{"id":"https://openalex.org/W2111410817","doi":"https://doi.org/10.1145/1723028.1723031","title":"Diagnosis of recurrent faults using log files","display_name":"Diagnosis of recurrent faults using log files","publication_year":2009,"publication_date":"2009-01-01","ids":{"openalex":"https://openalex.org/W2111410817","doi":"https://doi.org/10.1145/1723028.1723031","mag":"2111410817"},"language":"en","primary_location":{"id":"doi:10.1145/1723028.1723031","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1723028.1723031","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2009 Conference of the Center for Advanced Studies on Collaborative Research - CASCON '09","raw_type":"proceedings-article"},"type":"conference-abstract","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001482605","display_name":"Thomas Reidemeister","orcid":null},"institutions":[{"id":"https://openalex.org/I151746483","display_name":"University of Waterloo","ror":"https://ror.org/01aff2v68","country_code":"CA","type":"education","lineage":["https://openalex.org/I151746483"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Thomas Reidemeister","raw_affiliation_strings":["University of Waterloo, Ontario, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Waterloo, Ontario, Canada","institution_ids":["https://openalex.org/I151746483"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088217022","display_name":"Mohammad A. Munawar","orcid":null},"institutions":[{"id":"https://openalex.org/I151746483","display_name":"University of Waterloo","ror":"https://ror.org/01aff2v68","country_code":"CA","type":"education","lineage":["https://openalex.org/I151746483"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Mohammad Ahmad Munawar","raw_affiliation_strings":["University of Waterloo, Ontario, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Waterloo, Ontario, Canada","institution_ids":["https://openalex.org/I151746483"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100711795","display_name":"Miao Jiang","orcid":"https://orcid.org/0000-0002-3681-9494"},"institutions":[{"id":"https://openalex.org/I151746483","display_name":"University of Waterloo","ror":"https://ror.org/01aff2v68","country_code":"CA","type":"education","lineage":["https://openalex.org/I151746483"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Miao Jiang","raw_affiliation_strings":["University of Waterloo, Ontario, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Waterloo, Ontario, Canada","institution_ids":["https://openalex.org/I151746483"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113917771","display_name":"Paul A. S. Ward","orcid":null},"institutions":[{"id":"https://openalex.org/I151746483","display_name":"University of Waterloo","ror":"https://ror.org/01aff2v68","country_code":"CA","type":"education","lineage":["https://openalex.org/I151746483"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Paul A. S. Ward","raw_affiliation_strings":["University of Waterloo, Ontario, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Waterloo, Ontario, Canada","institution_ids":["https://openalex.org/I151746483"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I151746483"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"12","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10538","display_name":"Data Mining Algorithms and Applications","score":0.9884999990463257,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7525240778923035},{"id":"https://openalex.org/keywords/naive-bayes-classifier","display_name":"Naive Bayes classifier","score":0.5906586050987244},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.5357187390327454},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5156182646751404},{"id":"https://openalex.org/keywords/root-cause","display_name":"Root cause","score":0.4970684349536896},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.48246318101882935},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.46071678400039673},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.37159883975982666},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3429451584815979},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10225799679756165}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7525240778923035},{"id":"https://openalex.org/C52001869","wikidata":"https://www.wikidata.org/wiki/Q812530","display_name":"Naive Bayes classifier","level":3,"score":0.5906586050987244},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.5357187390327454},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5156182646751404},{"id":"https://openalex.org/C84945661","wikidata":"https://www.wikidata.org/wiki/Q7366567","display_name":"Root cause","level":2,"score":0.4970684349536896},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.48246318101882935},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.46071678400039673},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.37159883975982666},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3429451584815979},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10225799679756165},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1723028.1723031","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1723028.1723031","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2009 Conference of the Center for Advanced Studies on Collaborative Research - CASCON '09","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.7799999713897705}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W164902916","https://openalex.org/W195884107","https://openalex.org/W585617010","https://openalex.org/W1550206324","https://openalex.org/W1570448133","https://openalex.org/W1648885110","https://openalex.org/W1661413208","https://openalex.org/W1669201668","https://openalex.org/W1880262756","https://openalex.org/W1978394996","https://openalex.org/W2023848271","https://openalex.org/W2050759137","https://openalex.org/W2063473896","https://openalex.org/W2064580901","https://openalex.org/W2097089247","https://openalex.org/W2105454049","https://openalex.org/W2107263349","https://openalex.org/W2125055259","https://openalex.org/W2143220335","https://openalex.org/W2143522309","https://openalex.org/W2153259761","https://openalex.org/W2154306155","https://openalex.org/W2158907675","https://openalex.org/W2161415693","https://openalex.org/W2164405010","https://openalex.org/W2481296161","https://openalex.org/W2966207845"],"related_works":["https://openalex.org/W2374901194","https://openalex.org/W2033512842","https://openalex.org/W2994319598","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3116237489","https://openalex.org/W1607054433"],"abstract_inverted_index":{"Enterprise":[0],"software":[1],"systems":[2,13],"(ESS)":[3],"are":[4,58,127],"becoming":[5],"larger":[6],"and":[7,36,67,77,97,109,130],"increasingly":[8],"complex.":[9],"Failure":[10],"in":[11,40,56],"business-critical":[12],"is":[14,44],"expensive,":[15],"leading":[16],"to":[17,102,110],"consequences":[18],"such":[19],"as":[20],"loss":[21,25],"of":[22,26,53,70,106,116],"critical":[23],"data,":[24],"sales,":[27],"customer":[28],"dissatisfaction,":[29],"even":[30],"law":[31],"suits.":[32],"Therefore,":[33],"detecting":[34],"failures":[35,54,72],"diagnosing":[37],"their":[38],"root-cause":[39],"a":[41,50],"timely":[42],"manner":[43],"essential.":[45],"Many":[46],"studies":[47],"suggest":[48],"that":[49],"large":[51],"fraction":[52],"encountered":[55],"practice":[57],"recurrent":[59,107],"(i.e.,":[60],"they":[61,126,131],"have":[62],"been":[63],"seen":[64],"before).":[65],"Fast":[66],"accurate":[68],"detection":[69,112],"these":[71],"can":[73],"accelerate":[74],"problem":[75],"determination,":[76],"thereby":[78],"improve":[79],"system":[80],"reliability.":[81],"To":[82],"this":[83],"effect,":[84],"we":[85],"explore":[86],"machine":[87],"learning":[88],"techniques,":[89],"including":[90],"the":[91,140,143],"Na\u00efve":[92],"Bayes":[93],"classifier,":[94],"partially-supervised":[95],"learning,":[96],"decision":[98],"trees":[99],"(using":[100],"C4.5),":[101],"automatically":[103],"recognize":[104],"symptoms":[105],"faults":[108],"derive":[111],"rules":[113],"from":[114],"samples":[115],"log":[117,123],"data.":[118,144],"This":[119],"work":[120],"focuses":[121],"on":[122,139],"files,":[124],"since":[125],"readily":[128],"available":[129],"do":[132],"not":[133],"put":[134],"any":[135],"additional":[136],"computational":[137],"burden":[138],"component":[141],"generating":[142]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":3},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}