{"id":"https://openalex.org/W2146752379","doi":"https://doi.org/10.1145/1414004.1414038","title":"Iterative identification of fault-prone binaries using in-process metrics","display_name":"Iterative identification of fault-prone binaries using in-process metrics","publication_year":2008,"publication_date":"2008-10-09","ids":{"openalex":"https://openalex.org/W2146752379","doi":"https://doi.org/10.1145/1414004.1414038","mag":"2146752379"},"language":"en","primary_location":{"id":"doi:10.1145/1414004.1414038","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1414004.1414038","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067788421","display_name":"Lucas Layman","orcid":"https://orcid.org/0000-0002-2534-8762"},"institutions":[{"id":"https://openalex.org/I137902535","display_name":"North Carolina State University","ror":"https://ror.org/04tj63d06","country_code":"US","type":"education","lineage":["https://openalex.org/I137902535"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Lucas Layman","raw_affiliation_strings":["North Carolina State University, Raleigh, NC, USA"],"affiliations":[{"raw_affiliation_string":"North Carolina State University, Raleigh, NC, USA","institution_ids":["https://openalex.org/I137902535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068883444","display_name":"Gunnar Kudrjavets","orcid":"https://orcid.org/0000-0003-3730-4692"},"institutions":[{"id":"https://openalex.org/I1290206253","display_name":"Microsoft (United States)","ror":"https://ror.org/00d0nc645","country_code":"US","type":"company","lineage":["https://openalex.org/I1290206253"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gunnar Kudrjavets","raw_affiliation_strings":["Microsoft Corporation, Redmond, WA, USA"],"affiliations":[{"raw_affiliation_string":"Microsoft Corporation, Redmond, WA, USA","institution_ids":["https://openalex.org/I1290206253"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101612061","display_name":"Nachiappan Nagappan","orcid":"https://orcid.org/0000-0003-1358-4124"},"institutions":[{"id":"https://openalex.org/I1290206253","display_name":"Microsoft (United States)","ror":"https://ror.org/00d0nc645","country_code":"US","type":"company","lineage":["https://openalex.org/I1290206253"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nachiappan Nagappan","raw_affiliation_strings":["Microsoft Corporation, Redmond, WA, USA"],"affiliations":[{"raw_affiliation_string":"Microsoft Corporation, Redmond, WA, USA","institution_ids":["https://openalex.org/I1290206253"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5067788421"],"corresponding_institution_ids":["https://openalex.org/I137902535"],"apc_list":null,"apc_paid":null,"fwci":7.6136,"has_fulltext":false,"cited_by_count":27,"citation_normalized_percentile":{"value":0.97025417,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"206","last_page":"212"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.689408540725708},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5594489574432373},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.524405837059021},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5124445557594299},{"id":"https://openalex.org/keywords/code","display_name":"Code (set theory)","score":0.48600754141807556},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.4386499226093292},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.4211012125015259},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.4120245575904846},{"id":"https://openalex.org/keywords/binary-number","display_name":"Binary number","score":0.4117143154144287},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.374666690826416},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3594542145729065},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.33539465069770813},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.32959675788879395},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.2907428741455078},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.15199607610702515},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14352992177009583},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11284646391868591},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.11175781488418579}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.689408540725708},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5594489574432373},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.524405837059021},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5124445557594299},{"id":"https://openalex.org/C2776760102","wikidata":"https://www.wikidata.org/wiki/Q5139990","display_name":"Code (set theory)","level":3,"score":0.48600754141807556},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.4386499226093292},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.4211012125015259},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.4120245575904846},{"id":"https://openalex.org/C48372109","wikidata":"https://www.wikidata.org/wiki/Q3913","display_name":"Binary number","level":2,"score":0.4117143154144287},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.374666690826416},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3594542145729065},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.33539465069770813},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.32959675788879395},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.2907428741455078},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.15199607610702515},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14352992177009583},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11284646391868591},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.11175781488418579},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1145/1414004.1414038","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1414004.1414038","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","raw_type":"proceedings-article"},{"id":"pmh:rug:oai:pure.rug.nl:publications/11964e1f-6b4e-449f-9f97-3ae3cf77abd7","is_oa":false,"landing_page_url":"https://research.rug.nl/en/publications/iterative-identification-of-faultprone-binaries-using-inprocess-metrics(11964e1f-6b4e-449f-9f97-3ae3cf77abd7).html","pdf_url":null,"source":{"id":"https://openalex.org/S4306401843","display_name":"Data Archiving and Networked Services (DANS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1322597698","host_organization_name":"Royal Netherlands Academy of Arts and Sciences","host_organization_lineage":["https://openalex.org/I1322597698"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Proceedings of the Second ACM-IEEE International Symposium on Empirical Software Engineering and Measurement","raw_type":"info:eu-repo/semantics/conferencepaper"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1491178396","https://openalex.org/W1536466580","https://openalex.org/W1953529280","https://openalex.org/W1990259865","https://openalex.org/W2015729052","https://openalex.org/W2027483357","https://openalex.org/W2100945416","https://openalex.org/W2107643286","https://openalex.org/W2121866145","https://openalex.org/W2130287281","https://openalex.org/W2147105902","https://openalex.org/W2152820192","https://openalex.org/W2156482183","https://openalex.org/W2158864412","https://openalex.org/W2160538621","https://openalex.org/W2169171327","https://openalex.org/W2503993098","https://openalex.org/W4299718521"],"related_works":["https://openalex.org/W2166897423","https://openalex.org/W1794505928","https://openalex.org/W2620568181","https://openalex.org/W2160179184","https://openalex.org/W2352104657","https://openalex.org/W2066922864","https://openalex.org/W2372794599","https://openalex.org/W2618712000","https://openalex.org/W2371965930","https://openalex.org/W2575775159"],"abstract_inverted_index":{"Code":[0],"churn,":[1],"the":[2,25,39,135,139],"amount":[3],"of":[4,27,61,70,102,117,137],"code":[5,28,98],"change":[6],"taking":[7],"place":[8],"within":[9],"a":[10,62,88],"software":[11,21,71],"unit":[12],"over":[13,148],"time,":[14],"has":[15],"been":[16],"correlated":[17],"with":[18],"fault-proneness":[19],"in":[20,45],"systems.":[22],"We":[23,50],"investigate":[24],"use":[26],"churn":[29,53,99],"and":[30,54,104,110,128],"static":[31],"metrics":[32,56],"collected":[33,51],"at":[34,125],"regular":[35],"time":[36],"intervals":[37],"during":[38,74],"development":[40],"cycle":[41],"to":[42,91,141],"predict":[43],"faults":[44,72],"an":[46],"iterative,":[47],"in-process":[48],"manner.":[49],"159":[52],"structure":[55],"from":[57],"six,":[58],"four-month":[59],"snapshots":[60],"1":[63],"million":[64],"LOC":[65],"Microsoft":[66],"product.":[67],"The":[68,119],"number":[69,101],"fixed":[73],"each":[75],"period":[76],"is":[77,122],"recorded":[78],"per":[79],"binary":[80],"module.":[81],"Using":[82],"stepwise":[83],"logistic":[84],"regression,":[85],"we":[86],"create":[87],"prediction":[89],"model":[90,121],"identify":[92],"fault-prone":[93,127],"binaries":[94],"using":[95],"three":[96],"parameters:":[97],"(the":[100],"new":[103],"changed":[105],"blocks);":[106],"class":[107,111],"Fan":[108,112],"In":[109],"Out":[113],"(normalized":[114],"by":[115],"lines":[116],"code).":[118],"iteratively-built":[120],"80.0%":[123],"accurate":[124],"predicting":[126],"non-fault-prone":[129],"binaries.":[130],"These":[131],"fault-prediction":[132,145],"models":[133],"have":[134],"advantage":[136],"allowing":[138],"engineers":[140],"observe":[142],"how":[143],"their":[144],"profile":[146],"evolves":[147],"time.":[149]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}