{"id":"https://openalex.org/W2130195423","doi":"https://doi.org/10.1145/1960397.1960437","title":"Stochastic analog circuit behavior modeling by point estimation method","display_name":"Stochastic analog circuit behavior modeling by point estimation method","publication_year":2011,"publication_date":"2011-03-22","ids":{"openalex":"https://openalex.org/W2130195423","doi":"https://doi.org/10.1145/1960397.1960437","mag":"2130195423"},"language":"en","primary_location":{"id":"doi:10.1145/1960397.1960437","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1960397.1960437","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2011 international symposium on Physical design","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111918002","display_name":"Fang Gong","orcid":null},"institutions":[{"id":"https://openalex.org/I161318765","display_name":"University of California, Los Angeles","ror":"https://ror.org/046rm7j60","country_code":"US","type":"education","lineage":["https://openalex.org/I161318765"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fang Gong","raw_affiliation_strings":["University of California, Los Angeles, Los Angeles, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California, Los Angeles, Los Angeles, CA, USA","institution_ids":["https://openalex.org/I161318765"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100432170","display_name":"Hao Yu","orcid":"https://orcid.org/0000-0001-8747-3203"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Hao Yu","raw_affiliation_strings":["Nanyang Technological University, Singapore, Singapore","Nanyang Technological University, Singapore, SINGAPORE#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanyang Technological University, Singapore, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Nanyang Technological University, Singapore, SINGAPORE#TAB#","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008695429","display_name":"Lei He","orcid":"https://orcid.org/0000-0002-5266-3805"},"institutions":[{"id":"https://openalex.org/I161318765","display_name":"University of California, Los Angeles","ror":"https://ror.org/046rm7j60","country_code":"US","type":"education","lineage":["https://openalex.org/I161318765"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lei He","raw_affiliation_strings":["University of California, Los Angeles, Los Angeles, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California, Los Angeles, Los Angeles, CA, USA","institution_ids":["https://openalex.org/I161318765"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":12.0708,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.99317194,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"175","last_page":"182"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/speedup","display_name":"Speedup","score":0.7016030550003052},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.6138956546783447},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5885891914367676},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.5657770037651062},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5398193597793579},{"id":"https://openalex.org/keywords/gaussian","display_name":"Gaussian","score":0.5360705256462097},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.5194915533065796},{"id":"https://openalex.org/keywords/probability-density-function","display_name":"Probability density function","score":0.467564195394516},{"id":"https://openalex.org/keywords/estimation-theory","display_name":"Estimation theory","score":0.4646463096141815},{"id":"https://openalex.org/keywords/probability-distribution","display_name":"Probability distribution","score":0.4495594799518585},{"id":"https://openalex.org/keywords/stochastic-process","display_name":"Stochastic process","score":0.4293842911720276},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4194788932800293},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2950214147567749},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.11515346169471741}],"concepts":[{"id":"https://openalex.org/C68339613","wikidata":"https://www.wikidata.org/wiki/Q1549489","display_name":"Speedup","level":2,"score":0.7016030550003052},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.6138956546783447},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5885891914367676},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.5657770037651062},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5398193597793579},{"id":"https://openalex.org/C163716315","wikidata":"https://www.wikidata.org/wiki/Q901177","display_name":"Gaussian","level":2,"score":0.5360705256462097},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.5194915533065796},{"id":"https://openalex.org/C197055811","wikidata":"https://www.wikidata.org/wiki/Q207522","display_name":"Probability density function","level":2,"score":0.467564195394516},{"id":"https://openalex.org/C167928553","wikidata":"https://www.wikidata.org/wiki/Q1376021","display_name":"Estimation theory","level":2,"score":0.4646463096141815},{"id":"https://openalex.org/C149441793","wikidata":"https://www.wikidata.org/wiki/Q200726","display_name":"Probability distribution","level":2,"score":0.4495594799518585},{"id":"https://openalex.org/C8272713","wikidata":"https://www.wikidata.org/wiki/Q176737","display_name":"Stochastic process","level":2,"score":0.4293842911720276},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4194788932800293},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2950214147567749},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.11515346169471741},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1960397.1960437","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1960397.1960437","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2011 international symposium on Physical design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1498699371","https://openalex.org/W1667165204","https://openalex.org/W1980075007","https://openalex.org/W2000836282","https://openalex.org/W2018159038","https://openalex.org/W2053792421","https://openalex.org/W2075245861","https://openalex.org/W2130028907","https://openalex.org/W2152312970","https://openalex.org/W2157210245","https://openalex.org/W2163626738","https://openalex.org/W2167508000","https://openalex.org/W2942228371"],"related_works":["https://openalex.org/W2058965144","https://openalex.org/W2164382479","https://openalex.org/W2146343568","https://openalex.org/W98480971","https://openalex.org/W2150291671","https://openalex.org/W2013643406","https://openalex.org/W2027972911","https://openalex.org/W2095860056","https://openalex.org/W2351359734","https://openalex.org/W2122669027"],"abstract_inverted_index":{"Stochastic":[0],"device":[1],"parameter":[2,37,67],"variations":[3,35],"have":[4,42,154],"dramatically":[5],"increased":[6],"beyond":[7],"the":[8,32,104,130,157,169,188,195],"scale":[9],"of":[10,97,115,122,151],"65nm":[11],"and":[12,66],"can":[13,125,161,180],"significantly":[14],"lead":[15],"to":[16,59,80,93,164,184],"large":[17],"mismatch":[18],"for":[19,85,139],"analog":[20,25,86],"circuits.":[21],"To":[22],"estimate":[23],"unknown":[24],"circuit":[26,87,98,123],"behavior":[27,99,124],"in":[28,36,77,89,100],"performance":[29,64,90],"space":[30,65],"under":[31,142],"given":[33],"stochastic":[34,83],"space,":[38],"many":[39],"state-of-art":[40],"approaches":[41],"been":[43,75,108],"developed":[44],"recently.":[45],"However,":[46],"either":[47],"Gaussian":[48],"distribution":[49],"or":[50],"response":[51],"surface":[52],"model":[53],"(RSM)":[54],"with":[55,110,168,174,194],"analytical":[56],"formulae":[57],"has":[58,74,107],"be":[60,126],"assumed":[61],"when":[62,172],"connecting":[63],"space.":[68,91],"A":[69],"novel":[70],"point-estimation":[71,105,159],"based":[72],"approach":[73],"proposed":[76,158],"this":[78],"paper":[79],"capture":[81],"arbitrary":[82],"distributions":[84],"behaviors":[88],"First,":[92],"evaluate":[94],"high-order":[95,132],"moments":[96],"an":[101],"accurate":[102],"fashion,":[103],"method":[106,135,160,190],"applied":[109],"only":[111],"a":[112,149],"few":[113],"number":[114,150],"simulations.":[116],"Then,":[117],"probability":[118],"density":[119],"function":[120],"(PDF)":[121],"efficiently":[127],"extracted":[128],"by":[129],"obtained":[131],"moments.":[133],"This":[134],"is":[136],"further":[137,181],"extended":[138],"multiple":[140],"parameters":[141],"linear":[143],"complexity.":[144],"Extensive":[145],"numerical":[146],"experiments":[147],"on":[148],"different":[152],"circuits":[153],"demonstrated":[155],"that":[156],"provide":[162],"up":[163,183],"181X":[165],"runtime":[166],"speedup":[167,186],"same":[170],"accuracy,":[171],"compared":[173],"Monte":[175],"Carlo":[176],"method.":[177],"Moreover,":[178],"it":[179],"achieve":[182],"15X":[185],"over":[187],"RSM-based":[189],"such":[191],"as":[192],"APEX":[193],"similar":[196],"accuracy.":[197]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":6}],"updated_date":"2026-07-30T17:31:21.811387","created_date":"2025-10-10T00:00:00"}
