{"id":"https://openalex.org/W2080573826","doi":"https://doi.org/10.1145/1811100.1811120","title":"Application of generalized scattering matrix for prediction of power supply noise","display_name":"Application of generalized scattering matrix for prediction of power supply noise","publication_year":2010,"publication_date":"2010-06-13","ids":{"openalex":"https://openalex.org/W2080573826","doi":"https://doi.org/10.1145/1811100.1811120","mag":"2080573826"},"language":"en","primary_location":{"id":"doi:10.1145/1811100.1811120","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1811100.1811120","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 12th ACM/IEEE international workshop on System level interconnect prediction","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070230146","display_name":"Koh Yamanaga","orcid":null},"institutions":[{"id":"https://openalex.org/I924388194","display_name":"Murata (Japan)","ror":"https://ror.org/04hd8bd67","country_code":"JP","type":"company","lineage":["https://openalex.org/I924388194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Koh Yamanaga","raw_affiliation_strings":["Murata Manufacturing Co., Ltd., Yokohama, Kanagawa, Japan","Murata Manufacturing Co., Ltd., Yokohama, Kanagawa, Japan#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Murata Manufacturing Co., Ltd., Yokohama, Kanagawa, Japan","institution_ids":["https://openalex.org/I924388194"]},{"raw_affiliation_string":"Murata Manufacturing Co., Ltd., Yokohama, Kanagawa, Japan#TAB#","institution_ids":["https://openalex.org/I924388194"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049015548","display_name":"Kazuya Masu","orcid":"https://orcid.org/0000-0002-7121-8440"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazuya Masu","raw_affiliation_strings":["Tokyo Institute of Technology, Yokohama, Kanagwa, Japan","Tokyo Institute of Technology, Yokohama, Kanagwa, Japan#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tokyo Institute of Technology, Yokohama, Kanagwa, Japan","institution_ids":["https://openalex.org/I114531698"]},{"raw_affiliation_string":"Tokyo Institute of Technology, Yokohama, Kanagwa, Japan#TAB#","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017861176","display_name":"Takashi Sat\u014d","orcid":"https://orcid.org/0000-0002-1577-8259"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takashi Sato","raw_affiliation_strings":["Kyoto University, Kyoto, Japan","Kyoto University, Kyoto, Japan#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]},{"raw_affiliation_string":"Kyoto University, Kyoto, Japan#TAB#","institution_ids":["https://openalex.org/I22299242"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.20474713,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"83","last_page":"90"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5811781883239746},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5767449736595154},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.5260443687438965},{"id":"https://openalex.org/keywords/scattering-parameters","display_name":"Scattering parameters","score":0.5099893808364868},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4669932425022125},{"id":"https://openalex.org/keywords/test-fixture","display_name":"Test fixture","score":0.4654078781604767},{"id":"https://openalex.org/keywords/reflection","display_name":"Reflection (computer programming)","score":0.4370483458042145},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4163748025894165},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38990604877471924},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.378665953874588},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3726077675819397},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19418954849243164}],"concepts":[{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5811781883239746},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5767449736595154},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.5260443687438965},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.5099893808364868},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4669932425022125},{"id":"https://openalex.org/C2778502540","wikidata":"https://www.wikidata.org/wiki/Q1141613","display_name":"Test fixture","level":2,"score":0.4654078781604767},{"id":"https://openalex.org/C65682993","wikidata":"https://www.wikidata.org/wiki/Q1056451","display_name":"Reflection (computer programming)","level":2,"score":0.4370483458042145},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4163748025894165},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38990604877471924},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.378665953874588},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3726077675819397},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19418954849243164},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1145/1811100.1811120","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1811100.1811120","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 12th ACM/IEEE international workshop on System level interconnect prediction","raw_type":"proceedings-article"},{"id":"pmh:oai:t2r2.star.titech.ac.jp:50522475","is_oa":false,"landing_page_url":"http://t2r2.star.titech.ac.jp/cgi-bin/publicationinfo.cgi?q_publication_content_number=CTT100821492","pdf_url":null,"source":{"id":"https://openalex.org/S4377196385","display_name":"Tokyo Tech Research Repository (Tokyo Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I114531698","host_organization_name":"Tokyo Institute of Technology","host_organization_lineage":["https://openalex.org/I114531698"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference Paper"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8899999856948853}],"awards":[],"funders":[{"id":"https://openalex.org/F4320329790","display_name":"Shandong University of Technology","ror":"https://ror.org/02mr3ar13"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1479727142","https://openalex.org/W1518484508","https://openalex.org/W1564852149","https://openalex.org/W1591806839","https://openalex.org/W2113346827","https://openalex.org/W2143359098","https://openalex.org/W2150104543","https://openalex.org/W2152850399","https://openalex.org/W2169296435","https://openalex.org/W2317862654","https://openalex.org/W2552559191","https://openalex.org/W2601241020","https://openalex.org/W2629157711","https://openalex.org/W3045278540","https://openalex.org/W4300433917"],"related_works":["https://openalex.org/W2133149683","https://openalex.org/W4386472848","https://openalex.org/W2093420810","https://openalex.org/W2965893625","https://openalex.org/W1716099252","https://openalex.org/W2531313117","https://openalex.org/W2122654865","https://openalex.org/W3165495534","https://openalex.org/W1970435640","https://openalex.org/W1632022671"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"application":[3],"of":[4,16,25,35,39,58,71,78,93,107,115,121,128,138],"generalized":[5,36],"scattering":[6,37],"matrix":[7,38],"is":[8,65,132],"studied":[9],"for":[10,135],"predicting":[11],"resonant":[12],"and":[13,32,46,54,60,89],"anti-resonant":[14],"frequencies":[15],"power":[17,26,42,85,129],"distribution":[18],"network,":[19],"which":[20],"are":[21,49,96],"the":[22,30,82,108,111,116,119,125,139],"major":[23],"causes":[24],"supply":[27,43,86,130],"noise.":[28],"With":[29,81],"reflection":[31],"transmission":[33],"characteristics":[34],"package":[40],"interposer,":[41],"voltage":[44,87],"fluctuation":[45,88],"conducted":[47,90],"noise":[48,91,131],"accurately":[50,98],"estimated":[51],"considering":[52],"non-ideal":[53],"general":[55],"parasitic":[56],"effects":[57],"LSI":[59],"PCB.":[61],"The":[62],"proposed":[63,83],"method":[64,103],"experimentally":[66],"validated":[67],"through":[68],"a":[69],"measurement":[70],"test":[72,117],"fixture":[73],"that":[74,104],"supports":[75],"different":[76,94],"kinds":[77],"ceramic":[79],"capacitors.":[80,141],"method,":[84],"propagation":[92],"designs":[95],"more":[97],"predicted":[99],"than":[100],"conventional":[101],"prediction":[102],"uses":[105],"Z-parameter":[106],"package.":[109],"Through":[110],"equivalent":[112],"circuit":[113,122],"model":[114],"fixture,":[118],"effect":[120],"parameters":[123],"to":[124],"frequency":[126],"responses":[127],"also":[133],"analyzed":[134],"better":[136],"choice":[137],"noise-suppression":[140]},"counts_by_year":[],"updated_date":"2026-08-01T09:00:35.917206","created_date":"2025-10-10T00:00:00"}