https://openalex.org/C58013763","wikidata":"https://www.wikidata.org/wiki/Q5754574","display_name":"High-level synthesis","level":3,"score":0.6405879855155945},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.5952019095420837},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.526109516620636},{"id":"https://openalex.org/C96324660","wikidata":"https://www.wikidata.org/wiki/Q205446","display_name":"Dataflow","level":2,"score":0.5055344104766846},{"id":"https://openalex.org/C37135326","wikidata":"https://www.wikidata.org/wiki/Q931942","display_name":"Design flow","level":2,"score":0.5005395412445068},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.43526190519332886},{"id":"https://openalex.org/C77495112","wikidata":"https://www.wikidata.org/wiki/Q5358436","display_name":"Electronic system-level design and verification","level":2,"score":0.4345341920852661},{"id":"https://openalex.org/C64260653","wikidata":"https://www.wikidata.org/wiki/Q1194864","display_name":"Electronic design automation","level":2,"score":0.42979463934898376},{"id":"https://openalex.org/C197640229","wikidata":"https://www.wikidata.org/wiki/Q2534066","display_name":"Predictability","level":2,"score":0.4130431115627289},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3424396812915802},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.26471906900405884},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2145694.2145761","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2145694.2145761","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the ACM/SIGDA international symposium on Field Programmable Gate Arrays","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Decent work and economic growth","id":"https://metadata.un.org/sdg/8","score":0.6000000238418579}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W3011978806","https://openalex.org/W3204573923","https://openalex.org/W3207169898","https://openalex.org/W3198354237","https://openalex.org/W2269990635","https://openalex.org/W1604727120","https://openalex.org/W2159022270","https://openalex.org/W1603163876","https://openalex.org/W2133642747","https://openalex.org/W1519976071"],"abstract_inverted_index":{"FPGA":[0,46,81],"devices":[1],"provide":[2],"flexible,":[3],"fast,":[4],"and":[5,8,24,31,86,149,183,203,229,250,259],"low-cost":[6],"prototyping":[7],"production":[9],"solutions":[10],"for":[11,45,213],"system":[12],"design.":[13],"However,":[14],"as":[15],"the":[16,22,41,56,69,104,114,157,167,200,231,242],"design":[17,23,57,63,96,161],"complexity":[18],"continues":[19],"to":[20,39,67,100,156,239],"rise,":[21],"synthesis":[25,85],"iterations":[26],"become":[27],"a":[28,74,79,146,174,223],"labor":[29],"intensive":[30],"time":[32,64],"consuming":[33],"ordeal.":[34],"Consequently,":[35],"it":[36],"becomes":[37],"imperative":[38],"raise":[40],"level":[42],"of":[43,103,116,119,122,132,179,194,256],"abstraction":[44],"designs,":[47],"while":[48],"providing":[49],"insight":[50],"into":[51],"performance":[52],"metrics":[53],"early":[54,89,138],"in":[55,134,137,159,230,266],"process.":[58],"In":[59,108],"particular,":[60],"an":[61,126,142],"important":[62],"problem":[65],"is":[66],"determine":[68],"maximum":[70],"clock":[71],"frequency":[72],"that":[73,166,212],"circuit":[75],"can":[76,91,170,218],"achieve":[77],"on":[78,113,125,191,227],"specific":[80],"target":[82],"before":[83],"full":[84,105],"implementation.":[87],"This":[88],"quantification":[90],"greatly":[92],"help":[93],"evaluate":[94],"key":[95],"characteristics":[97],"without":[98],"reverting":[99],"tedious":[101],"runs":[102],"implementation":[106],"flow.":[107],"this":[109],"work,":[110,236],"we":[111,237],"focus":[112,190],"predictability":[115],"timing":[117,139,177,185,216,243,270],"delay":[118,153,253],"circuits":[120],"composed":[121,193],"high-level":[123,147],"blocks":[124,182],"FPGA.":[127],"We":[128,164,188,262],"are":[129,263],"well":[130],"aware":[131],"difficulties":[133],"tackling":[135],"uncertainties":[136,169],"estimation,":[140],"e.g.,":[141],"inherent":[143],"gap":[144],"between":[145],"representation":[148],"gates/wires;":[150],"extremely":[151],"difficult":[152],"estimation":[154,168],"due":[155],"randomness":[158],"physical":[160],"tools,":[162],"etc.":[163],"show":[165],"be":[171,219],"mitigated":[172],"through":[173],"carefully":[175],"characterized":[176],"database":[178,244],"primitive":[180],"building":[181],"refined":[184],"analysis":[186],"models.":[187,208],"primarily":[189],"applications":[192],"data-intensive":[195],"word-level":[196],"arithmetic":[197],"computations":[198],"from":[199],"DSP":[201],"domain":[202],"specified":[204],"using":[205],"static":[206],"dataflow":[207],"Our":[209],"experiments":[210],"indicate":[211],"these":[214],"applications,":[215],"estimates":[217],"obtained":[220],"reliably":[221],"within":[222],"good":[224],"error":[225],"margin":[226],"average":[228],"worst":[232],"case.":[233],"As":[234],"future":[235],"plan":[238],"fine":[240],"tune":[241],"by":[245],"modeling":[246],"resource":[247],"utilization":[248],"effects":[249],"inter-primitive/actor":[251],"routing":[252],"via":[254],"variants":[255],"Rent's":[257],"rule":[258],"related":[260],"efforts.":[261],"also":[264],"interested":[265],"exploring":[267],"dynamic":[268],"sub-cycle":[269],"characterization.":[271]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}