{"id":"https://openalex.org/W1974429638","doi":"https://doi.org/10.1145/1687399.1687428","title":"On soft error rate analysis of scaled CMOS designs","display_name":"On soft error rate analysis of scaled CMOS designs","publication_year":2009,"publication_date":"2009-11-02","ids":{"openalex":"https://openalex.org/W1974429638","doi":"https://doi.org/10.1145/1687399.1687428","mag":"1974429638"},"language":"en","primary_location":{"id":"doi:10.1145/1687399.1687428","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1687399.1687428","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2009 International Conference on Computer-Aided Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102316952","display_name":"Huan-Kai Peng","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Huan-Kai Peng","raw_affiliation_strings":["Nat'l Chiao Tung University, Hsinchu, Taiwan","Dept. of Electrical and Computer Engineering, Nat'l Chiao Tung University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Nat'l Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, Nat'l Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100682308","display_name":"Charles H.\u2010P. Wen","orcid":"https://orcid.org/0000-0003-4623-9941"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Charles H.-P. Wen","raw_affiliation_strings":["Nat'l Chiao Tung University, Hsinchu, Taiwan","Dept. of Electrical and Computer Engineering, Nat'l Chiao Tung University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Nat'l Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, Nat'l Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108510816","display_name":"Jayanta Bhadra","orcid":null},"institutions":[{"id":"https://openalex.org/I100625452","display_name":"ON Semiconductor (United States)","ror":"https://ror.org/03nw6pt28","country_code":"US","type":"company","lineage":["https://openalex.org/I100625452"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jayanta Bhadra","raw_affiliation_strings":["Freescale Semiconductor, Inc., Austin, TX","Freescale Semicond. Inc., Austin, TX#TAB#"],"affiliations":[{"raw_affiliation_string":"Freescale Semiconductor, Inc., Austin, TX","institution_ids":[]},{"raw_affiliation_string":"Freescale Semicond. Inc., Austin, TX#TAB#","institution_ids":["https://openalex.org/I100625452"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5102316952"],"corresponding_institution_ids":["https://openalex.org/I148366613"],"apc_list":null,"apc_paid":null,"fwci":2.6582111,"has_fulltext":false,"cited_by_count":26,"citation_normalized_percentile":{"value":0.90954974,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"157","last_page":"163"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.9001830816268921},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6849873661994934},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.6725841760635376},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.6206015944480896},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5561220645904541},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5070853233337402},{"id":"https://openalex.org/keywords/variation","display_name":"Variation (astronomy)","score":0.4919898211956024},{"id":"https://openalex.org/keywords/statistical-analysis","display_name":"Statistical analysis","score":0.4633515477180481},{"id":"https://openalex.org/keywords/basis","display_name":"Basis (linear algebra)","score":0.46179768443107605},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.46105730533599854},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4558308720588684},{"id":"https://openalex.org/keywords/word-error-rate","display_name":"Word error rate","score":0.44881290197372437},{"id":"https://openalex.org/keywords/statistical-model","display_name":"Statistical model","score":0.42159461975097656},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.32438796758651733},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.30917322635650635},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.21066054701805115},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.17135727405548096},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.15568023920059204},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14963677525520325}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.9001830816268921},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6849873661994934},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6725841760635376},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.6206015944480896},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5561220645904541},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5070853233337402},{"id":"https://openalex.org/C2778334786","wikidata":"https://www.wikidata.org/wiki/Q1586270","display_name":"Variation (astronomy)","level":2,"score":0.4919898211956024},{"id":"https://openalex.org/C2986587452","wikidata":"https://www.wikidata.org/wiki/Q938438","display_name":"Statistical analysis","level":2,"score":0.4633515477180481},{"id":"https://openalex.org/C12426560","wikidata":"https://www.wikidata.org/wiki/Q189569","display_name":"Basis (linear algebra)","level":2,"score":0.46179768443107605},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.46105730533599854},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4558308720588684},{"id":"https://openalex.org/C40969351","wikidata":"https://www.wikidata.org/wiki/Q3516228","display_name":"Word error rate","level":2,"score":0.44881290197372437},{"id":"https://openalex.org/C114289077","wikidata":"https://www.wikidata.org/wiki/Q3284399","display_name":"Statistical model","level":2,"score":0.42159461975097656},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.32438796758651733},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.30917322635650635},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.21066054701805115},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.17135727405548096},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.15568023920059204},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14963677525520325},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C44870925","wikidata":"https://www.wikidata.org/wiki/Q37547","display_name":"Astrophysics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1687399.1687428","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1687399.1687428","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2009 International Conference on Computer-Aided Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1563088657","https://openalex.org/W1888427026","https://openalex.org/W1964357740","https://openalex.org/W2010966375","https://openalex.org/W2014248343","https://openalex.org/W2033443176","https://openalex.org/W2070779353","https://openalex.org/W2097385122","https://openalex.org/W2100219166","https://openalex.org/W2111465388","https://openalex.org/W2116059696","https://openalex.org/W2117648153","https://openalex.org/W2120094593","https://openalex.org/W2125843760","https://openalex.org/W2140388451","https://openalex.org/W2140654092","https://openalex.org/W2141068710","https://openalex.org/W2149041233","https://openalex.org/W2153534591","https://openalex.org/W2156909104","https://openalex.org/W2157762234","https://openalex.org/W2161468429","https://openalex.org/W2162318113","https://openalex.org/W2162465831","https://openalex.org/W2169213530","https://openalex.org/W2170039577","https://openalex.org/W2213956287","https://openalex.org/W2492294785","https://openalex.org/W4237768137","https://openalex.org/W4285719527","https://openalex.org/W4290864872"],"related_works":["https://openalex.org/W2090025763","https://openalex.org/W2535854306","https://openalex.org/W1996241861","https://openalex.org/W2166056129","https://openalex.org/W3179888111","https://openalex.org/W3141764359","https://openalex.org/W2170534122","https://openalex.org/W2041054332","https://openalex.org/W1927459197","https://openalex.org/W2554735846"],"abstract_inverted_index":{"This":[0],"paper":[1],"re-examines":[2],"the":[3,16,39,46,77,86,96],"soft":[4,69],"error":[5,70],"effect":[6],"caused":[7],"by":[8],"cosmic":[9],"radiation":[10],"in":[11],"sub":[12],"90nm":[13],"technologies.":[14],"Considering":[15],"impact":[17],"of":[18,23,26,48,79],"process":[19],"variation,":[20],"a":[21],"number":[22],"statistical":[24,41,65],"natures":[25,50],"transient":[27,61],"faults":[28],"are":[29],"found":[30],"more":[31],"sophisticated":[32],"than":[33],"their":[34],"static":[35,97],"ones.":[36],"We":[37],"apply":[38],"state-of-the-art":[40],"learning":[42],"algorithm":[43],"to":[44,95],"tackle":[45],"complexity":[47],"these":[49,80],"and":[51,57],"build":[52],"compact":[53],"yet":[54],"accurate":[55],"generation":[56],"propagation":[58],"models":[59],"for":[60,68],"fault":[62],"distributions.":[63],"A":[64],"analysis":[66],"framework":[67,88],"rate":[71],"(SER)":[72],"is":[73],"also":[74],"proposed":[75,87],"on":[76],"basis":[78],"models.":[81],"Experimental":[82],"results":[83],"show":[84],"that":[85],"can":[89],"obtain":[90],"improved":[91],"SER":[92],"estimation":[93],"compared":[94],"approaches.":[98]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}