{"id":"https://openalex.org/W2062716389","doi":"https://doi.org/10.1145/1837274.1837369","title":"Efficient fault simulation on many-core processors","display_name":"Efficient fault simulation on many-core processors","publication_year":2010,"publication_date":"2010-06-13","ids":{"openalex":"https://openalex.org/W2062716389","doi":"https://doi.org/10.1145/1837274.1837369","mag":"2062716389"},"language":"en","primary_location":{"id":"doi:10.1145/1837274.1837369","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1837274.1837369","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 47th Design Automation Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058173647","display_name":"Michael A. Kochte","orcid":"https://orcid.org/0000-0002-1228-3402"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Michael A. Kochte","raw_affiliation_strings":["Universitaet Stuttgart, Stuttgart, Germany","Institut fuer Technische Informatik, Universitaet Stuttgart Pfaffenwaldring 47, 70569 Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"Universitaet Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Institut fuer Technische Informatik, Universitaet Stuttgart Pfaffenwaldring 47, 70569 Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022726678","display_name":"Marcel Schaal","orcid":null},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Marcel Schaal","raw_affiliation_strings":["Universitaet Stuttgart, Stuttgart, Germany","Institut fuer Technische Informatik, Universitaet Stuttgart Pfaffenwaldring 47, 70569 Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"Universitaet Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Institut fuer Technische Informatik, Universitaet Stuttgart Pfaffenwaldring 47, 70569 Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008775226","display_name":"Hans-Joachim Wunderlich","orcid":"https://orcid.org/0000-0003-4536-8290"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hans-Joachim Wunderlich","raw_affiliation_strings":["Universitaet Stuttgart, Stuttgart, Germany","Institut fuer Technische Informatik, Universitaet Stuttgart Pfaffenwaldring 47, 70569 Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"Universitaet Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Institut fuer Technische Informatik, Universitaet Stuttgart Pfaffenwaldring 47, 70569 Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019448924","display_name":"Christian G. Zoellin","orcid":null},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Christian G. Zoellin","raw_affiliation_strings":["Universitaet Stuttgart, Stuttgart, Germany","Institut fuer Technische Informatik, Universitaet Stuttgart Pfaffenwaldring 47, 70569 Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"Universitaet Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Institut fuer Technische Informatik, Universitaet Stuttgart Pfaffenwaldring 47, 70569 Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5058173647"],"corresponding_institution_ids":["https://openalex.org/I100066346"],"apc_list":null,"apc_paid":null,"fwci":5.5592,"has_fulltext":false,"cited_by_count":60,"citation_normalized_percentile":{"value":0.96260813,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"380","last_page":"385"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6772668361663818},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6545620560646057},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6183191537857056},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5865670442581177},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.548642098903656},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.48706749081611633},{"id":"https://openalex.org/keywords/core","display_name":"Core (optical fiber)","score":0.4517360329627991},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4397381842136383},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.34373897314071655},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2891099750995636},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1678941249847412}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6772668361663818},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6545620560646057},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6183191537857056},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5865670442581177},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.548642098903656},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.48706749081611633},{"id":"https://openalex.org/C2164484","wikidata":"https://www.wikidata.org/wiki/Q5170150","display_name":"Core (optical fiber)","level":2,"score":0.4517360329627991},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4397381842136383},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.34373897314071655},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2891099750995636},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1678941249847412},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1145/1837274.1837369","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1837274.1837369","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 47th Design Automation Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.177.6606","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.177.6606","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.ra.informatik.uni-stuttgart.de/research/publications/papers/conferences/2010/DAC_KochteSWZ2010.pdf","raw_type":"text"},{"id":"pmh:oai:informatik.uni-stuttgart.de:INPROC-2010-91","is_oa":false,"landing_page_url":"http://www2.informatik.uni-stuttgart.de/cgi-bin/NCSTRL/NCSTRL_view.pl?id=INPROC-2010-91&engl=1","pdf_url":null,"source":{"id":"https://openalex.org/S4306401306","display_name":"Fachbereich Informatik (University of Stuttgart)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I100066346","host_organization_name":"University of Stuttgart","host_organization_lineage":["https://openalex.org/I100066346"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"\\n            In: Proceedings of the 47th ACM/IEEE Design Automation Conference\\n            (DAC), Anaheim, CA, USA, June 13 - 18, 2010, pp. 380-385\\n          ","raw_type":"Text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G6468402549","display_name":null,"funder_award_id":"EXC 310/1","funder_id":"https://openalex.org/F4320320879","funder_display_name":"Deutsche Forschungsgemeinschaft"}],"funders":[{"id":"https://openalex.org/F4320320879","display_name":"Deutsche Forschungsgemeinschaft","ror":"https://ror.org/018mejw64"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W41485005","https://openalex.org/W1504291959","https://openalex.org/W1855227287","https://openalex.org/W1975338463","https://openalex.org/W2003968955","https://openalex.org/W2029525207","https://openalex.org/W2034896421","https://openalex.org/W2069246068","https://openalex.org/W2070042721","https://openalex.org/W2097275999","https://openalex.org/W2100092298","https://openalex.org/W2108157916","https://openalex.org/W2117886086","https://openalex.org/W2120201314","https://openalex.org/W2126339347","https://openalex.org/W2128077509","https://openalex.org/W2130022711","https://openalex.org/W2133250872","https://openalex.org/W2139989464","https://openalex.org/W2143150203","https://openalex.org/W2146906688","https://openalex.org/W2150770193","https://openalex.org/W2151762825","https://openalex.org/W2155503253","https://openalex.org/W2165806469","https://openalex.org/W2169150396","https://openalex.org/W2171115678","https://openalex.org/W2171587453","https://openalex.org/W3197258575","https://openalex.org/W4234256867","https://openalex.org/W4247913514","https://openalex.org/W4255274308"],"related_works":["https://openalex.org/W2340957901","https://openalex.org/W2115005577","https://openalex.org/W3147038789","https://openalex.org/W2065847128","https://openalex.org/W2150780157","https://openalex.org/W2038006164","https://openalex.org/W1986800855","https://openalex.org/W2381711745","https://openalex.org/W1981860015","https://openalex.org/W2163292000"],"abstract_inverted_index":{"Fault":[0],"simulation":[1,20],"is":[2],"essential":[3],"in":[4],"test":[5,9],"generation,":[6],"design":[7],"for":[8],"and":[10,18],"reliability":[11],"assessment":[12],"of":[13,21,32],"integrated":[14],"circuits.":[15],"Reliability":[16],"analysis":[17],"the":[19],"self-test":[22],"structures":[23],"are":[24],"particularly":[25],"computationally":[26],"expensive":[27],"as":[28],"a":[29],"large":[30],"number":[31],"patterns":[33],"has":[34],"to":[35],"be":[36],"evaluated.":[37]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":3},{"year":2018,"cited_by_count":8},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":9},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":7},{"year":2012,"cited_by_count":9}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}