{"id":"https://openalex.org/W2098097478","doi":"https://doi.org/10.1145/1531542.1531597","title":"Online circuit reliability monitoring","display_name":"Online circuit reliability monitoring","publication_year":2009,"publication_date":"2009-05-10","ids":{"openalex":"https://openalex.org/W2098097478","doi":"https://doi.org/10.1145/1531542.1531597","mag":"2098097478"},"language":"en","primary_location":{"id":"doi:10.1145/1531542.1531597","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1531542.1531597","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 19th ACM Great Lakes symposium on VLSI","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100392843","display_name":"Bin Zhang","orcid":"https://orcid.org/0000-0002-4879-0211"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Bin Zhang","raw_affiliation_strings":["University of Texas at Austin, Austin, TX, USA","University of Texas at Austin, Austin, TX USA"],"affiliations":[{"raw_affiliation_string":"University of Texas at Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]},{"raw_affiliation_string":"University of Texas at Austin, Austin, TX USA","institution_ids":["https://openalex.org/I86519309"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5100392843"],"corresponding_institution_ids":["https://openalex.org/I86519309"],"apc_list":null,"apc_paid":null,"fwci":0.8972,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.76889599,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"221","last_page":"226"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7688664197921753},{"id":"https://openalex.org/keywords/pmos-logic","display_name":"PMOS logic","score":0.6744687557220459},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6331427097320557},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6270352602005005},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.5802187323570251},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5614104270935059},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5213181376457214},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4824724495410919},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47855526208877563},{"id":"https://openalex.org/keywords/ring-oscillator","display_name":"Ring oscillator","score":0.46584948897361755},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.42056357860565186},{"id":"https://openalex.org/keywords/nmos-logic","display_name":"NMOS logic","score":0.42006468772888184},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.3055492043495178},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2834920883178711},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21217238903045654},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18465465307235718},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.17325857281684875}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7688664197921753},{"id":"https://openalex.org/C27050352","wikidata":"https://www.wikidata.org/wiki/Q173605","display_name":"PMOS logic","level":4,"score":0.6744687557220459},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6331427097320557},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6270352602005005},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.5802187323570251},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5614104270935059},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5213181376457214},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4824724495410919},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47855526208877563},{"id":"https://openalex.org/C104111718","wikidata":"https://www.wikidata.org/wiki/Q2153973","display_name":"Ring oscillator","level":3,"score":0.46584948897361755},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.42056357860565186},{"id":"https://openalex.org/C197162436","wikidata":"https://www.wikidata.org/wiki/Q83908","display_name":"NMOS logic","level":4,"score":0.42006468772888184},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.3055492043495178},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2834920883178711},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21217238903045654},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18465465307235718},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.17325857281684875},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1531542.1531597","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1531542.1531597","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 19th ACM Great Lakes symposium on VLSI","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1991891926","https://openalex.org/W2041598550","https://openalex.org/W2085289999","https://openalex.org/W2094477153","https://openalex.org/W2102729267","https://openalex.org/W2108726631","https://openalex.org/W2122507955","https://openalex.org/W2124563469","https://openalex.org/W2125169487","https://openalex.org/W2141565132","https://openalex.org/W2142908374","https://openalex.org/W2144651789","https://openalex.org/W2164178706","https://openalex.org/W2164529645","https://openalex.org/W2167678606","https://openalex.org/W4255276665"],"related_works":["https://openalex.org/W4386261925","https://openalex.org/W2048420745","https://openalex.org/W2082944690","https://openalex.org/W2730314563","https://openalex.org/W2745127909","https://openalex.org/W2058541779","https://openalex.org/W2537099411","https://openalex.org/W2122439617","https://openalex.org/W3104408177","https://openalex.org/W2947980285"],"abstract_inverted_index":{"In":[0],"this":[1],"work":[2,58],"we":[3],"propose":[4],"an":[5,60],"online":[6,85,128],"reliability":[7,25,75,142],"tracking":[8],"framework":[9],"that":[10],"utilizes":[11],"a":[12,23],"hybrid":[13],"network":[14],"of":[15,42,48,56,79,87,95,100,123],"on-chip":[16],"temperature":[17,66],"and":[18,46],"delay":[19,50,93],"sensors":[20],"together":[21],"with":[22,31],"circuit":[24,49,68,124],"macromodel.":[26,120],"We":[27],"are":[28,116],"concerned":[29],"specifically":[30],"NBTI-induced":[32],"transistor":[33],"aging,":[34],"which":[35,63],"manifests":[36],"itself":[37],"as":[38],"the":[39,80,92,119,140],"gradual":[40],"increase":[41,47],"PMOS":[43],"threshold":[44],"voltage":[45],"over":[51],"time.":[52],"The":[53,70,77,98,121],"key":[54],"feature":[55],"our":[57,127],"is":[59,82,103],"explicit":[61],"macromodel":[62,71],"maps":[64],"operating":[65],"to":[67,134,139],"degradation.":[69],"allows":[72],"for":[73,118],"cost-effective":[74],"tracking.":[76],"accuracy":[78],"model":[81,88,101],"improved":[83],"by":[84],"calibration":[86],"parameters":[89,102,115],"via":[90],"monitoring":[91,129],"degradation":[94,125],"ring":[96],"oscillators.":[97],"number":[99],"relatively":[104],"small.":[105],"For":[106],"example,":[107],"in":[108],"ISCAS'85":[109],"benchmark":[110],"circuits,":[111],"at":[112],"most":[113],"21":[114],"required":[117],"prediction":[122],"using":[126],"strategy":[130],"can":[131],"be":[132],"up":[133],"20%":[135],"less":[136],"conservative":[137],"compared":[138],"worst-case":[141],"prediction.":[143]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}