{"id":"https://openalex.org/W2016941765","doi":"https://doi.org/10.1145/1852786.1852793","title":"An effective fault aware test case prioritization by incorporating a fault localization technique","display_name":"An effective fault aware test case prioritization by incorporating a fault localization technique","publication_year":2010,"publication_date":"2010-09-14","ids":{"openalex":"https://openalex.org/W2016941765","doi":"https://doi.org/10.1145/1852786.1852793","mag":"2016941765"},"language":"en","primary_location":{"id":"doi:10.1145/1852786.1852793","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1852786.1852793","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2010 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101730893","display_name":"Sejun Kim","orcid":"https://orcid.org/0000-0003-4452-0529"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sejun Kim","raw_affiliation_strings":["KAIST, Daejeon, Korea","KAIST , Daejeon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"KAIST , Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5046980238","display_name":"Jongmoon Baik","orcid":"https://orcid.org/0000-0002-2546-7665"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jongmoon Baik","raw_affiliation_strings":["KAIST, Daejeon, Korea","KAIST , Daejeon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"KAIST , Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.7227,"has_fulltext":false,"cited_by_count":29,"citation_normalized_percentile":{"value":0.89961319,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-suite","display_name":"Test suite","score":0.767346978187561},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.7613009810447693},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.720343291759491},{"id":"https://openalex.org/keywords/prioritization","display_name":"Prioritization","score":0.6407921314239502},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6394016742706299},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6338889002799988},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5942132472991943},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.5590356588363647},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.48778778314590454},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4876345694065094},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4866076707839966},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4198581576347351},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1981281042098999},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.18727853894233704},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.18711313605308533},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15641146898269653}],"concepts":[{"id":"https://openalex.org/C151552104","wikidata":"https://www.wikidata.org/wiki/Q7705809","display_name":"Test suite","level":4,"score":0.767346978187561},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.7613009810447693},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.720343291759491},{"id":"https://openalex.org/C2777615720","wikidata":"https://www.wikidata.org/wiki/Q11888847","display_name":"Prioritization","level":2,"score":0.6407921314239502},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6394016742706299},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6338889002799988},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5942132472991943},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.5590356588363647},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.48778778314590454},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4876345694065094},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4866076707839966},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4198581576347351},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1981281042098999},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.18727853894233704},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.18711313605308533},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15641146898269653},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C539667460","wikidata":"https://www.wikidata.org/wiki/Q2414942","display_name":"Management science","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1852786.1852793","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1852786.1852793","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2010 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.49000000953674316,"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions"}],"awards":[{"id":"https://openalex.org/G1061734285","display_name":null,"funder_award_id":"KRF-2008-313-D00932","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W168089997","https://openalex.org/W1843474218","https://openalex.org/W2034445812","https://openalex.org/W2036196659","https://openalex.org/W2078761505","https://openalex.org/W2095710561","https://openalex.org/W2096662969","https://openalex.org/W2100152184","https://openalex.org/W2101819268","https://openalex.org/W2107940771","https://openalex.org/W2110068396","https://openalex.org/W2113237484","https://openalex.org/W2117700156","https://openalex.org/W2119136132","https://openalex.org/W2119507390","https://openalex.org/W2122156253","https://openalex.org/W2123659430","https://openalex.org/W2126752493","https://openalex.org/W2126941999","https://openalex.org/W2130359903","https://openalex.org/W2137433502","https://openalex.org/W2137839528","https://openalex.org/W2141270406","https://openalex.org/W2145576179","https://openalex.org/W2152949369","https://openalex.org/W2162045655","https://openalex.org/W2162200351","https://openalex.org/W2162376048","https://openalex.org/W2165404405","https://openalex.org/W2166007208","https://openalex.org/W2170771779","https://openalex.org/W3010856131","https://openalex.org/W4233319527","https://openalex.org/W4241947695","https://openalex.org/W4243053781"],"related_works":["https://openalex.org/W2021253405","https://openalex.org/W2535245920","https://openalex.org/W4295918990","https://openalex.org/W4313447549","https://openalex.org/W2067499928","https://openalex.org/W2028796071","https://openalex.org/W1888619389","https://openalex.org/W2030553922","https://openalex.org/W3022870375","https://openalex.org/W2794522096"],"abstract_inverted_index":{"Prior":[0],"coverage-based":[1,149],"test":[2,15,31,56,73,97,106,110,128],"case":[3,74],"prioritization":[4,75],"techniques":[5],"aim":[6],"to":[7,18,132,146],"increase":[8],"fault":[9,83,87,93],"detection":[10,94],"rates":[11],"by":[12,85,140],"ordering":[13,54],"the":[14,36,53,91,102,122,142,147],"cases":[16,32,57,107,111],"according":[17],"some":[19],"coverage":[20,60,80,114],"criteria.":[21],"However,":[22],"in":[23,115,136],"practice,":[24],"since":[25],"detected":[26],"faults":[27,134],"are":[28],"typically":[29],"removed,":[30],"that":[33,77],"already":[34],"covered":[35],"previously":[37],"executed":[38],"areas":[39],"might":[40,62],"not":[41,63],"perform":[42],"well":[43],"as":[44],"expected,":[45],"irrespective":[46],"of":[47,55,96,104,125],"their":[48],"coverage.":[49],"In":[50,66],"this":[51,67],"case,":[52],"based":[58],"on":[59],"information":[61,84,95],"be":[64],"effective.":[65],"paper,":[68],"we":[69],"introduce":[70],"a":[71,137],"new":[72],"technique":[76],"considers":[78],"both":[79],"and":[81,130],"historical":[82,92],"incorporating":[86],"localization":[88],"technique.":[89],"Using":[90],"cases,":[98],"our":[99],"approach":[100,119],"adjusts":[101],"priorities":[103],"fault-found":[105],"while":[108],"maintaining":[109],"with":[112],"high":[113,116],"priority.":[117],"Our":[118],"can":[120],"reduce":[121],"total":[123],"cost":[124],"executing":[126],"entire":[127],"suite(s)":[129],"enables":[131],"detect":[133],"earlier":[135],"testing":[138,143],"process":[139],"improving":[141],"effectiveness":[144],"compared":[145],"prior":[148],"techniques.":[150]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}