{"id":"https://openalex.org/W2048816638","doi":"https://doi.org/10.1145/1840845.1840898","title":"NBTI-aware DVFS","display_name":"NBTI-aware DVFS","publication_year":2010,"publication_date":"2010-08-18","ids":{"openalex":"https://openalex.org/W2048816638","doi":"https://doi.org/10.1145/1840845.1840898","mag":"2048816638"},"language":"en","primary_location":{"id":"doi:10.1145/1840845.1840898","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1840845.1840898","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 16th ACM/IEEE international symposium on Low power electronics and design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5071457763","display_name":"Mehmet Basoglu","orcid":null},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Mehmet Basoglu","raw_affiliation_strings":["The University of Texas at Austin, Austin, TX, USA","The University of Texas at Austin,Electrical and Computer Engineering Department,Austin,TX,78712"],"affiliations":[{"raw_affiliation_string":"The University of Texas at Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]},{"raw_affiliation_string":"The University of Texas at Austin,Electrical and Computer Engineering Department,Austin,TX,78712","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090899796","display_name":"Michael Orshansky","orcid":"https://orcid.org/0000-0002-6223-4748"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael Orshansky","raw_affiliation_strings":["The University of Texas at Austin, Austin, TX, USA","The University of Texas at Austin,Electrical and Computer Engineering Department,Austin,TX,78712"],"affiliations":[{"raw_affiliation_string":"The University of Texas at Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]},{"raw_affiliation_string":"The University of Texas at Austin,Electrical and Computer Engineering Department,Austin,TX,78712","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013680653","display_name":"Mattan Erez","orcid":"https://orcid.org/0000-0002-1567-4097"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mattan Erez","raw_affiliation_strings":["The University of Texas at Austin, Austin, TX, USA","The University of Texas at Austin,Electrical and Computer Engineering Department,Austin,TX,78712"],"affiliations":[{"raw_affiliation_string":"The University of Texas at Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]},{"raw_affiliation_string":"The University of Texas at Austin,Electrical and Computer Engineering Department,Austin,TX,78712","institution_ids":["https://openalex.org/I86519309"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5071457763"],"corresponding_institution_ids":["https://openalex.org/I86519309"],"apc_list":null,"apc_paid":null,"fwci":4.7028,"has_fulltext":false,"cited_by_count":65,"citation_normalized_percentile":{"value":0.94985221,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"253","last_page":"258"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/guard","display_name":"Guard (computer science)","score":0.7366015911102295},{"id":"https://openalex.org/keywords/negative-bias-temperature-instability","display_name":"Negative-bias temperature instability","score":0.7352350950241089},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6099900603294373},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5754335522651672},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5713387727737427},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.5144963264465332},{"id":"https://openalex.org/keywords/energy-consumption","display_name":"Energy consumption","score":0.4634966552257538},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4539257884025574},{"id":"https://openalex.org/keywords/multi-core-processor","display_name":"Multi-core processor","score":0.4470154047012329},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.42313092947006226},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3182693123817444},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24013188481330872},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.20813605189323425},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.1923588216304779},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17937636375427246},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.1776849925518036},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1555469036102295},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.09204232692718506}],"concepts":[{"id":"https://openalex.org/C141141315","wikidata":"https://www.wikidata.org/wiki/Q2379942","display_name":"Guard (computer science)","level":2,"score":0.7366015911102295},{"id":"https://openalex.org/C557185","wikidata":"https://www.wikidata.org/wiki/Q6987194","display_name":"Negative-bias temperature instability","level":5,"score":0.7352350950241089},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6099900603294373},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5754335522651672},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5713387727737427},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.5144963264465332},{"id":"https://openalex.org/C2780165032","wikidata":"https://www.wikidata.org/wiki/Q16869822","display_name":"Energy consumption","level":2,"score":0.4634966552257538},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4539257884025574},{"id":"https://openalex.org/C78766204","wikidata":"https://www.wikidata.org/wiki/Q555032","display_name":"Multi-core processor","level":2,"score":0.4470154047012329},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.42313092947006226},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3182693123817444},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24013188481330872},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.20813605189323425},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.1923588216304779},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17937636375427246},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.1776849925518036},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1555469036102295},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.09204232692718506},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1840845.1840898","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1840845.1840898","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 16th ACM/IEEE international symposium on Low power electronics and design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8899999856948853,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1991891926","https://openalex.org/W2061048015","https://openalex.org/W2089129261","https://openalex.org/W2094477153","https://openalex.org/W2098097478","https://openalex.org/W2102729267","https://openalex.org/W2104114347","https://openalex.org/W2104677471","https://openalex.org/W2115461525","https://openalex.org/W2116175063","https://openalex.org/W2124563469","https://openalex.org/W2136066624","https://openalex.org/W2136103183","https://openalex.org/W2142364983","https://openalex.org/W2144726910","https://openalex.org/W2148147859","https://openalex.org/W2155581886","https://openalex.org/W2156591015","https://openalex.org/W2164004001","https://openalex.org/W2164047446","https://openalex.org/W3147784729","https://openalex.org/W6648143052"],"related_works":["https://openalex.org/W2157278395","https://openalex.org/W2374313965","https://openalex.org/W4254637722","https://openalex.org/W2980401999","https://openalex.org/W3016483420","https://openalex.org/W2331628363","https://openalex.org/W2393030234","https://openalex.org/W3198851420","https://openalex.org/W4243132314","https://openalex.org/W2298526277"],"abstract_inverted_index":{"Scaling":[0],"process":[1,78],"technology":[2],"necessitates":[3],"the":[4,32,49,60,65,81,90],"introduction":[5],"of":[6,31,70,89],"wide":[7],"design-time":[8],"guard":[9,33],"bands":[10],"that":[11],"ensure":[12],"lifetime":[13,46,96],"reliability":[14],"as":[15],"circuits":[16],"wear":[17],"out":[18],"over":[19],"time.":[20],"In":[21],"this":[22,29],"paper,":[23],"we":[24,63],"show":[25],"how":[26],"to":[27,39,87],"utilize":[28],"knowledge":[30],"band":[34],"and":[35,45,68,75,94],"a":[36],"predictive":[37],"model":[38],"absolutely":[40],"improve":[41,95],"processor":[42,50],"power":[43],"consumption":[44],"without":[47],"impacting":[48],"performance":[51],"against":[52],"Negative":[53],"Bias":[54],"Temperature":[55],"Instability":[56],"(NBTI)":[57],"degradation.":[58],"For":[59],"first":[61],"time,":[62],"evaluate":[64],"long-term":[66],"potential":[67],"impact":[69],"NBTI-aware":[71],"job-to-core":[72],"mapping":[73],"quantitatively":[74],"account":[76],"for":[77],"variations":[79],"in":[80],"system.":[82],"Our":[83],"approach":[84],"saves":[85],"up":[86],"16%":[88],"dynamic":[91],"energy":[92],"consumed":[93],"by":[97],"two":[98],"years.":[99]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":7},{"year":2015,"cited_by_count":12},{"year":2014,"cited_by_count":10},{"year":2013,"cited_by_count":6},{"year":2012,"cited_by_count":7}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2016-06-24T00:00:00"}