{"id":"https://openalex.org/W2038510163","doi":"https://doi.org/10.1145/1499586.1499722","title":"System integrity in small real-time computer systems","display_name":"System integrity in small real-time computer systems","publication_year":1973,"publication_date":"1973-01-01","ids":{"openalex":"https://openalex.org/W2038510163","doi":"https://doi.org/10.1145/1499586.1499722","mag":"2038510163"},"language":"en","primary_location":{"id":"doi:10.1145/1499586.1499722","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1499586.1499722","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the June 4-8, 1973, national computer conference and exposition on - AFIPS '73","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013703298","display_name":"Thomas Harrison","orcid":"https://orcid.org/0000-0001-6506-8856"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Thomas J. Harrison","raw_affiliation_strings":["IBM Corporation Boca Raton Florida"],"affiliations":[{"raw_affiliation_string":"IBM Corporation Boca Raton Florida","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058079843","display_name":"Thomas J. Pierce","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Thomas J. Pierce","raw_affiliation_strings":["IBM Corporation Boca Raton Florida"],"affiliations":[{"raw_affiliation_string":"IBM Corporation Boca Raton Florida","institution_ids":["https://openalex.org/I1341412227"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5013703298"],"corresponding_institution_ids":["https://openalex.org/I1341412227"],"apc_list":null,"apc_paid":null,"fwci":0.8266,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.76470588,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"539","last_page":"539"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.984000027179718,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.984000027179718,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.979200005531311,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9695000052452087,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mean-time-between-failures","display_name":"Mean time between failures","score":0.8999418020248413},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.7491623163223267},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7190330624580383},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.6443184018135071},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6359950304031372},{"id":"https://openalex.org/keywords/dirt","display_name":"Dirt","score":0.63184654712677},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.602913498878479},{"id":"https://openalex.org/keywords/system-integrity","display_name":"System integrity","score":0.5700581073760986},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.5159326195716858},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.24591809511184692},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23030415177345276},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.07383820414543152}],"concepts":[{"id":"https://openalex.org/C44154001","wikidata":"https://www.wikidata.org/wiki/Q754940","display_name":"Mean time between failures","level":3,"score":0.8999418020248413},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.7491623163223267},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7190330624580383},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6443184018135071},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6359950304031372},{"id":"https://openalex.org/C2778582501","wikidata":"https://www.wikidata.org/wiki/Q555882","display_name":"Dirt","level":2,"score":0.63184654712677},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.602913498878479},{"id":"https://openalex.org/C2777499013","wikidata":"https://www.wikidata.org/wiki/Q7663719","display_name":"System integrity","level":2,"score":0.5700581073760986},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.5159326195716858},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.24591809511184692},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23030415177345276},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.07383820414543152},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1499586.1499722","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1499586.1499722","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the June 4-8, 1973, national computer conference and exposition on - AFIPS '73","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.46000000834465027}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2057213227","https://openalex.org/W2483334712","https://openalex.org/W2077604717","https://openalex.org/W2352212546","https://openalex.org/W195039303","https://openalex.org/W2157479968","https://openalex.org/W2921959338","https://openalex.org/W2036897369","https://openalex.org/W2382531111","https://openalex.org/W2041457954"],"abstract_inverted_index":{"Reliability":[0],"has":[1,16],"been":[2,17],"a":[3,33,48,51,61,65,72,76,80,87],"long-standing":[4],"concern":[5],"to":[6],"the":[7,30,37],"user":[8],"of":[9,32,45,54],"small":[10],"real-time":[11],"computer":[12,49],"systems.":[13],"Traditionally,":[14],"reliability":[15],"measured":[18],"by":[19,75,98,115],"parameters":[20],"such":[21],"as":[22,104,112],"mean-time-between-failure":[23],"(MTBF)":[24],"and":[25,106],"is":[26],"usually":[27],"associated":[28],"with":[29],"failure":[31],"hardware":[34],"component":[35,117],"in":[36,47,71,91],"system.":[38],"But":[39],"there":[40],"are":[41],"many":[42],"other":[43],"causes":[44],"errors":[46,96],"system:":[50],"minute":[52],"particle":[53],"dirt":[55],"may":[56,68,89],"become":[57],"momentarily":[58],"lodged":[59],"on":[60],"magnetic":[62],"recording":[63],"media,":[64],"transient":[66,78],"pulse":[67],"be":[69,102],"induced":[70],"logic":[73],"circuit":[74],"line":[77],"or":[79,83],"lightning":[81],"strike,":[82],"an":[84,92],"algorithm":[85],"for":[86],"calculation":[88],"result":[90],"invalid":[93],"address.":[94],"The":[95],"caused":[97,114],"these":[99],"phenomena":[100],"can":[101,107],"just":[103],"serious,":[105],"have":[108],"similarly":[109],"grave":[110],"consequences,":[111],"those":[113],"actual":[116],"failure.":[118]},"counts_by_year":[{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}