{"id":"https://openalex.org/W2122249806","doi":"https://doi.org/10.1145/1555349.1555372","title":"DRAM errors in the wild","display_name":"DRAM errors in the wild","publication_year":2009,"publication_date":"2009-06-15","ids":{"openalex":"https://openalex.org/W2122249806","doi":"https://doi.org/10.1145/1555349.1555372","mag":"2122249806"},"language":"en","primary_location":{"id":"doi:10.1145/1555349.1555372","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1555349.1555372","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the eleventh international joint conference on Measurement and modeling of computer systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040893798","display_name":"Bianca Schroeder","orcid":"https://orcid.org/0000-0003-3289-1824"},"institutions":[{"id":"https://openalex.org/I185261750","display_name":"University of Toronto","ror":"https://ror.org/03dbr7087","country_code":"CA","type":"education","lineage":["https://openalex.org/I185261750"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Bianca Schroeder","raw_affiliation_strings":["University of Toronto, Toronto, ON, Canada","University of Toronto, Toronto, On, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Toronto, Toronto, ON, Canada","institution_ids":["https://openalex.org/I185261750"]},{"raw_affiliation_string":"University of Toronto, Toronto, On, Canada","institution_ids":["https://openalex.org/I185261750"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018328248","display_name":"Eduardo Pinheiro","orcid":null},"institutions":[{"id":"https://openalex.org/I1291425158","display_name":"Google (United States)","ror":"https://ror.org/00njsd438","country_code":"US","type":"company","lineage":["https://openalex.org/I1291425158","https://openalex.org/I4210128969"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Eduardo Pinheiro","raw_affiliation_strings":["Google Inc., Mountain View, CA, USA","Google Inc., Mountain View, CA USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Google Inc., Mountain View, CA, USA","institution_ids":["https://openalex.org/I1291425158"]},{"raw_affiliation_string":"Google Inc., Mountain View, CA USA","institution_ids":["https://openalex.org/I1291425158"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109806863","display_name":"Wolf-Dietrich Weber","orcid":null},"institutions":[{"id":"https://openalex.org/I1291425158","display_name":"Google (United States)","ror":"https://ror.org/00njsd438","country_code":"US","type":"company","lineage":["https://openalex.org/I1291425158","https://openalex.org/I4210128969"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wolf-Dietrich Weber","raw_affiliation_strings":["Google Inc., Mountain View, CA, USA","Google Inc., Mountain View, CA USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Google Inc., Mountain View, CA, USA","institution_ids":["https://openalex.org/I1291425158"]},{"raw_affiliation_string":"Google Inc., Mountain View, CA USA","institution_ids":["https://openalex.org/I1291425158"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":42.7243,"has_fulltext":false,"cited_by_count":556,"citation_normalized_percentile":{"value":0.99905268,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":null,"issue":null,"first_page":"193","last_page":"204"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.9751352071762085},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6913036108016968},{"id":"https://openalex.org/keywords/server","display_name":"Server","score":0.6281229853630066},{"id":"https://openalex.org/keywords/dynamic-random-access-memory","display_name":"Dynamic random-access memory","score":0.599031925201416},{"id":"https://openalex.org/keywords/universal-memory","display_name":"Universal memory","score":0.5970419645309448},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5014564990997314},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.4643357992172241},{"id":"https://openalex.org/keywords/commodity","display_name":"Commodity","score":0.4581143260002136},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.43770545721054077},{"id":"https://openalex.org/keywords/cas-latency","display_name":"CAS latency","score":0.4214727580547333},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.3938366174697876},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.29193663597106934},{"id":"https://openalex.org/keywords/memory-management","display_name":"Memory management","score":0.2809341549873352},{"id":"https://openalex.org/keywords/memory-controller","display_name":"Memory controller","score":0.2562903165817261},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18661782145500183},{"id":"https://openalex.org/keywords/semiconductor-memory","display_name":"Semiconductor memory","score":0.16185185313224792},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.10901772975921631},{"id":"https://openalex.org/keywords/interleaved-memory","display_name":"Interleaved memory","score":0.08603554964065552}],"concepts":[{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.9751352071762085},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6913036108016968},{"id":"https://openalex.org/C93996380","wikidata":"https://www.wikidata.org/wiki/Q44127","display_name":"Server","level":2,"score":0.6281229853630066},{"id":"https://openalex.org/C118702147","wikidata":"https://www.wikidata.org/wiki/Q189396","display_name":"Dynamic random-access memory","level":3,"score":0.599031925201416},{"id":"https://openalex.org/C195053848","wikidata":"https://www.wikidata.org/wiki/Q7894141","display_name":"Universal memory","level":5,"score":0.5970419645309448},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5014564990997314},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.4643357992172241},{"id":"https://openalex.org/C2779439359","wikidata":"https://www.wikidata.org/wiki/Q317088","display_name":"Commodity","level":2,"score":0.4581143260002136},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.43770545721054077},{"id":"https://openalex.org/C189930140","wikidata":"https://www.wikidata.org/wiki/Q1112878","display_name":"CAS latency","level":4,"score":0.4214727580547333},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.3938366174697876},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.29193663597106934},{"id":"https://openalex.org/C176649486","wikidata":"https://www.wikidata.org/wiki/Q2308807","display_name":"Memory management","level":3,"score":0.2809341549873352},{"id":"https://openalex.org/C100800780","wikidata":"https://www.wikidata.org/wiki/Q1175867","display_name":"Memory controller","level":3,"score":0.2562903165817261},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18661782145500183},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.16185185313224792},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.10901772975921631},{"id":"https://openalex.org/C63511323","wikidata":"https://www.wikidata.org/wiki/Q908936","display_name":"Interleaved memory","level":4,"score":0.08603554964065552},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1555349.1555372","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1555349.1555372","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the eleventh international joint conference on Measurement and modeling of computer systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1558516248","https://openalex.org/W2021548867","https://openalex.org/W2023014860","https://openalex.org/W2023856022","https://openalex.org/W2025474944","https://openalex.org/W2074673023","https://openalex.org/W2102362134","https://openalex.org/W2116097016","https://openalex.org/W2117844544","https://openalex.org/W2118033476","https://openalex.org/W2119435553","https://openalex.org/W2119714163","https://openalex.org/W2127745296","https://openalex.org/W2140631135","https://openalex.org/W2140958850","https://openalex.org/W2142812297","https://openalex.org/W2152652532","https://openalex.org/W2153254331","https://openalex.org/W2159519391","https://openalex.org/W2161234420","https://openalex.org/W2170715115","https://openalex.org/W2624304035","https://openalex.org/W6669190525","https://openalex.org/W6678120442","https://openalex.org/W6680708607"],"related_works":["https://openalex.org/W2536264121","https://openalex.org/W1643962617","https://openalex.org/W2094308961","https://openalex.org/W2516517078","https://openalex.org/W4386903460","https://openalex.org/W2900372418","https://openalex.org/W2338545698","https://openalex.org/W4382618825","https://openalex.org/W2924367614","https://openalex.org/W2181692804"],"abstract_inverted_index":{"Errors":[0],"in":[1,14,22,40,51,64],"dynamic":[2],"random":[3],"access":[4],"memory":[5,62],"(DRAM)":[6],"are":[7,19],"a":[8,32,65,72],"common":[9],"form":[10],"of":[11,24,35,61,68,74,91],"hardware":[12,25],"failure":[13],"modern":[15],"compute":[16],"clusters.":[17,54],"Failures":[18],"costly":[20],"both":[21],"terms":[23],"replacement":[26],"costs":[27],"and":[28,85,87],"service":[29],"disruption.":[30],"While":[31],"large":[33,52,66],"body":[34],"work":[36],"exists":[37],"on":[38,47],"DRAM":[39,49,83],"laboratory":[41],"conditions,":[42],"little":[43],"has":[44],"been":[45],"reported":[46],"real":[48],"failures":[50],"production":[53],"In":[55],"this":[56],"paper,":[57],"we":[58],"analyze":[59],"measurements":[60],"errors":[63],"fleet":[67],"commodity":[69],"servers":[70],"over":[71],"period":[73],"2.5":[75],"years.":[76],"The":[77],"collected":[78],"data":[79],"covers":[80],"multiple":[81],"vendors,":[82],"capacities":[84],"technologies,":[86],"comprises":[88],"many":[89],"millions":[90],"DIMM":[92],"days.":[93]},"counts_by_year":[{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":17},{"year":2020,"cited_by_count":27},{"year":2019,"cited_by_count":42},{"year":2018,"cited_by_count":53},{"year":2017,"cited_by_count":47},{"year":2016,"cited_by_count":68},{"year":2015,"cited_by_count":48},{"year":2014,"cited_by_count":39},{"year":2013,"cited_by_count":51},{"year":2012,"cited_by_count":52}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}