{"id":"https://openalex.org/W2083004950","doi":"https://doi.org/10.1145/2039370.2039408","title":"Reliable software for unreliable hardware","display_name":"Reliable software for unreliable hardware","publication_year":2011,"publication_date":"2011-10-09","ids":{"openalex":"https://openalex.org/W2083004950","doi":"https://doi.org/10.1145/2039370.2039408","mag":"2083004950"},"language":"en","primary_location":{"id":"doi:10.1145/2039370.2039408","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2039370.2039408","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the seventh IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058712739","display_name":"Semeen Rehman","orcid":"https://orcid.org/0000-0002-8972-0949"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Semeen Rehman","raw_affiliation_strings":["Karlsruhe Institute of Technology, Karlsruhe, Germany","Karlsruhe Institute of Technology (KIT), Chair for Embedded Systems, Karlsruhe, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]},{"raw_affiliation_string":"Karlsruhe Institute of Technology (KIT), Chair for Embedded Systems, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005190949","display_name":"Muhammad Shafique","orcid":"https://orcid.org/0000-0002-2607-8135"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Muhammad Shafique","raw_affiliation_strings":["Karlsruhe Institute of Technology, Karlsruhe, Germany","Karlsruhe Institute of Technology (KIT), Chair for Embedded Systems, Karlsruhe, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]},{"raw_affiliation_string":"Karlsruhe Institute of Technology (KIT), Chair for Embedded Systems, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034338082","display_name":"Florian Kriebel","orcid":null},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Florian Kriebel","raw_affiliation_strings":["Karlsruhe Institute of Technology, Karlsruhe, Germany","Karlsruhe Institute of Technology (KIT), Chair for Embedded Systems, Karlsruhe, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]},{"raw_affiliation_string":"Karlsruhe Institute of Technology (KIT), Chair for Embedded Systems, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108423074","display_name":"J\u00f6rg Henkel","orcid":null},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"J\u00f6rg Henkel","raw_affiliation_strings":["Karlsruhe Institute of Technology, Karlsruhe, Germany","Karlsruhe Institute of Technology (KIT), Chair for Embedded Systems, Karlsruhe, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]},{"raw_affiliation_string":"Karlsruhe Institute of Technology (KIT), Chair for Embedded Systems, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I102335020"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":113,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"237","last_page":"246"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9934999942779541,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7658447027206421},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6479557156562805},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6462587714195251},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.6452428102493286},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6013453006744385},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5953714847564697},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.5809581279754639},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.5652275085449219},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4779791235923767},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.46595460176467896},{"id":"https://openalex.org/keywords/abstraction","display_name":"Abstraction","score":0.45566031336784363},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4486522674560547},{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.4215776324272156},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.23873957991600037},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.12236630916595459},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08150216937065125}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7658447027206421},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6479557156562805},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6462587714195251},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.6452428102493286},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6013453006744385},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5953714847564697},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.5809581279754639},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.5652275085449219},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4779791235923767},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.46595460176467896},{"id":"https://openalex.org/C124304363","wikidata":"https://www.wikidata.org/wiki/Q673661","display_name":"Abstraction","level":2,"score":0.45566031336784363},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4486522674560547},{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.4215776324272156},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.23873957991600037},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.12236630916595459},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08150216937065125},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2039370.2039408","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2039370.2039408","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the seventh IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5099999904632568,"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W2002003432","https://openalex.org/W2007925061","https://openalex.org/W2034593585","https://openalex.org/W2043318181","https://openalex.org/W2053578304","https://openalex.org/W2055115253","https://openalex.org/W2058640228","https://openalex.org/W2094446102","https://openalex.org/W2098891450","https://openalex.org/W2099569658","https://openalex.org/W2107948534","https://openalex.org/W2112506396","https://openalex.org/W2115753002","https://openalex.org/W2116991991","https://openalex.org/W2119306965","https://openalex.org/W2120708589","https://openalex.org/W2121043529","https://openalex.org/W2121233497","https://openalex.org/W2122959479","https://openalex.org/W2123907700","https://openalex.org/W2124486386","https://openalex.org/W2127859298","https://openalex.org/W2130189691","https://openalex.org/W2133860611","https://openalex.org/W2133971626","https://openalex.org/W2144512449","https://openalex.org/W2148313391","https://openalex.org/W2158760843","https://openalex.org/W3149410719","https://openalex.org/W4233628565","https://openalex.org/W4298230907","https://openalex.org/W6677752811","https://openalex.org/W6683683976"],"related_works":["https://openalex.org/W2607474334","https://openalex.org/W2130922779","https://openalex.org/W2082366402","https://openalex.org/W2083209667","https://openalex.org/W2120242933","https://openalex.org/W3155997325","https://openalex.org/W2742111403","https://openalex.org/W2770705319","https://openalex.org/W1911878188","https://openalex.org/W764083103"],"abstract_inverted_index":{"A":[0],"compilation":[1],"technique":[2,13],"for":[3],"reliability-aware":[4],"software":[5,46,68],"transformations":[6],"is":[7],"presented.":[8],"An":[9],"instruction-level":[10,22],"reliability":[11],"estimation":[12],"quantifies":[14],"the":[15,21,31],"effects":[16],"of":[17],"hardware-level":[18],"faults":[19,37],"at":[20],"while":[23],"considering":[24],"spatial":[25],"and":[26,45,76,95],"temporal":[27],"vulnerabilities.":[28],"It":[29],"bridges":[30],"gap":[32],"between":[33,74],"hardware":[34],"-":[35,44],"where":[36,50],"occur":[38],"according":[39],"to":[40,53,71,79],"our":[41,82],"fault":[42,92,96],"model":[43],"(the":[47],"abstraction":[48],"level":[49],"we":[51],"aim":[52],"increase":[54],"reliability).":[55],"For":[56],"a":[57,72],"given":[58],"tolerable":[59],"performance":[60,75],"overhead,":[61],"an":[62,66],"optimization":[63],"algorithm":[64],"compiles":[65],"application":[67,87],"with":[69],"respect":[70],"tradeoff":[73],"reliability.":[77],"Compared":[78],"performance-optimized":[80],"compilation,":[81],"method":[83],"incurs":[84],"60%-80%":[85],"lower":[86],"failures,":[88],"averaged":[89],"over":[90],"various":[91],"injection":[93],"scenarios":[94],"rates.":[97]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":9},{"year":2017,"cited_by_count":8},{"year":2016,"cited_by_count":18},{"year":2015,"cited_by_count":20},{"year":2014,"cited_by_count":13},{"year":2013,"cited_by_count":19},{"year":2012,"cited_by_count":8}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}