{"id":"https://openalex.org/W2145206588","doi":"https://doi.org/10.1145/1687399.1687516","title":"Yield estimation of SRAM circuits using \"Virtual SRAM Fab\"","display_name":"Yield estimation of SRAM circuits using \"Virtual SRAM Fab\"","publication_year":2009,"publication_date":"2009-11-02","ids":{"openalex":"https://openalex.org/W2145206588","doi":"https://doi.org/10.1145/1687399.1687516","mag":"2145206588"},"language":"en","primary_location":{"id":"doi:10.1145/1687399.1687516","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1687399.1687516","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2009 International Conference on Computer-Aided Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015267141","display_name":"Aditya Bansal","orcid":"https://orcid.org/0000-0002-2952-2385"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Aditya Bansal","raw_affiliation_strings":["IBM T. J. Watson Research, Yorktown Heights, NY","IBM T.J. Watson Research, Yorktown Heights NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM T. J. Watson Research, Yorktown Heights, NY","institution_ids":[]},{"raw_affiliation_string":"IBM T.J. Watson Research, Yorktown Heights NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049448736","display_name":"Rama N. Singh","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rama N. Singh","raw_affiliation_strings":["IBM T. J. Watson Research, Yorktown Heights, NY","IBM T.J. Watson Research, Yorktown Heights NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM T. J. Watson Research, Yorktown Heights, NY","institution_ids":[]},{"raw_affiliation_string":"IBM T.J. Watson Research, Yorktown Heights NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071376756","display_name":"Rouwaida Kanj","orcid":"https://orcid.org/0000-0002-3519-2917"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210156936","display_name":"IBM Research - Austin","ror":"https://ror.org/05gjbbg60","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210156936"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rouwaida N. Kanj","raw_affiliation_strings":["IBM Austin Research, Austin, TX","IBM Austin Res., Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"IBM Austin Research, Austin, TX","institution_ids":["https://openalex.org/I4210156936"]},{"raw_affiliation_string":"IBM Austin Res., Austin, TX, USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009591041","display_name":"Saibal Mukhopadhyay","orcid":"https://orcid.org/0000-0002-8894-3390"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Saibal Mukhopadhyay","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA","Georgia Institute of Technology Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Georgia Institute of Technology Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036928826","display_name":"Jin-Fuw Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jin-Fuw Lee","raw_affiliation_strings":["IBM T. J. Watson Research, Yorktown Heights, NY","IBM T.J. Watson Research, Yorktown Heights NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM T. J. Watson Research, Yorktown Heights, NY","institution_ids":[]},{"raw_affiliation_string":"IBM T.J. Watson Research, Yorktown Heights NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078632672","display_name":"Erdem Acar","orcid":"https://orcid.org/0000-0002-3661-5563"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Emrah Acar","raw_affiliation_strings":["IBM T. J. Watson Research, Yorktown Heights, NY","IBM T.J. Watson Research, Yorktown Heights NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM T. J. Watson Research, Yorktown Heights, NY","institution_ids":[]},{"raw_affiliation_string":"IBM T.J. Watson Research, Yorktown Heights NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016911500","display_name":"Amith Singhee","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Amith Singhee","raw_affiliation_strings":["IBM T. J. Watson Research, Yorktown Heights, NY","IBM T.J. Watson Research, Yorktown Heights NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM T. J. Watson Research, Yorktown Heights, NY","institution_ids":[]},{"raw_affiliation_string":"IBM T.J. Watson Research, Yorktown Heights NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102853887","display_name":"Keunwoo Kim","orcid":"https://orcid.org/0000-0003-1083-0385"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Keunwoo Kim","raw_affiliation_strings":["IBM T. J. Watson Research, Yorktown Heights, NY","IBM T.J. Watson Research, Yorktown Heights NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM T. J. Watson Research, Yorktown Heights, NY","institution_ids":[]},{"raw_affiliation_string":"IBM T.J. Watson Research, Yorktown Heights NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039359237","display_name":"Ching-Te Chuang","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ching-Te Chuang","raw_affiliation_strings":["National Chiao Tung University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046886936","display_name":"Sani Nassif","orcid":"https://orcid.org/0000-0002-5096-4794"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210156936","display_name":"IBM Research - Austin","ror":"https://ror.org/05gjbbg60","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210156936"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sani Nassif","raw_affiliation_strings":["IBM Austin Research, Austin, TX","IBM Austin Res., Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"IBM Austin Research, Austin, TX","institution_ids":["https://openalex.org/I4210156936"]},{"raw_affiliation_string":"IBM Austin Res., Austin, TX, USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019266895","display_name":"Fook-Luen Heng","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fook-Luen Heng","raw_affiliation_strings":["IBM T. J. Watson Research, Yorktown Heights, NY","IBM T.J. Watson Research, Yorktown Heights NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM T. J. Watson Research, Yorktown Heights, NY","institution_ids":[]},{"raw_affiliation_string":"IBM T.J. Watson Research, Yorktown Heights NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053371036","display_name":"Koushik Das","orcid":"https://orcid.org/0000-0002-1534-5453"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Koushik K. Das","raw_affiliation_strings":["IBM T. J. Watson Research, Yorktown Heights, NY","IBM T.J. Watson Research, Yorktown Heights NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM T. J. Watson Research, Yorktown Heights, NY","institution_ids":[]},{"raw_affiliation_string":"IBM T.J. Watson Research, Yorktown Heights NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":12,"corresponding_author_ids":["https://openalex.org/A5015267141"],"corresponding_institution_ids":["https://openalex.org/I4210114115"],"apc_list":null,"apc_paid":null,"fwci":1.8289,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.86557954,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"631","last_page":"636"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.9448557496070862},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5485187768936157},{"id":"https://openalex.org/keywords/schematic","display_name":"Schematic","score":0.5251196026802063},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5180156826972961},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.4851022958755493},{"id":"https://openalex.org/keywords/bottleneck","display_name":"Bottleneck","score":0.475318968296051},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.41561904549598694},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.31512993574142456},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.30167657136917114}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.9448557496070862},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5485187768936157},{"id":"https://openalex.org/C192328126","wikidata":"https://www.wikidata.org/wiki/Q4514647","display_name":"Schematic","level":2,"score":0.5251196026802063},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5180156826972961},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.4851022958755493},{"id":"https://openalex.org/C2780513914","wikidata":"https://www.wikidata.org/wiki/Q18210350","display_name":"Bottleneck","level":2,"score":0.475318968296051},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.41561904549598694},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31512993574142456},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.30167657136917114},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1687399.1687516","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1687399.1687516","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2009 International Conference on Computer-Aided Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.41999998688697815}],"awards":[{"id":"https://openalex.org/G66430973","display_name":null,"funder_award_id":"HR0011-07-9-0002","funder_id":"https://openalex.org/F4320332180","funder_display_name":"Defense Advanced Research Projects Agency"}],"funders":[{"id":"https://openalex.org/F4320332180","display_name":"Defense Advanced Research Projects Agency","ror":"https://ror.org/02caytj08"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1661368752","https://openalex.org/W1753784006","https://openalex.org/W1968234261","https://openalex.org/W1971511429","https://openalex.org/W1980367469","https://openalex.org/W1989891105","https://openalex.org/W2022948052","https://openalex.org/W2027956094","https://openalex.org/W2034270777","https://openalex.org/W2059193309","https://openalex.org/W2069295881","https://openalex.org/W2070059738","https://openalex.org/W2074553198","https://openalex.org/W2077426284","https://openalex.org/W2095778540","https://openalex.org/W2099911327","https://openalex.org/W2120353978","https://openalex.org/W2120442423","https://openalex.org/W2132621842","https://openalex.org/W2138061487","https://openalex.org/W2171772698","https://openalex.org/W2172117646","https://openalex.org/W6680573651","https://openalex.org/W6685177000"],"related_works":["https://openalex.org/W3154683910","https://openalex.org/W1846734616","https://openalex.org/W2595172197","https://openalex.org/W2359532622","https://openalex.org/W3134543635","https://openalex.org/W2084856301","https://openalex.org/W2921318524","https://openalex.org/W2127970246","https://openalex.org/W2885125400","https://openalex.org/W2169675423"],"abstract_inverted_index":{"Static":[0],"Random":[1],"Access":[2],"Memories":[3],"(SRAMs)":[4],"are":[5,110],"key":[6],"components":[7],"of":[8,107,143,149],"modern":[9],"VLSI":[10],"designs":[11],"and":[12,50,68,78,92,99,105],"a":[13,57,118,158],"major":[14],"bottleneck":[15],"to":[16,29,61,135],"technology":[17,101,166],"scaling":[18],"as":[19,41,62],"they":[20],"use":[21],"the":[22,35,44,47,51,108,141],"smallest":[23],"size":[24],"devices":[25],"with":[26],"high":[27],"sensitivity":[28],"manufacturing":[30,73],"details.":[31],"Analysis":[32],"performed":[33],"at":[34],"\"schematic\"":[36],"level":[37],"can":[38],"be":[39],"deceiving":[40],"it":[42],"ignores":[43],"interdependence":[45],"between":[46],"implementation":[48,163],"layout":[49],"resulting":[52],"electrical":[53,79],"performance.":[54],"We":[55,138],"present":[56],"computational":[58],"framework,":[59],"referred":[60],"\"Virtual":[63],"SRAM":[64,71,87,115,145,162],"Fab\",":[65],"for":[66,86,96,126,147,161],"analyzing":[67],"estimating":[69],"pre-Si":[70],"array":[72],"yield":[74],"considering":[75],"both":[76,97],"lithographic":[77],"variations.":[80,137],"The":[81,103],"framework":[82,109],"is":[83,157],"being":[84,94],"demonstrated":[85],"design/optimization":[88],"in":[89,117,152,164],"45nm":[90,119],"nodes":[91],"currently":[93],"used":[95],"32nm":[98],"22nm":[100],"nodes.":[102,167],"application":[104,142],"merit":[106],"illustrated":[111],"using":[112],"two":[113],"different":[114,131],"cells":[116],"PD/SOI":[120],"technology,":[121],"which":[122,156],"have":[123],"been":[124],"designed":[125],"similar":[127],"stability/performance,":[128],"but":[129],"exhibit":[130],"parametric":[132],"yields":[133],"due":[134],"layout/lithographic":[136],"also":[139],"demonstrate":[140],"Virtual":[144],"Fab":[146],"prediction":[148],"layout-induced":[150],"imbalance":[151],"an":[153],"8T":[154],"cell,":[155],"popular":[159],"candidate":[160],"32-22nm":[165]},"counts_by_year":[{"year":2016,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}