{"id":"https://openalex.org/W2167188929","doi":"https://doi.org/10.1145/1594233.1594309","title":"Enabling ultra low voltage system operation by tolerating on-chip cache failures","display_name":"Enabling ultra low voltage system operation by tolerating on-chip cache failures","publication_year":2009,"publication_date":"2009-08-19","ids":{"openalex":"https://openalex.org/W2167188929","doi":"https://doi.org/10.1145/1594233.1594309","mag":"2167188929"},"language":"en","primary_location":{"id":"doi:10.1145/1594233.1594309","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1594233.1594309","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2009 ACM/IEEE international symposium on Low power electronics and design","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049130587","display_name":"Amin Ansari","orcid":null},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Amin Ansari","raw_affiliation_strings":["University of Michigan, Ann Arbor, MI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110112858","display_name":"Shuguang Feng","orcid":null},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shuguang Feng","raw_affiliation_strings":["University of Michigan, Ann Arbor, MI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064330876","display_name":"Shantanu Gupta","orcid":"https://orcid.org/0000-0002-9931-1612"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shantanu Gupta","raw_affiliation_strings":["University of Michigan, Ann Arbor, MI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002075773","display_name":"Scott Mahlke","orcid":"https://orcid.org/0000-0002-0438-0616"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Scott Mahlke","raw_affiliation_strings":["University of Michigan, Ann Arbor, MI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I27837315"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"307","last_page":"310"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8141165971755981},{"id":"https://openalex.org/keywords/cache","display_name":"Cache","score":0.7432211637496948},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6158263683319092},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5452091097831726},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5267291069030762},{"id":"https://openalex.org/keywords/dynamic-voltage-scaling","display_name":"Dynamic voltage scaling","score":0.5239462852478027},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4805070161819458},{"id":"https://openalex.org/keywords/cpu-cache","display_name":"CPU cache","score":0.4580155909061432},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.43547362089157104},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.43174073100090027},{"id":"https://openalex.org/keywords/low-voltage","display_name":"Low voltage","score":0.4192882180213928},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.35917603969573975},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.34298276901245117},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.25820451974868774},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18746408820152283},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.1754418909549713},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.13912934064865112},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.0838954746723175}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8141165971755981},{"id":"https://openalex.org/C115537543","wikidata":"https://www.wikidata.org/wiki/Q165596","display_name":"Cache","level":2,"score":0.7432211637496948},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6158263683319092},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5452091097831726},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5267291069030762},{"id":"https://openalex.org/C2776047111","wikidata":"https://www.wikidata.org/wiki/Q632037","display_name":"Dynamic voltage scaling","level":3,"score":0.5239462852478027},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4805070161819458},{"id":"https://openalex.org/C189783530","wikidata":"https://www.wikidata.org/wiki/Q352090","display_name":"CPU cache","level":3,"score":0.4580155909061432},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.43547362089157104},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.43174073100090027},{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.4192882180213928},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35917603969573975},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.34298276901245117},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25820451974868774},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18746408820152283},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.1754418909549713},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.13912934064865112},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0838954746723175},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1145/1594233.1594309","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1594233.1594309","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2009 ACM/IEEE international symposium on Low power electronics and design","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.160.389","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.160.389","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://cccp.eecs.umich.edu/papers/ansari-islped09.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8700000047683716,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W2002038549","https://openalex.org/W2031948068","https://openalex.org/W2104225326","https://openalex.org/W2105524902","https://openalex.org/W2106507957","https://openalex.org/W2110999128","https://openalex.org/W2112085716","https://openalex.org/W2112776829","https://openalex.org/W2131054871","https://openalex.org/W2153456949","https://openalex.org/W2160428323","https://openalex.org/W2161197576","https://openalex.org/W2165126103","https://openalex.org/W2397682474","https://openalex.org/W4238002809"],"related_works":["https://openalex.org/W2144927208","https://openalex.org/W2310488720","https://openalex.org/W2310834573","https://openalex.org/W2186949690","https://openalex.org/W2167303720","https://openalex.org/W2154109900","https://openalex.org/W2497617944","https://openalex.org/W3019064768","https://openalex.org/W1563139915","https://openalex.org/W2109715593"],"abstract_inverted_index":{"Extreme":[0],"technology":[1],"integration":[2],"in":[3,12,86,116],"the":[4,40,87,95],"sub-micron":[5],"regime":[6],"comes":[7],"with":[8],"a":[9,25,55,66,99],"rapid":[10],"rise":[11],"heat":[13],"dissipation":[14],"and":[15,111],"power":[16,114],"density":[17],"for":[18],"modern":[19],"processors.":[20],"Dynamic":[21],"voltage":[22,44,90,97],"scaling":[23],"is":[24,36,45],"widely":[26],"used":[27],"technique":[28],"to":[29,104,108],"tackle":[30],"this":[31,62],"problem":[32],"when":[33,84],"high":[34],"performance":[35],"not":[37],"needed.":[38],"However,":[39],"minimum":[41],"achievable":[42],"supply":[43],"often":[46],"bounded":[47],"by":[48,72],"SRAM":[49,80],"cells":[50],"since":[51],"they":[52],"fail":[53],"at":[54],"faster":[56],"rate":[57],"than":[58],"logic":[59],"cells.":[60],"In":[61],"work,":[63],"we":[64],"propose":[65],"novel":[67],"fault-tolerant":[68],"cache":[69],"architecture,":[70],"that":[71,82],"reconfiguring":[73],"its":[74],"internal":[75],"organization":[76],"can":[77,101],"efficiently":[78],"tolerate":[79],"failures":[81],"arise":[83],"operating":[85],"ultra":[88],"low":[89],"region.":[91],"Using":[92],"our":[93],"approach,":[94],"operational":[96],"of":[98],"processor":[100],"be":[102],"reduced":[103],"420mV,":[105],"which":[106],"translates":[107],"80%":[109],"dynamic":[110],"73%":[112],"leakage":[113],"savings":[115],"90nm.":[117]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}