{"id":"https://openalex.org/W2169128559","doi":"https://doi.org/10.1145/1500774.1500776","title":"Firmware quality assurance","display_name":"Firmware quality assurance","publication_year":1982,"publication_date":"1982-01-01","ids":{"openalex":"https://openalex.org/W2169128559","doi":"https://doi.org/10.1145/1500774.1500776","mag":"2169128559"},"language":"en","primary_location":{"id":"doi:10.1145/1500774.1500776","is_oa":true,"landing_page_url":"https://doi.org/10.1145/1500774.1500776","pdf_url":"https://dl.acm.org/doi/pdf/10.1145/1500774.1500776","source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the June 7-10, 1982, national computer conference on - AFIPS '82","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://dl.acm.org/doi/pdf/10.1145/1500774.1500776","any_repository_has_fulltext":null},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084408251","display_name":"Helmut K. Berg","orcid":null},"institutions":[{"id":"https://openalex.org/I82514191","display_name":"Honeywell (United States)","ror":"https://ror.org/02t71h845","country_code":"US","type":"company","lineage":["https://openalex.org/I82514191"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Helmut K. Berg","raw_affiliation_strings":["Honeywell Corporate Computer Sciences Center, Bloomington, Minnesota"],"affiliations":[{"raw_affiliation_string":"Honeywell Corporate Computer Sciences Center, Bloomington, Minnesota","institution_ids":["https://openalex.org/I82514191"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003541191","display_name":"Prakash Rao","orcid":null},"institutions":[{"id":"https://openalex.org/I82514191","display_name":"Honeywell (United States)","ror":"https://ror.org/02t71h845","country_code":"US","type":"company","lineage":["https://openalex.org/I82514191"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Prakash Rao","raw_affiliation_strings":["Honeywell Corporate Computer Sciences Center, Bloomington, Minnesota"],"affiliations":[{"raw_affiliation_string":"Honeywell Corporate Computer Sciences Center, Bloomington, Minnesota","institution_ids":["https://openalex.org/I82514191"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066630271","display_name":"Bruce D. Shriver","orcid":null},"institutions":[{"id":"https://openalex.org/I8616870","display_name":"Southwestern University","ror":"https://ror.org/05gj63w50","country_code":"US","type":"education","lineage":["https://openalex.org/I8616870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bruce D. Shriver","raw_affiliation_strings":["University of Southwestern Louisiana, Lafayette, Louisiana"],"affiliations":[{"raw_affiliation_string":"University of Southwestern Louisiana, Lafayette, Louisiana","institution_ids":["https://openalex.org/I8616870"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5084408251"],"corresponding_institution_ids":["https://openalex.org/I82514191"],"apc_list":null,"apc_paid":null,"fwci":0.6702,"has_fulltext":true,"cited_by_count":3,"citation_normalized_percentile":{"value":0.76161202,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"3","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/firmware","display_name":"Firmware","score":0.9860626459121704},{"id":"https://openalex.org/keywords/correctness","display_name":"Correctness","score":0.8150267004966736},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7876383066177368},{"id":"https://openalex.org/keywords/mathematical-proof","display_name":"Mathematical proof","score":0.692151665687561},{"id":"https://openalex.org/keywords/microcode","display_name":"Microcode","score":0.635032594203949},{"id":"https://openalex.org/keywords/certification","display_name":"Certification","score":0.5206946134567261},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.47934088110923767},{"id":"https://openalex.org/keywords/quality-assurance","display_name":"Quality assurance","score":0.46036282181739807},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4488789737224579},{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.4429548680782318},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.416047602891922},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.4157960116863251},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.41355764865875244},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3812425434589386},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3136504888534546},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.299721360206604},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.2736166715621948},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.17875489592552185},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1416465938091278}],"concepts":[{"id":"https://openalex.org/C67212190","wikidata":"https://www.wikidata.org/wiki/Q104851","display_name":"Firmware","level":2,"score":0.9860626459121704},{"id":"https://openalex.org/C55439883","wikidata":"https://www.wikidata.org/wiki/Q360812","display_name":"Correctness","level":2,"score":0.8150267004966736},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7876383066177368},{"id":"https://openalex.org/C108710211","wikidata":"https://www.wikidata.org/wiki/Q11538","display_name":"Mathematical proof","level":2,"score":0.692151665687561},{"id":"https://openalex.org/C22174128","wikidata":"https://www.wikidata.org/wiki/Q175869","display_name":"Microcode","level":2,"score":0.635032594203949},{"id":"https://openalex.org/C46304622","wikidata":"https://www.wikidata.org/wiki/Q374814","display_name":"Certification","level":2,"score":0.5206946134567261},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.47934088110923767},{"id":"https://openalex.org/C106436119","wikidata":"https://www.wikidata.org/wiki/Q836575","display_name":"Quality assurance","level":3,"score":0.46036282181739807},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4488789737224579},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.4429548680782318},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.416047602891922},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.4157960116863251},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.41355764865875244},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3812425434589386},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3136504888534546},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.299721360206604},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.2736166715621948},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.17875489592552185},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1416465938091278},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C2778618615","wikidata":"https://www.wikidata.org/wiki/Q4008393","display_name":"External quality assessment","level":2,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1500774.1500776","is_oa":true,"landing_page_url":"https://doi.org/10.1145/1500774.1500776","pdf_url":"https://dl.acm.org/doi/pdf/10.1145/1500774.1500776","source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the June 7-10, 1982, national computer conference on - AFIPS '82","raw_type":"proceedings-article"}],"best_oa_location":{"id":"doi:10.1145/1500774.1500776","is_oa":true,"landing_page_url":"https://doi.org/10.1145/1500774.1500776","pdf_url":"https://dl.acm.org/doi/pdf/10.1145/1500774.1500776","source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the June 7-10, 1982, national computer conference on - AFIPS '82","raw_type":"proceedings-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.5199999809265137}],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2169128559.pdf","grobid_xml":"https://content.openalex.org/works/W2169128559.grobid-xml"},"referenced_works_count":41,"referenced_works":["https://openalex.org/W34304939","https://openalex.org/W581245379","https://openalex.org/W1572071383","https://openalex.org/W1586986912","https://openalex.org/W1601642859","https://openalex.org/W1773837414","https://openalex.org/W1823755974","https://openalex.org/W1975857166","https://openalex.org/W1981248732","https://openalex.org/W1998178066","https://openalex.org/W2001366563","https://openalex.org/W2001862172","https://openalex.org/W2005973420","https://openalex.org/W2010706556","https://openalex.org/W2031480854","https://openalex.org/W2034476614","https://openalex.org/W2034713085","https://openalex.org/W2052815272","https://openalex.org/W2059325406","https://openalex.org/W2079845587","https://openalex.org/W2095284861","https://openalex.org/W2103568744","https://openalex.org/W2118653063","https://openalex.org/W2122439715","https://openalex.org/W2129713212","https://openalex.org/W2132840411","https://openalex.org/W2162844904","https://openalex.org/W2987732270","https://openalex.org/W2987907651","https://openalex.org/W3146075203","https://openalex.org/W4231791389","https://openalex.org/W4246347036","https://openalex.org/W6634292091","https://openalex.org/W6644433918","https://openalex.org/W6650724417","https://openalex.org/W6659125967","https://openalex.org/W6676680617","https://openalex.org/W6677342176","https://openalex.org/W6678635505","https://openalex.org/W6679799613","https://openalex.org/W7062222018"],"related_works":["https://openalex.org/W1966431236","https://openalex.org/W608147619","https://openalex.org/W1984676852","https://openalex.org/W2026551898","https://openalex.org/W4252104358","https://openalex.org/W2062160093","https://openalex.org/W2025981307","https://openalex.org/W1998626163","https://openalex.org/W2056006243","https://openalex.org/W2039978824"],"abstract_inverted_index":{"The":[0,46,85,107],"paper":[1,50],"reviews":[2],"problems,":[3],"solutions,":[4],"and":[5,43,58,64,73,89,99,124,155,157],"trends":[6,90],"in":[7,91,117],"the":[8,21,24,49,59,97,118,135,144],"area":[9],"of":[10,23,48,62,87,120,137,146,153],"firmware":[11,28,56,102,121,125,154],"quality":[12,15,103],"assurance.":[13],"Firmware":[14,68],"assurance":[16,104],"is":[17,51,105,109,150],"considered":[18],"to":[19,35,82,132],"be":[20],"certification":[22],"fact":[25],"that":[26,111,141],"a":[27],"system":[29],"meets":[30],"its":[31],"requirements":[32],"with":[33,134],"respect":[34],"functional":[36],"correctness":[37,54,122],"as":[38,40,79],"well":[39],"performance,":[41],"operational,":[42],"implementational":[44],"properties.":[45],"emphasis":[47],"on":[52,96],"formal":[53],"proofs,":[55],"testing,":[57],"automatic":[60],"synthesis":[61,152],"microcode":[63],"associated":[65],"hardware":[66,156],"structures.":[67],"specifications,":[69],"high-level":[70],"microprogramming":[71],"languages,":[72],"automated":[74,151],"support":[75],"tools":[76,100],"are":[77,130],"discussed":[78],"they":[80],"relate":[81],"these":[83,147],"areas.":[84],"impact":[86],"advances":[88],"very":[92],"large-scale":[93],"integration":[94],"(VLSI)":[95],"techniques":[98],"for":[101,159],"reviewed.":[106],"observation":[108],"made":[110],"valuable":[112],"results":[113],"have":[114],"been":[115],"obtained":[116],"areas":[119],"proofs":[123],"testing.":[126],"However,":[127],"further":[128],"improvements":[129],"needed":[131],"cope":[133],"complexity":[136],"VLSI.":[138],"An":[139],"alternative":[140],"may":[142],"overcome":[143],"limitations":[145],"two":[148],"approaches":[149],"design":[158],"testability.":[160]},"counts_by_year":[{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}