{"id":"https://openalex.org/W2016029449","doi":"https://doi.org/10.1145/1982185.1982489","title":"An empirical study on the usage of testability information to fault localization in software","display_name":"An empirical study on the usage of testability information to fault localization in software","publication_year":2011,"publication_date":"2011-03-21","ids":{"openalex":"https://openalex.org/W2016029449","doi":"https://doi.org/10.1145/1982185.1982489","mag":"2016029449"},"language":"en","primary_location":{"id":"doi:10.1145/1982185.1982489","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1982185.1982489","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2011 ACM Symposium on Applied Computing","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046072397","display_name":"Alberto Gonz\u00e1lez-S\u00e1nchez","orcid":"https://orcid.org/0000-0001-7880-2909"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Alberto Gonzalez-Sanchez","raw_affiliation_strings":["Delft University of Technology, The Netherlands","Delft University of Technology, The Netherlands;"],"affiliations":[{"raw_affiliation_string":"Delft University of Technology, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Delft University of Technology, The Netherlands;","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030785658","display_name":"Rui Abreu","orcid":"https://orcid.org/0000-0003-3734-3157"},"institutions":[{"id":"https://openalex.org/I182534213","display_name":"Universidade do Porto","ror":"https://ror.org/043pwc612","country_code":"PT","type":"education","lineage":["https://openalex.org/I182534213"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"Rui Abreu","raw_affiliation_strings":["University of Porto, Portugal","University of Porto , Portugal"],"affiliations":[{"raw_affiliation_string":"University of Porto, Portugal","institution_ids":["https://openalex.org/I182534213"]},{"raw_affiliation_string":"University of Porto , Portugal","institution_ids":["https://openalex.org/I182534213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109167344","display_name":"Hans\u2010Gerhard Gross","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Hans-Gerhard Gross","raw_affiliation_strings":["Delft University of Technology, The Netherlands","Delft University of Technology, The Netherlands;"],"affiliations":[{"raw_affiliation_string":"Delft University of Technology, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Delft University of Technology, The Netherlands;","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084609766","display_name":"Arjan J. C. van Gemund","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Arjan J. C. van Gemund","raw_affiliation_strings":["Delft University of Technology, The Netherlands","Delft University of Technology, The Netherlands;"],"affiliations":[{"raw_affiliation_string":"Delft University of Technology, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Delft University of Technology, The Netherlands;","institution_ids":["https://openalex.org/I98358874"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5046072397"],"corresponding_institution_ids":["https://openalex.org/I98358874"],"apc_list":null,"apc_paid":null,"fwci":2.3572,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.8842846,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1398","last_page":"1403"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.8121586441993713},{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.7785457372665405},{"id":"https://openalex.org/keywords/root-cause","display_name":"Root cause","score":0.7667911052703857},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.6390460133552551},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6385954022407532},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6089774370193481},{"id":"https://openalex.org/keywords/a-priori-and-a-posteriori","display_name":"A priori and a posteriori","score":0.5504723787307739},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5465956330299377},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5164718627929688},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.49616703391075134},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4761885702610016},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.43822330236434937},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.43087801337242126},{"id":"https://openalex.org/keywords/false-positive-rate","display_name":"False positive rate","score":0.4222947657108307},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3745507299900055},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.32739442586898804},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2583393454551697},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15307554602622986},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.13803204894065857},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1179419755935669}],"concepts":[{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.8121586441993713},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.7785457372665405},{"id":"https://openalex.org/C84945661","wikidata":"https://www.wikidata.org/wiki/Q7366567","display_name":"Root cause","level":2,"score":0.7667911052703857},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.6390460133552551},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6385954022407532},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6089774370193481},{"id":"https://openalex.org/C75553542","wikidata":"https://www.wikidata.org/wiki/Q178161","display_name":"A priori and a posteriori","level":2,"score":0.5504723787307739},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5465956330299377},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5164718627929688},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.49616703391075134},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4761885702610016},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.43822330236434937},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.43087801337242126},{"id":"https://openalex.org/C95922358","wikidata":"https://www.wikidata.org/wiki/Q5432725","display_name":"False positive rate","level":2,"score":0.4222947657108307},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3745507299900055},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.32739442586898804},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2583393454551697},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15307554602622986},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.13803204894065857},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1179419755935669},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1982185.1982489","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1982185.1982489","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2011 ACM Symposium on Applied Computing","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6399999856948853,"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1581207020","https://openalex.org/W1969981172","https://openalex.org/W1975620021","https://openalex.org/W2015502943","https://openalex.org/W2020794564","https://openalex.org/W2027462740","https://openalex.org/W2084323056","https://openalex.org/W2095873049","https://openalex.org/W2098115125","https://openalex.org/W2099855131","https://openalex.org/W2109681145","https://openalex.org/W2110068396","https://openalex.org/W2121084350","https://openalex.org/W2123659430","https://openalex.org/W2126491239","https://openalex.org/W2130359903","https://openalex.org/W2134691366","https://openalex.org/W2153418968","https://openalex.org/W2153701080","https://openalex.org/W2162045655","https://openalex.org/W2166007208","https://openalex.org/W2167341627","https://openalex.org/W2172154252","https://openalex.org/W3084687438"],"related_works":["https://openalex.org/W2369589212","https://openalex.org/W2049244319","https://openalex.org/W2035482730","https://openalex.org/W1604861690","https://openalex.org/W79904784","https://openalex.org/W2586839955","https://openalex.org/W2043849561","https://openalex.org/W2016029449","https://openalex.org/W2127317700","https://openalex.org/W4300923837"],"abstract_inverted_index":{"When":[0,163],"failures":[1],"occur":[2],"during":[3],"software":[4,7],"testing,":[5],"automated":[6],"fault":[8,50,66,95,176],"localization":[9,67,96,177],"helps":[10],"to":[11,24,80,165,182,192],"diagnose":[12],"their":[13,39],"root":[14,56],"causes":[15],"and":[16,64,159,190],"identify":[17],"the":[18,47,55,71,81,113,120,140,152,157,160,166],"defective":[19,85],"statements":[20,86],"of":[21,49,62,75,87,112,180],"a":[22,88,108,131,175],"program":[23,89],"support":[25],"debugging.":[26],"Diagnosis":[27],"is":[28,68,78],"carried":[29],"out":[30],"by":[31],"selecting":[32],"test":[33],"cases":[34],"in":[35,60,122,151,156],"such":[36],"way":[37],"that":[38],"pass":[40],"or":[41,105],"fail":[42],"information":[43,136,173],"will":[44,90],"narrow":[45],"down":[46],"set":[48],"candidates,":[51],"and,":[52],"eventually,":[53],"pinpoint":[54],"cause.":[57],"An":[58],"essential":[59],"gredient":[61],"effective":[63],"efficient":[65],"knowledge":[69],"about":[70],"false":[72,98,126,170],"negative":[73,99,127,171],"rate":[74,82,172],"tests,":[76],"which":[77,84],"related":[79],"at":[83],"exhibit":[91],"failures.":[92],"In":[93,115],"current":[94],"processes,":[97],"rates":[100,128],"are":[101,129],"either":[102],"ignored":[103],"completely,":[104],"merely":[106],"estimated":[107],"posteriori":[109],"as":[110],"part":[111],"diagnosis.":[114],"this":[116,135],"paper,":[117],"we":[118],"study":[119],"reduction":[121,179],"diagnosis":[123,153],"effort":[124,178],"when":[125],"known":[130],"priori.":[132],"We":[133],"deduce":[134],"from":[137],"testability,":[138],"following":[139],"propagation-infection-execution":[141],"(PIE)":[142],"approach.":[143],"Experiments":[144],"with":[145,186,196],"real":[146],"programs":[147],"suggest":[148],"significant":[149],"improvement":[150],"process,":[154],"both":[155],"single":[158],"multiple-fault":[161],"cases.":[162],"compared":[164],"next-best":[167],"technique,":[168],"PIE-based":[169],"yields":[174],"up":[181,191],"80%":[183],"for":[184,194],"systems":[185,195],"only":[187],"one":[188],"fault,":[189],"60%":[193],"multiple":[197],"faults.":[198]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}