{"id":"https://openalex.org/W2061415230","doi":"https://doi.org/10.1145/1973009.1973039","title":"Towards robust nano-CMOS sense amplifier design","display_name":"Towards robust nano-CMOS sense amplifier design","publication_year":2011,"publication_date":"2011-05-02","ids":{"openalex":"https://openalex.org/W2061415230","doi":"https://doi.org/10.1145/1973009.1973039","mag":"2061415230"},"language":"en","primary_location":{"id":"doi:10.1145/1973009.1973039","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1973009.1973039","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 21st edition of the great lakes symposium on Great lakes symposium on VLSI","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009967108","display_name":"Oghenekarho Okobiah","orcid":null},"institutions":[{"id":"https://openalex.org/I123534392","display_name":"University of North Texas","ror":"https://ror.org/00v97ad02","country_code":"US","type":"education","lineage":["https://openalex.org/I123534392"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Oghenekarho Okobiah","raw_affiliation_strings":["University of North Texas, Denton, TX, USA","University of North Texas, Denton, TX, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of North Texas, Denton, TX, USA","institution_ids":["https://openalex.org/I123534392"]},{"raw_affiliation_string":"University of North Texas, Denton, TX, USA#TAB#","institution_ids":["https://openalex.org/I123534392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070359867","display_name":"Saraju P. Mohanty","orcid":"https://orcid.org/0000-0003-2959-6541"},"institutions":[{"id":"https://openalex.org/I123534392","display_name":"University of North Texas","ror":"https://ror.org/00v97ad02","country_code":"US","type":"education","lineage":["https://openalex.org/I123534392"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Saraju P. Mohanty","raw_affiliation_strings":["University of North Texas, Denton, TX, USA","University of North Texas, Denton, TX, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of North Texas, Denton, TX, USA","institution_ids":["https://openalex.org/I123534392"]},{"raw_affiliation_string":"University of North Texas, Denton, TX, USA#TAB#","institution_ids":["https://openalex.org/I123534392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062843590","display_name":"Elias Kougianos","orcid":"https://orcid.org/0000-0002-1616-7628"},"institutions":[{"id":"https://openalex.org/I123534392","display_name":"University of North Texas","ror":"https://ror.org/00v97ad02","country_code":"US","type":"education","lineage":["https://openalex.org/I123534392"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Elias Kougianos","raw_affiliation_strings":["University of North Texas, Denton, TX, USA","University of North Texas, Denton, TX, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of North Texas, Denton, TX, USA","institution_ids":["https://openalex.org/I123534392"]},{"raw_affiliation_string":"University of North Texas, Denton, TX, USA#TAB#","institution_ids":["https://openalex.org/I123534392"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022896061","display_name":"Mahesh Poolakkaparambil","orcid":null},"institutions":[{"id":"https://openalex.org/I124261462","display_name":"Oxford Brookes University","ror":"https://ror.org/04v2twj65","country_code":"GB","type":"education","lineage":["https://openalex.org/I124261462"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Mahesh Poolakkaparambil","raw_affiliation_strings":["Oxford Brookes University, Oxford, United Kingdom"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Oxford Brookes University, Oxford, United Kingdom","institution_ids":["https://openalex.org/I124261462"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.1325,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.91743444,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"145","last_page":"150"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sense-amplifier","display_name":"Sense amplifier","score":0.7791290283203125},{"id":"https://openalex.org/keywords/sense","display_name":"Sense (electronics)","score":0.7358906269073486},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.6126539707183838},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5739827752113342},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5597286224365234},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.52468341588974},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.508003294467926},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.5054106712341309},{"id":"https://openalex.org/keywords/figure-of-merit","display_name":"Figure of merit","score":0.4694245457649231},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.46767744421958923},{"id":"https://openalex.org/keywords/current-sense-amplifier","display_name":"Current sense amplifier","score":0.456859827041626},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.39131689071655273},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.37654387950897217},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2577438950538635},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.2450442910194397},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13129892945289612}],"concepts":[{"id":"https://openalex.org/C32666082","wikidata":"https://www.wikidata.org/wiki/Q7450979","display_name":"Sense amplifier","level":3,"score":0.7791290283203125},{"id":"https://openalex.org/C143141573","wikidata":"https://www.wikidata.org/wiki/Q7450971","display_name":"Sense (electronics)","level":2,"score":0.7358906269073486},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.6126539707183838},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5739827752113342},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5597286224365234},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.52468341588974},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.508003294467926},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.5054106712341309},{"id":"https://openalex.org/C130277099","wikidata":"https://www.wikidata.org/wiki/Q3676605","display_name":"Figure of merit","level":2,"score":0.4694245457649231},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.46767744421958923},{"id":"https://openalex.org/C182442803","wikidata":"https://www.wikidata.org/wiki/Q5195113","display_name":"Current sense amplifier","level":5,"score":0.456859827041626},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39131689071655273},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.37654387950897217},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2577438950538635},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.2450442910194397},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13129892945289612},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1973009.1973039","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1973009.1973039","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 21st edition of the great lakes symposium on Great lakes symposium on VLSI","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6700000166893005}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W63678922","https://openalex.org/W1977489283","https://openalex.org/W2038803569","https://openalex.org/W2061503929","https://openalex.org/W2069262460","https://openalex.org/W2096973557","https://openalex.org/W2103961769","https://openalex.org/W2130631365","https://openalex.org/W2139138351","https://openalex.org/W2146452500","https://openalex.org/W2158146193","https://openalex.org/W2167869933","https://openalex.org/W2545613065","https://openalex.org/W3203011645","https://openalex.org/W6750403012"],"related_works":["https://openalex.org/W2029990318","https://openalex.org/W2601845499","https://openalex.org/W2117344730","https://openalex.org/W4231592364","https://openalex.org/W1801034736","https://openalex.org/W223048161","https://openalex.org/W2110404619","https://openalex.org/W2376821340","https://openalex.org/W1988819626","https://openalex.org/W1795954073"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"research":[3],"leading":[4],"to":[5,50,71,89,111],"robust":[6],"nano-CMOS":[7],"sense":[8,34,63,80,83,142,157,161],"amplifier":[9,35,143],"design":[10,18],"by":[11,155,159,163,168],"incorporating":[12],"process":[13,23,94,120],"variation":[14,24],"early":[15],"in":[16,39],"the":[17,28,55,59,62,73,91,101,104,117,125,136,149],"process.":[19],"The":[20,65],"effects":[21,118],"of":[22,30,61,67,93,119],"are":[25,75],"analyzed":[26],"on":[27,58,96],"performance":[29,60],"a":[31,107],"conventional":[32],"voltage":[33,130],"which":[36,52],"is":[37,45,87,109],"used":[38,70],"most":[40,56],"DRAMs.":[41],"A":[42],"parametric":[43],"study":[44],"performed":[46,88],"through":[47],"circuit":[48,74],"simulations":[49],"investigate":[51],"parameters":[53],"have":[54],"impact":[57,92],"amplifier.":[64],"Figures":[66],"Merit":[68],"(FoMs)":[69],"characterize":[72],"precharge":[76,153],"time,":[77,138],"power":[78,166],"dissipation,":[79],"delay":[81,158],"and":[82,131,165],"margin.":[84],"Statistical":[85],"analysis":[86],"examine":[90],"variations":[95],"each":[97],"FoM.":[98],"By":[99],"analyzing":[100],"results":[102,146],"from":[103],"statistical":[105],"study,":[106],"method":[108],"presented":[110],"select":[112],"parameter":[113],"values":[114],"that":[115,148],"minimize":[116],"variation.":[121],"In":[122],"this":[123],"context,":[124],"well-established":[126],"process-level":[127],"techniques":[128],"dual-threshold":[129],"dual-oxide":[132],"thickness":[133],"are,":[134],"for":[135,140,170],"first":[137],"investigated":[139],"efficient":[141],"design.":[144],"Experimental":[145],"prove":[147],"proposed":[150],"approach":[151],"improves":[152],"time":[154],"63.3%,":[156],"53.6%,":[160],"margin":[162],"39.3%,":[164],"dissipation":[167],"23.3%":[169],"45":[171],"nm":[172],"CMOS.":[173]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}