{"id":"https://openalex.org/W2144334108","doi":"https://doi.org/10.1145/1840845.1840878","title":"A low-power clock gating cell optimized for low-voltage operation in a 45-nm technology","display_name":"A low-power clock gating cell optimized for low-voltage operation in a 45-nm technology","publication_year":2010,"publication_date":"2010-08-18","ids":{"openalex":"https://openalex.org/W2144334108","doi":"https://doi.org/10.1145/1840845.1840878","mag":"2144334108"},"language":"en","primary_location":{"id":"doi:10.1145/1840845.1840878","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1840845.1840878","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 16th ACM/IEEE international symposium on Low power electronics and design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088701856","display_name":"Martin Saint-Laurent","orcid":null},"institutions":[{"id":"https://openalex.org/I19268510","display_name":"Qualcomm (United Kingdom)","ror":"https://ror.org/04d3djg48","country_code":"GB","type":"company","lineage":["https://openalex.org/I19268510","https://openalex.org/I4210087596"]},{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]}],"countries":["GB","US"],"is_corresponding":false,"raw_author_name":"Martin Saint-Laurent","raw_affiliation_strings":["Qualcomm, Austin, TX, USA","Qualcomm, Austin, TX, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qualcomm, Austin, TX, USA","institution_ids":["https://openalex.org/I4210087596"]},{"raw_affiliation_string":"Qualcomm, Austin, TX, USA#TAB#","institution_ids":["https://openalex.org/I19268510"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065043481","display_name":"Animesh Datta","orcid":"https://orcid.org/0000-0003-4021-4655"},"institutions":[{"id":"https://openalex.org/I19268510","display_name":"Qualcomm (United Kingdom)","ror":"https://ror.org/04d3djg48","country_code":"GB","type":"company","lineage":["https://openalex.org/I19268510","https://openalex.org/I4210087596"]},{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]}],"countries":["GB","US"],"is_corresponding":false,"raw_author_name":"Animesh Datta","raw_affiliation_strings":["Qualcomm, San Diego, CA, USA","[Qualcomm, San Diego, CA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qualcomm, San Diego, CA, USA","institution_ids":["https://openalex.org/I4210087596"]},{"raw_affiliation_string":"[Qualcomm, San Diego, CA, USA]","institution_ids":["https://openalex.org/I19268510"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8828,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.78758846,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"159","last_page":"164"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/clock-gating","display_name":"Clock gating","score":0.7703465223312378},{"id":"https://openalex.org/keywords/power-gating","display_name":"Power gating","score":0.6357272267341614},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5879163146018982},{"id":"https://openalex.org/keywords/low-voltage","display_name":"Low voltage","score":0.5324042439460754},{"id":"https://openalex.org/keywords/standby-power","display_name":"Standby power","score":0.504880964756012},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.49766281247138977},{"id":"https://openalex.org/keywords/low-power-electronics","display_name":"Low-power electronics","score":0.49375829100608826},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49211543798446655},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4907170534133911},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.47782424092292786},{"id":"https://openalex.org/keywords/dynamic-demand","display_name":"Dynamic demand","score":0.4399257004261017},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4353179335594177},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.428916335105896},{"id":"https://openalex.org/keywords/synchronous-circuit","display_name":"Synchronous circuit","score":0.3863111734390259},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3661261796951294},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.2474917471408844},{"id":"https://openalex.org/keywords/clock-signal","display_name":"Clock signal","score":0.24111753702163696},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.2206583321094513},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.20891577005386353},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1448580026626587}],"concepts":[{"id":"https://openalex.org/C22716491","wikidata":"https://www.wikidata.org/wiki/Q590170","display_name":"Clock gating","level":5,"score":0.7703465223312378},{"id":"https://openalex.org/C2780700455","wikidata":"https://www.wikidata.org/wiki/Q7236515","display_name":"Power gating","level":4,"score":0.6357272267341614},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5879163146018982},{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.5324042439460754},{"id":"https://openalex.org/C7140552","wikidata":"https://www.wikidata.org/wiki/Q1366402","display_name":"Standby power","level":3,"score":0.504880964756012},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.49766281247138977},{"id":"https://openalex.org/C117551214","wikidata":"https://www.wikidata.org/wiki/Q6692774","display_name":"Low-power electronics","level":4,"score":0.49375829100608826},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49211543798446655},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4907170534133911},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.47782424092292786},{"id":"https://openalex.org/C45872418","wikidata":"https://www.wikidata.org/wiki/Q5318966","display_name":"Dynamic demand","level":3,"score":0.4399257004261017},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4353179335594177},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.428916335105896},{"id":"https://openalex.org/C42196554","wikidata":"https://www.wikidata.org/wiki/Q1186179","display_name":"Synchronous circuit","level":4,"score":0.3863111734390259},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3661261796951294},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.2474917471408844},{"id":"https://openalex.org/C137059387","wikidata":"https://www.wikidata.org/wiki/Q426882","display_name":"Clock signal","level":3,"score":0.24111753702163696},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.2206583321094513},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.20891577005386353},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1448580026626587},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1840845.1840878","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1840845.1840878","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 16th ACM/IEEE international symposium on Low power electronics and design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7900000214576721}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1582019256","https://openalex.org/W1988773816","https://openalex.org/W2031456393","https://openalex.org/W2152938140","https://openalex.org/W2541933328","https://openalex.org/W4238927715","https://openalex.org/W4250498385","https://openalex.org/W6729424422"],"related_works":["https://openalex.org/W3013845316","https://openalex.org/W2152979262","https://openalex.org/W2485892467","https://openalex.org/W4252084893","https://openalex.org/W1949070338","https://openalex.org/W2112183879","https://openalex.org/W4390197045","https://openalex.org/W1510566755","https://openalex.org/W2949418755","https://openalex.org/W3140192626"],"abstract_inverted_index":{"This":[0],"paper":[1,57],"discusses":[2,58],"a":[3,73],"novel":[4],"clock":[5,47],"gating":[6],"cell":[7],"(CGC)":[8],"optimized":[9,76],"for":[10,77],"low-power":[11],"and":[12,25,37,52],"low-voltage":[13,53],"operation.":[14,54],"First,":[15],"the":[16,19,31,40,56,59,65,69],"limitations":[17],"of":[18,45,68],"conventional":[20,41],"CGC":[21,33],"topology":[22,34],"are":[23,28],"analyzed":[24],"several":[26],"improvements":[27],"proposed.":[29],"Next,":[30],"new":[32,70],"is":[35],"introduced":[36],"compared":[38],"to":[39,63],"one":[42],"in":[43,72],"terms":[44],"dynamic":[46],"power,":[48],"leakage,":[49],"area,":[50],"timing,":[51],"Finally,":[55],"silicon":[60],"measurements":[61],"taken":[62],"verify":[64],"correct":[66],"functionality":[67],"circuit":[71],"45-nm":[74],"technology":[75],"low":[78],"standby":[79],"power.":[80]},"counts_by_year":[{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}