{"id":"https://openalex.org/W2135033600","doi":"https://doi.org/10.1145/1698759.1698767","title":"Phase-adjustable error detection flip-flops with 2-stage hold-driven optimization, slack-based grouping scheme and slack distribution control for dynamic voltage scaling","display_name":"Phase-adjustable error detection flip-flops with 2-stage hold-driven optimization, slack-based grouping scheme and slack distribution control for dynamic voltage scaling","publication_year":2010,"publication_date":"2010-02-01","ids":{"openalex":"https://openalex.org/W2135033600","doi":"https://doi.org/10.1145/1698759.1698767","mag":"2135033600"},"language":"en","primary_location":{"id":"doi:10.1145/1698759.1698767","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1698759.1698767","pdf_url":null,"source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082611644","display_name":"Masanori Kurimoto","orcid":null},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Masanori Kurimoto","raw_affiliation_strings":["Renesas Technology Corporation, Japan"],"affiliations":[{"raw_affiliation_string":"Renesas Technology Corporation, Japan","institution_ids":["https://openalex.org/I4210153176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014500771","display_name":"Hiroaki Suzuki","orcid":"https://orcid.org/0000-0002-3535-703X"},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroaki Suzuki","raw_affiliation_strings":["Renesas Technology Corporation, Japan"],"affiliations":[{"raw_affiliation_string":"Renesas Technology Corporation, Japan","institution_ids":["https://openalex.org/I4210153176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080223510","display_name":"Rei Akiyama","orcid":null},"institutions":[{"id":"https://openalex.org/I75636454","display_name":"Renesas Electronics (United States)","ror":"https://ror.org/014775w70","country_code":"US","type":"company","lineage":["https://openalex.org/I4210153176","https://openalex.org/I75636454"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rei Akiyama","raw_affiliation_strings":["Renesas Design Corporation"],"affiliations":[{"raw_affiliation_string":"Renesas Design Corporation","institution_ids":["https://openalex.org/I75636454"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110631809","display_name":"T. Yamanaka","orcid":null},"institutions":[{"id":"https://openalex.org/I75636454","display_name":"Renesas Electronics (United States)","ror":"https://ror.org/014775w70","country_code":"US","type":"company","lineage":["https://openalex.org/I4210153176","https://openalex.org/I75636454"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tadao Yamanaka","raw_affiliation_strings":["Renesas Design Corporation"],"affiliations":[{"raw_affiliation_string":"Renesas Design Corporation","institution_ids":["https://openalex.org/I75636454"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062230156","display_name":"Haruyuki Ohkuma","orcid":null},"institutions":[{"id":"https://openalex.org/I75636454","display_name":"Renesas Electronics (United States)","ror":"https://ror.org/014775w70","country_code":"US","type":"company","lineage":["https://openalex.org/I4210153176","https://openalex.org/I75636454"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Haruyuki Ohkuma","raw_affiliation_strings":["Renesas Design Corporation"],"affiliations":[{"raw_affiliation_string":"Renesas Design Corporation","institution_ids":["https://openalex.org/I75636454"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102062108","display_name":"Hidehiro Takata","orcid":null},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hidehiro Takata","raw_affiliation_strings":["Renesas Technology Corporation, Japan"],"affiliations":[{"raw_affiliation_string":"Renesas Technology Corporation, Japan","institution_ids":["https://openalex.org/I4210153176"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008563407","display_name":"Hirofumi Shinohara","orcid":"https://orcid.org/0000-0001-5589-8397"},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hirofumi Shinohara","raw_affiliation_strings":["Renesas Technology Corporation, Japan"],"affiliations":[{"raw_affiliation_string":"Renesas Technology Corporation, Japan","institution_ids":["https://openalex.org/I4210153176"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5082611644"],"corresponding_institution_ids":["https://openalex.org/I4210153176"],"apc_list":null,"apc_paid":null,"fwci":0.2886,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.65478923,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"15","issue":"2","first_page":"1","last_page":"17"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7511003017425537},{"id":"https://openalex.org/keywords/dynamic-voltage-scaling","display_name":"Dynamic voltage scaling","score":0.5599091053009033},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5591438412666321},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.48975658416748047},{"id":"https://openalex.org/keywords/energy-consumption","display_name":"Energy consumption","score":0.47502002120018005},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4697202742099762},{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.4415312111377716},{"id":"https://openalex.org/keywords/critical-path-method","display_name":"Critical path method","score":0.4262462556362152},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4259379506111145},{"id":"https://openalex.org/keywords/latency","display_name":"Latency (audio)","score":0.42144834995269775},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3928685486316681},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3829314410686493},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.2467532753944397},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.13242453336715698},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09621730446815491}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7511003017425537},{"id":"https://openalex.org/C2776047111","wikidata":"https://www.wikidata.org/wiki/Q632037","display_name":"Dynamic voltage scaling","level":3,"score":0.5599091053009033},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5591438412666321},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.48975658416748047},{"id":"https://openalex.org/C2780165032","wikidata":"https://www.wikidata.org/wiki/Q16869822","display_name":"Energy consumption","level":2,"score":0.47502002120018005},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4697202742099762},{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.4415312111377716},{"id":"https://openalex.org/C115874739","wikidata":"https://www.wikidata.org/wiki/Q825377","display_name":"Critical path method","level":2,"score":0.4262462556362152},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4259379506111145},{"id":"https://openalex.org/C82876162","wikidata":"https://www.wikidata.org/wiki/Q17096504","display_name":"Latency (audio)","level":2,"score":0.42144834995269775},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3928685486316681},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3829314410686493},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2467532753944397},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.13242453336715698},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09621730446815491},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1698759.1698767","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1698759.1698767","pdf_url":null,"source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.9100000262260437,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1867033220","https://openalex.org/W2039577315","https://openalex.org/W2056796532","https://openalex.org/W2060406996","https://openalex.org/W2061566868","https://openalex.org/W2069217703","https://openalex.org/W2086447087","https://openalex.org/W2098750459","https://openalex.org/W2102587899","https://openalex.org/W2162212766","https://openalex.org/W2178304595","https://openalex.org/W2527193322"],"related_works":["https://openalex.org/W2783525109","https://openalex.org/W39373273","https://openalex.org/W4230846245","https://openalex.org/W2763646728","https://openalex.org/W2793507197","https://openalex.org/W4206433830","https://openalex.org/W4300456897","https://openalex.org/W2611474147","https://openalex.org/W4362681893","https://openalex.org/W3011443213"],"abstract_inverted_index":{"For":[0],"Dynamic":[1],"Voltage":[2],"Scaling":[3],"(DVS),":[4],"we":[5],"propose":[6],"a":[7,126],"novel":[8],"design":[9],"methodology.":[10],"This":[11],"methodology":[12,123,136,183],"is":[13,149],"composed":[14],"of":[15,54,106],"an":[16,55],"error":[17,40,61],"detection":[18],"circuit":[19],"and":[20,27,160,173],"three":[21],"technologies":[22],"to":[23,144,151,154,171,176,205],"reduce":[24],"the":[25,32,36,51,59,65,74,94,103,107,112,118,122,138,155,177,187,196,201],"area":[26,159],"power":[28,161],"penalties":[29,162],"which":[30,111],"are":[31,169],"large":[33],"issues":[34],"for":[35,58,163],"conventional":[37,156,178],"DVS":[38],"with":[39,184,195],"detection.":[41],"The":[42,134,146,158,181],"proposed":[43,135,182],"circuit,":[44],"Phase-Adjustable":[45],"Error":[46],"Detection":[47],"Flip-Flip":[48],"(PEDFF),":[49],"adjusts":[50],"clock":[52],"phase":[53],"additional":[56],"FF":[57],"timing":[60,66,87,95],"detection,":[62],"based":[63,92],"on":[64,93,166,192],"slack.":[67,96],"2-Stage":[68],"Hold-Driven":[69],"Optimization":[70],"(2-SHDO)":[71],"technology":[72,84,101],"splits":[73],"hold-driven":[75],"optimization":[76],"in":[77,129],"two":[78],"stages.":[79],"Slack-Based":[80],"Grouping":[81],"Scheme":[82],"(SBGS)":[83],"divides":[85],"each":[86],"path":[88,108],"into":[89],"appropriate":[90],"groups":[91],"Slack":[97],"Distribution":[98],"Control":[99],"(SDC)":[100],"improves":[102],"sharp":[104,197],"distribution":[105,199],"delay":[109,164],"at":[110],"logic":[113,202],"synthesis":[114,203],"tool":[115],"has":[116],"relaxed":[117],"delay.":[119],"We":[120],"evaluate":[121],"by":[124,141,190,200],"simulating":[125],"32-bit":[127],"microprocessor":[128],"90":[130],"nm":[131],"CMOS":[132],"technology.":[133],"reduces":[137,186],"energy":[139,188],"consumption":[140,189],"19.8%":[142],"compared":[143,153,175,204],"non-DVS.":[145,206],"OR-tree's":[147],"latency":[148],"shortened":[150],"16.3%":[152],"DVS.":[157],"buffers":[165],"short":[167],"paths":[168],"reduced":[170],"35.0%":[172],"40.6%":[174],"DVS,":[179],"respectively.":[180],"SDC":[185],"17.0%":[191],"another":[193],"example":[194],"slack":[198]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}