{"id":"https://openalex.org/W2113613740","doi":"https://doi.org/10.1145/1629911.1630041","title":"SRAM parametric failure analysis","display_name":"SRAM parametric failure analysis","publication_year":2009,"publication_date":"2009-07-26","ids":{"openalex":"https://openalex.org/W2113613740","doi":"https://doi.org/10.1145/1629911.1630041","mag":"2113613740"},"language":"en","primary_location":{"id":"doi:10.1145/1629911.1630041","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1629911.1630041","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 46th Annual Design Automation Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100370330","display_name":"Jian Wang","orcid":"https://orcid.org/0000-0001-5266-3808"},"institutions":[{"id":"https://openalex.org/I65376102","display_name":"PDF Solutions (United States)","ror":"https://ror.org/007737841","country_code":"US","type":"company","lineage":["https://openalex.org/I65376102"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Jian Wang","raw_affiliation_strings":["PDF Solutions, Inc., San Jose, CA","PDF Solutions Inc., San Jose, CA 95110, USA"],"affiliations":[{"raw_affiliation_string":"PDF Solutions, Inc., San Jose, CA","institution_ids":[]},{"raw_affiliation_string":"PDF Solutions Inc., San Jose, CA 95110, USA","institution_ids":["https://openalex.org/I65376102"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055160439","display_name":"Soner Yaldiz","orcid":"https://orcid.org/0000-0002-0715-0859"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Soner Yaldiz","raw_affiliation_strings":["Carnegie Mellon University, Pittsburgh, PA","Dept. of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA 15213, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"Carnegie Mellon University, Pittsburgh, PA","institution_ids":["https://openalex.org/I74973139"]},{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA 15213, USA#TAB#","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100353869","display_name":"Xin Li","orcid":"https://orcid.org/0000-0002-4510-2436"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xin Li","raw_affiliation_strings":["Carnegie Mellon University, Pittsburgh, PA","Dept. of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA 15213, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"Carnegie Mellon University, Pittsburgh, PA","institution_ids":["https://openalex.org/I74973139"]},{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA 15213, USA#TAB#","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004024474","display_name":"Lawrence T. Pileggi","orcid":null},"institutions":[{"id":"https://openalex.org/I65376102","display_name":"PDF Solutions (United States)","ror":"https://ror.org/007737841","country_code":"US","type":"company","lineage":["https://openalex.org/I65376102"]},{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lawrence T. Pileggi","raw_affiliation_strings":["Carnegie Mellon University, Pittsburgh, PA","PDF Solutions Inc., San Jose, CA 95110, USA"],"affiliations":[{"raw_affiliation_string":"Carnegie Mellon University, Pittsburgh, PA","institution_ids":["https://openalex.org/I74973139"]},{"raw_affiliation_string":"PDF Solutions Inc., San Jose, CA 95110, USA","institution_ids":["https://openalex.org/I65376102"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100370330"],"corresponding_institution_ids":["https://openalex.org/I65376102"],"apc_list":null,"apc_paid":null,"fwci":5.7914,"has_fulltext":false,"cited_by_count":44,"citation_normalized_percentile":{"value":0.96313981,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"496","last_page":"501"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8356122374534607},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.7225748300552368},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6161777973175049},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.597183108329773},{"id":"https://openalex.org/keywords/piecewise","display_name":"Piecewise","score":0.5328832864761353},{"id":"https://openalex.org/keywords/importance-sampling","display_name":"Importance sampling","score":0.42658984661102295},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3992723822593689},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3609302043914795},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22346246242523193},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.21039089560508728},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1954950988292694}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8356122374534607},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.7225748300552368},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6161777973175049},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.597183108329773},{"id":"https://openalex.org/C164660894","wikidata":"https://www.wikidata.org/wiki/Q2037833","display_name":"Piecewise","level":2,"score":0.5328832864761353},{"id":"https://openalex.org/C52740198","wikidata":"https://www.wikidata.org/wiki/Q1539564","display_name":"Importance sampling","level":3,"score":0.42658984661102295},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3992723822593689},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3609302043914795},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22346246242523193},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.21039089560508728},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1954950988292694},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1145/1629911.1630041","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1629911.1630041","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 46th Annual Design Automation Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.156.7334","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.156.7334","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.ece.cmu.edu/~xinli/papers/2009_DAC_sram.pdf","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.989.2645","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.989.2645","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"https://www.researchgate.net/profile/Soner_Yaldiz/publication/221060851_SRAM_parametric_failure_analysis/links/0a85e533599b02ba78000000.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G6354575765","display_name":null,"funder_award_id":"CCF-0702278","funder_id":"https://openalex.org/F4320337387","funder_display_name":"Division of Computing and Communication Foundations"}],"funders":[{"id":"https://openalex.org/F4320306084","display_name":"U.S. Department of Energy","ror":"https://ror.org/01bj3aw27"},{"id":"https://openalex.org/F4320337387","display_name":"Division of Computing and Communication Foundations","ror":"https://ror.org/01mng8331"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W63802623","https://openalex.org/W1505220924","https://openalex.org/W1975331880","https://openalex.org/W2002612140","https://openalex.org/W2098660878","https://openalex.org/W2101003251","https://openalex.org/W2103793078","https://openalex.org/W2120353978","https://openalex.org/W2132621842","https://openalex.org/W2142718365","https://openalex.org/W2142734833","https://openalex.org/W2151356034","https://openalex.org/W2154477062","https://openalex.org/W2157024459","https://openalex.org/W2168101540","https://openalex.org/W2172203429","https://openalex.org/W2296319761","https://openalex.org/W3103339143","https://openalex.org/W3151457670","https://openalex.org/W4250589301"],"related_works":["https://openalex.org/W4392590355","https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W2109451123","https://openalex.org/W4378977321","https://openalex.org/W1976168335","https://openalex.org/W4308090481","https://openalex.org/W2169675423"],"abstract_inverted_index":{"With":[0],"aggressive":[1],"technology":[2],"scaling,":[3],"SRAM":[4,36,82,102],"design":[5],"has":[6],"been":[7],"seriously":[8],"challenged":[9],"by":[10,86],"the":[11,48,52,71,88,92,101],"difficulties":[12],"in":[13],"analyzing":[14],"rare":[15],"failure":[16,72,103],"events.":[17],"In":[18],"this":[19],"paper":[20],"we":[21,97],"propose":[22],"to":[23,31,46],"create":[24],"statistical":[25],"performance":[26,49],"models":[27],"with":[28],"accuracy":[29],"sufficient":[30],"facilitate":[32],"probability":[33,73,94],"extraction":[34,74,95],"for":[35,70],"parametric":[37],"failures.":[38],"A":[39,56],"piecewise":[40,89],"modeling":[41],"technique":[42],"is":[43],"first":[44],"proposed":[45],"capture":[47],"metrics":[50],"over":[51],"large":[53],"variation":[54],"space.":[55],"controlled":[57],"sampling":[58],"scheme":[59],"and":[60,77,91],"a":[61],"nested":[62],"Monte":[63],"Carlo":[64],"analysis":[65],"method":[66],"are":[67],"then":[68],"applied":[69],"at":[75],"cell-level":[76],"array-level":[78],"respectively.":[79],"Our":[80],"65nm":[81],"example":[83],"demonstrates":[84],"that":[85],"combining":[87],"model":[90],"fast":[93],"methods,":[96],"have":[98],"significantly":[99],"accelerated":[100],"analysis.":[104]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":8}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}