{"id":"https://openalex.org/W2101440830","doi":"https://doi.org/10.1145/2039370.2039410","title":"Reliability-aware placement in SRAM-based FPGA for voltage scaling realization in the presence of process variations","display_name":"Reliability-aware placement in SRAM-based FPGA for voltage scaling realization in the presence of process variations","publication_year":2011,"publication_date":"2011-10-09","ids":{"openalex":"https://openalex.org/W2101440830","doi":"https://doi.org/10.1145/2039370.2039410","mag":"2101440830"},"language":"en","primary_location":{"id":"doi:10.1145/2039370.2039410","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2039370.2039410","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the seventh IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110194469","display_name":"Shahinsdc Golshan","orcid":null},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shahinsdc Golshan","raw_affiliation_strings":["University of California at Irvine, Irvine, CA, USA","Center of Embedded Computer Systems, University of California, Irvine, CA, 92697, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California at Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]},{"raw_affiliation_string":"Center of Embedded Computer Systems, University of California, Irvine, CA, 92697, USA","institution_ids":["https://openalex.org/I204250578"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077252302","display_name":"Amin Khajeh","orcid":"https://orcid.org/0000-0003-0770-0109"},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Amin Khajeh","raw_affiliation_strings":["University of California at Irvine, Irvine, CA, USA","Center of Embedded Computer Systems, University of California, Irvine, CA, 92697, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California at Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]},{"raw_affiliation_string":"Center of Embedded Computer Systems, University of California, Irvine, CA, 92697, USA","institution_ids":["https://openalex.org/I204250578"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047382437","display_name":"Houman Homayoun","orcid":"https://orcid.org/0000-0001-8904-4699"},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Houman Homayoun","raw_affiliation_strings":["University of California at Irvine, Irvine, CA, USA","Center of Embedded Computer Systems, University of California, Irvine, CA, 92697, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California at Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]},{"raw_affiliation_string":"Center of Embedded Computer Systems, University of California, Irvine, CA, 92697, USA","institution_ids":["https://openalex.org/I204250578"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112310615","display_name":"Eli Bozorgzadeh","orcid":null},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Eli Bozorgzadeh","raw_affiliation_strings":["University of California at Irvine, irvine, CA, USA","Center of Embedded Computer Systems, University of California, Irvine, CA, 92697, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California at Irvine, irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]},{"raw_affiliation_string":"Center of Embedded Computer Systems, University of California, Irvine, CA, 92697, USA","institution_ids":["https://openalex.org/I204250578"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013660772","display_name":"Ahmed M. Eltawil","orcid":"https://orcid.org/0000-0003-1849-083X"},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ahmed Eltawil","raw_affiliation_strings":["University of California at Irvine, Irvine, CA, USA","Center of Embedded Computer Systems, University of California, Irvine, CA, 92697, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California at Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]},{"raw_affiliation_string":"Center of Embedded Computer Systems, University of California, Irvine, CA, 92697, USA","institution_ids":["https://openalex.org/I204250578"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008034875","display_name":"Fadi Kurdahi","orcid":"https://orcid.org/0000-0002-6982-365X"},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fadi J. Kurdahi","raw_affiliation_strings":["University of California at Irvine, Irvine, CA, USA","Center of Embedded Computer Systems, University of California, Irvine, CA, 92697, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California at Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]},{"raw_affiliation_string":"Center of Embedded Computer Systems, University of California, Irvine, CA, 92697, USA","institution_ids":["https://openalex.org/I204250578"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I204250578"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"257","last_page":"266"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8431034684181213},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.7586551904678345},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.734757661819458},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6468143463134766},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.6317484974861145},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5676412582397461},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5314363837242126},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5226587653160095},{"id":"https://openalex.org/keywords/voltage-reduction","display_name":"Voltage reduction","score":0.4560756981372833},{"id":"https://openalex.org/keywords/process-corners","display_name":"Process corners","score":0.43900030851364136},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4270741939544678},{"id":"https://openalex.org/keywords/dynamic-voltage-scaling","display_name":"Dynamic voltage scaling","score":0.42193907499313354},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.412839412689209},{"id":"https://openalex.org/keywords/realization","display_name":"Realization (probability)","score":0.4123656153678894},{"id":"https://openalex.org/keywords/energy-consumption","display_name":"Energy consumption","score":0.4116394817829132},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.3998384475708008},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39871644973754883},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3245096206665039},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19354405999183655},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18194395303726196}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8431034684181213},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.7586551904678345},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.734757661819458},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6468143463134766},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.6317484974861145},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5676412582397461},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5314363837242126},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5226587653160095},{"id":"https://openalex.org/C2780745134","wikidata":"https://www.wikidata.org/wiki/Q7940751","display_name":"Voltage reduction","level":3,"score":0.4560756981372833},{"id":"https://openalex.org/C192615534","wikidata":"https://www.wikidata.org/wiki/Q7247268","display_name":"Process corners","level":3,"score":0.43900030851364136},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4270741939544678},{"id":"https://openalex.org/C2776047111","wikidata":"https://www.wikidata.org/wiki/Q632037","display_name":"Dynamic voltage scaling","level":3,"score":0.42193907499313354},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.412839412689209},{"id":"https://openalex.org/C2781089630","wikidata":"https://www.wikidata.org/wiki/Q21856745","display_name":"Realization (probability)","level":2,"score":0.4123656153678894},{"id":"https://openalex.org/C2780165032","wikidata":"https://www.wikidata.org/wiki/Q16869822","display_name":"Energy consumption","level":2,"score":0.4116394817829132},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.3998384475708008},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39871644973754883},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3245096206665039},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19354405999183655},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18194395303726196},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1145/2039370.2039410","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2039370.2039410","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the seventh IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.706.5183","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.706.5183","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://newport.eecs.uci.edu/%7Eaeltawil/PDFs/Reliability-Aware%20Placement%20in%20SRAM-Based%20FPGA_C2011.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6399999856948853,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1523051745","https://openalex.org/W1661368752","https://openalex.org/W1797491097","https://openalex.org/W1965044833","https://openalex.org/W1993521122","https://openalex.org/W2000284467","https://openalex.org/W2001824086","https://openalex.org/W2005477361","https://openalex.org/W2046737467","https://openalex.org/W2063498460","https://openalex.org/W2106762617","https://openalex.org/W2122130138","https://openalex.org/W2132621842","https://openalex.org/W2135163821","https://openalex.org/W2137978438","https://openalex.org/W2148252376","https://openalex.org/W2155142975","https://openalex.org/W2159142998","https://openalex.org/W3142888977","https://openalex.org/W3145704529","https://openalex.org/W4206107614","https://openalex.org/W4251154776","https://openalex.org/W4290864872"],"related_works":["https://openalex.org/W2119312496","https://openalex.org/W4247460323","https://openalex.org/W2107909712","https://openalex.org/W2153162275","https://openalex.org/W2079259690","https://openalex.org/W2108986771","https://openalex.org/W2537086382","https://openalex.org/W2053154428","https://openalex.org/W2139512173","https://openalex.org/W2137899318"],"abstract_inverted_index":{"With":[0],"advances":[1],"in":[2,8,29,32,42,87,93,184,208],"technology":[3],"scaling,":[4],"the":[5,27,37,43,50,57,61,67,70,80,94,101,110,128,131,140,144,151,154,158,180,192,195,209],"configuration":[6,44,71,141,210],"memory":[7,211],"SRAM-based":[9],"FPGA":[10,58,196],"is":[11,64,137,177,182,216],"contributing":[12],"a":[13,53,115,121,159,188],"large":[14],"portion":[15],"of":[16,39,52,69,82,96,130,153,162,191],"power":[17,30,203],"consumption.":[18],"Voltage":[19],"scaling":[20,47,92,136,220],"has":[21],"been":[22],"widely":[23],"used":[24],"to":[25,78,89,103,139,166,186],"address":[26],"increases":[28],"consumption":[31],"submicron":[33],"regimes.":[34],"However,":[35],"with":[36,218,221],"advent":[38],"process":[40,97,167],"variation":[41,168],"SRAMs,":[45],"voltage":[46,91,112,135,170,219],"can":[48],"undermine":[49],"integrity":[51],"design":[54,102,133,193],"implemented":[55,105,132,155],"on":[56,85,100,106],"device":[59,181],"as":[60],"design's":[62],"functionality":[63],"determined":[65],"by":[66],"contents":[68],"SRAMs.":[72],"In":[73,143],"this":[74],"paper,":[75],"we":[76,108,149],"propose":[77],"exploit":[79],"abundance":[81],"homogenous":[83],"resources":[84],"FPGA,":[86,107],"order":[88,185],"realize":[90],"presence":[95],"variation.":[98],"Depending":[99],"be":[104],"select":[109],"minimal":[111],"that":[113,126],"sustains":[114],"reliable":[116],"placement.":[117],"We":[118],"then":[119],"introduce":[120],"novel":[122],"2-phase":[123],"placement":[124,190,214],"algorithm":[125],"maximizes":[127],"reliability":[129,152],"when":[134,212],"applied":[138],"memory.":[142],"first":[145],"phase,":[146,174],"pre-deployment":[147],"placement,":[148,176],"maximize":[150],"designs":[156],"considering":[157],"priori":[160],"distribution":[161],"SRAM":[163],"failures":[164],"due":[165],"and":[169],"scaling.":[171],"The":[172],"second":[173],"post-deployment":[175],"performed":[178],"once":[179],"fabricated":[183],"determine":[187],"fault-free":[189],"for":[194],"device.":[197],"Our":[198],"results":[199],"indicate":[200],"significant":[201],"leakage":[202],"reduction":[204],"(more":[205],"than":[206],"50%)":[207],"our":[213],"technique":[215],"combined":[217],"little":[222],"delay":[223],"degradation.":[224]},"counts_by_year":[{"year":2019,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}