{"id":"https://openalex.org/W2004982717","doi":"https://doi.org/10.1145/1837274.1837454","title":"In-situ characterization and extraction of SRAM variability","display_name":"In-situ characterization and extraction of SRAM variability","publication_year":2010,"publication_date":"2010-06-13","ids":{"openalex":"https://openalex.org/W2004982717","doi":"https://doi.org/10.1145/1837274.1837454","mag":"2004982717"},"language":"en","primary_location":{"id":"doi:10.1145/1837274.1837454","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1837274.1837454","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 47th Design Automation Conference","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085711547","display_name":"Srivatsan Chellappa","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Srivatsan Chellappa","raw_affiliation_strings":["Arizona State University, Tempe, AZ","School of Electrical Computer, and Energy Engineering Arizona State University Tempe AZ 85287 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arizona State University, Tempe, AZ","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"School of Electrical Computer, and Energy Engineering Arizona State University Tempe AZ 85287 USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100851900","display_name":"Jia Ni","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jia Ni","raw_affiliation_strings":["Arizona State University, Tempe, AZ","School of Electrical Computer, and Energy Engineering Arizona State University Tempe AZ 85287 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arizona State University, Tempe, AZ","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"School of Electrical Computer, and Energy Engineering Arizona State University Tempe AZ 85287 USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048148838","display_name":"Xiaoyin Yao","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xiaoyin Yao","raw_affiliation_strings":["Arizona State University, Tempe, AZ","School of Electrical Computer, and Energy Engineering Arizona State University Tempe AZ 85287 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arizona State University, Tempe, AZ","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"School of Electrical Computer, and Energy Engineering Arizona State University Tempe AZ 85287 USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016810496","display_name":"Nathan D. Hindman","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nathan Hindman","raw_affiliation_strings":["Arizona State University, Tempe, AZ","School of Electrical Computer, and Energy Engineering Arizona State University Tempe AZ 85287 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arizona State University, Tempe, AZ","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"School of Electrical Computer, and Energy Engineering Arizona State University Tempe AZ 85287 USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112915942","display_name":"Jyothi Velamala","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jyothi Velamala","raw_affiliation_strings":["Arizona State University, Tempe, AZ","School of Electrical Computer, and Energy Engineering Arizona State University Tempe AZ 85287 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arizona State University, Tempe, AZ","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"School of Electrical Computer, and Energy Engineering Arizona State University Tempe AZ 85287 USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100337209","display_name":"Min Chen","orcid":"https://orcid.org/0000-0002-0960-4447"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Min Chen","raw_affiliation_strings":["Arizona State University, Tempe, AZ","School of Electrical Computer, and Energy Engineering Arizona State University Tempe AZ 85287 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arizona State University, Tempe, AZ","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"School of Electrical Computer, and Energy Engineering Arizona State University Tempe AZ 85287 USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100740019","display_name":"Yu Cao","orcid":"https://orcid.org/0000-0001-6968-1180"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yu Cao","raw_affiliation_strings":["Arizona State University, Tempe, AZ","School of Electrical Computer, and Energy Engineering Arizona State University Tempe AZ 85287 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arizona State University, Tempe, AZ","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"School of Electrical Computer, and Energy Engineering Arizona State University Tempe AZ 85287 USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015329523","display_name":"Lawrence T. Clark","orcid":"https://orcid.org/0000-0001-7741-6512"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lawrence T. Clark","raw_affiliation_strings":["Arizona State University, Tempe, AZ","School of Electrical Computer, and Energy Engineering Arizona State University Tempe AZ 85287 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arizona State University, Tempe, AZ","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"School of Electrical Computer, and Energy Engineering Arizona State University Tempe AZ 85287 USA","institution_ids":["https://openalex.org/I55732556"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I55732556"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"711","last_page":"716"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.9154623746871948},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.694924533367157},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.5901745557785034},{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.587531566619873},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5637049674987793},{"id":"https://openalex.org/keywords/quasistatic-process","display_name":"Quasistatic process","score":0.5429919958114624},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5225467085838318},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.4442986845970154},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44271180033683777},{"id":"https://openalex.org/keywords/stability","display_name":"Stability (learning theory)","score":0.4412163496017456},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.41917678713798523},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29466015100479126},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19145989418029785},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.0928896963596344},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.06688961386680603}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.9154623746871948},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.694924533367157},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.5901745557785034},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.587531566619873},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5637049674987793},{"id":"https://openalex.org/C4708273","wikidata":"https://www.wikidata.org/wiki/Q900222","display_name":"Quasistatic process","level":2,"score":0.5429919958114624},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5225467085838318},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.4442986845970154},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44271180033683777},{"id":"https://openalex.org/C112972136","wikidata":"https://www.wikidata.org/wiki/Q7595718","display_name":"Stability (learning theory)","level":2,"score":0.4412163496017456},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.41917678713798523},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29466015100479126},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19145989418029785},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0928896963596344},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06688961386680603},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1837274.1837454","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1837274.1837454","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 47th Design Automation Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1527137186","https://openalex.org/W1822414784","https://openalex.org/W1986080087","https://openalex.org/W2002044298","https://openalex.org/W2002612140","https://openalex.org/W2005688043","https://openalex.org/W2059193309","https://openalex.org/W2101003251","https://openalex.org/W2106440759","https://openalex.org/W2130785523","https://openalex.org/W2142718365","https://openalex.org/W2147279710","https://openalex.org/W2151218494","https://openalex.org/W2151614652","https://openalex.org/W2154477062","https://openalex.org/W2155153274","https://openalex.org/W2162583644","https://openalex.org/W2168101540"],"related_works":["https://openalex.org/W2119312496","https://openalex.org/W4247460323","https://openalex.org/W2537086382","https://openalex.org/W2107909712","https://openalex.org/W2153162275","https://openalex.org/W2079259690","https://openalex.org/W2108986771","https://openalex.org/W789543267","https://openalex.org/W2004965314","https://openalex.org/W2094295436"],"abstract_inverted_index":{"Measurement":[0],"and":[1,14,30,117,151],"extraction":[2],"of":[3,68,87,114,127,139,148],"as":[4],"fabricated":[5],"SRAM":[6,43,69,95,102,140],"cell":[7,44,70],"variability":[8],"is":[9,18,53,75,162],"essential":[10],"to":[11,23,55,101],"process":[12],"improvement":[13],"robust":[15],"design.":[16],"This":[17,34],"challenging":[19],"in":[20,26,77],"practice,":[21],"due":[22],"the":[24,27,63,88,124,155],"complexity":[25],"test":[28,40,80,96,107],"procedure":[29,41,108,135],"requisite":[31],"numerical":[32],"analysis.":[33],"work":[35],"proposes":[36],"a":[37,78,93,105,119],"new":[38,134],"singleended":[39],"for":[42],"write":[45,149],"margin":[46,150],"measurement.":[47],"Moreover,":[48],"an":[49],"efficient":[50],"decomposition":[51],"method":[52,90,121],"developed":[54],"extract":[56],"transistor":[57,129],"threshold":[58],"voltage":[59],"(VTH)":[60],"variations":[61,161],"from":[62,130,158],"measurements,":[64],"allowing":[65],"accurate":[66,137],"determination":[67],"stability.":[71],"The":[72,85,133],"entire":[73],"approach":[74],"demonstrated":[76],"90nm":[79,146],"chip":[81],"with":[82,98,145],"32K":[83],"cells.":[84],"advantages":[86],"proposed":[89],"include:":[91],"(1)":[92],"single-ended":[94],"structure":[97],"no":[99],"disturbance":[100],"operations;":[103],"(2)":[104],"convenient":[106],"that":[109,122],"only":[110],"requires":[111],"quasistatic":[112],"control":[113],"external":[115],"voltages;":[116],"(3)":[118],"non-iterative":[120],"extracts":[123],"VTH":[125,160],"variation":[126],"each":[128],"eight":[131],"measurements.":[132],"enables":[136],"predictions":[138],"performance":[141],"variability.":[142],"As":[143],"validated":[144],"data":[147,152],"retention":[153],"voltage,":[154],"prediction":[156],"error":[157],"extracted":[159],"<":[163],"4%":[164],"at":[165],"all":[166],"corners.":[167]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}