{"id":"https://openalex.org/W2170342834","doi":"https://doi.org/10.1145/1411273.1411276","title":"Early fault detection with model-based testing","display_name":"Early fault detection with model-based testing","publication_year":2008,"publication_date":"2008-09-27","ids":{"openalex":"https://openalex.org/W2170342834","doi":"https://doi.org/10.1145/1411273.1411276","mag":"2170342834"},"language":"en","primary_location":{"id":"doi:10.1145/1411273.1411276","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1411273.1411276","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 7th ACM SIGPLAN workshop on ERLANG","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://gupea.ub.gu.se/bitstream/2077/10535/1/gupea_2077_10535_1.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062387785","display_name":"Jonas Boberg","orcid":null},"institutions":[{"id":"https://openalex.org/I4210111783","display_name":"Erlang Solutions (United Kingdom)","ror":"https://ror.org/01tt73103","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210111783"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Jonas Boberg","raw_affiliation_strings":["Erlang Training and Consulting Ltd., London, England UK"],"affiliations":[{"raw_affiliation_string":"Erlang Training and Consulting Ltd., London, England UK","institution_ids":["https://openalex.org/I4210111783"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5062387785"],"corresponding_institution_ids":["https://openalex.org/I4210111783"],"apc_list":null,"apc_paid":null,"fwci":6.2186,"has_fulltext":false,"cited_by_count":44,"citation_normalized_percentile":{"value":0.96294372,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"9","last_page":"20"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10639","display_name":"Advanced Software Engineering Methodologies","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6836082339286804},{"id":"https://openalex.org/keywords/model-based-testing","display_name":"Model-based testing","score":0.6629064083099365},{"id":"https://openalex.org/keywords/system-testing","display_name":"System testing","score":0.5612323880195618},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5559563040733337},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5400332808494568},{"id":"https://openalex.org/keywords/test-strategy","display_name":"Test strategy","score":0.5272060036659241},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.49729230999946594},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.46083858609199524},{"id":"https://openalex.org/keywords/non-regression-testing","display_name":"Non-regression testing","score":0.4365929365158081},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.42111772298812866},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.4127448797225952},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4058890640735626},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.3877779543399811},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.35181155800819397},{"id":"https://openalex.org/keywords/software-system","display_name":"Software system","score":0.32399892807006836},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.30011144280433655},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20864558219909668},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.1517317295074463},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13939008116722107},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.13433951139450073},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.1268264651298523}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6836082339286804},{"id":"https://openalex.org/C165825675","wikidata":"https://www.wikidata.org/wiki/Q1399743","display_name":"Model-based testing","level":4,"score":0.6629064083099365},{"id":"https://openalex.org/C7166840","wikidata":"https://www.wikidata.org/wiki/Q1199682","display_name":"System testing","level":2,"score":0.5612323880195618},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5559563040733337},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5400332808494568},{"id":"https://openalex.org/C188598960","wikidata":"https://www.wikidata.org/wiki/Q7705805","display_name":"Test strategy","level":3,"score":0.5272060036659241},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.49729230999946594},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.46083858609199524},{"id":"https://openalex.org/C86469151","wikidata":"https://www.wikidata.org/wiki/Q917415","display_name":"Non-regression testing","level":5,"score":0.4365929365158081},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.42111772298812866},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.4127448797225952},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4058890640735626},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.3877779543399811},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.35181155800819397},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.32399892807006836},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.30011144280433655},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20864558219909668},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1517317295074463},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13939008116722107},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.13433951139450073},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.1268264651298523},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1145/1411273.1411276","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1411273.1411276","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 7th ACM SIGPLAN workshop on ERLANG","raw_type":"proceedings-article"},{"id":"pmh:oai:gupea.ub.gu.se:2077/10535","is_oa":true,"landing_page_url":"http://hdl.handle.net/2077/10535","pdf_url":"https://gupea.ub.gu.se/bitstream/2077/10535/1/gupea_2077_10535_1.pdf","source":{"id":"https://openalex.org/S4306401168","display_name":"Gothenburg University Publications Electronic Archive (Gothenburg University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I881427289","host_organization_name":"University of Gothenburg","host_organization_lineage":["https://openalex.org/I881427289"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"C"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.146.3026","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.146.3026","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.erlang-consulting.com/erlangworkshop08/erlang03m-boberg.pdf","raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:gupea.ub.gu.se:2077/10535","is_oa":true,"landing_page_url":"http://hdl.handle.net/2077/10535","pdf_url":"https://gupea.ub.gu.se/bitstream/2077/10535/1/gupea_2077_10535_1.pdf","source":{"id":"https://openalex.org/S4306401168","display_name":"Gothenburg University Publications Electronic Archive (Gothenburg University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I881427289","host_organization_name":"University of Gothenburg","host_organization_lineage":["https://openalex.org/I881427289"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"C"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.4099999964237213}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2170342834.pdf"},"referenced_works_count":31,"referenced_works":["https://openalex.org/W10833752","https://openalex.org/W134778087","https://openalex.org/W158693532","https://openalex.org/W179373627","https://openalex.org/W1499326305","https://openalex.org/W1608087281","https://openalex.org/W1714723801","https://openalex.org/W1821489642","https://openalex.org/W1969402593","https://openalex.org/W1986736724","https://openalex.org/W1988701125","https://openalex.org/W1990467226","https://openalex.org/W1998333922","https://openalex.org/W2030358379","https://openalex.org/W2036983256","https://openalex.org/W2042175627","https://openalex.org/W2052827706","https://openalex.org/W2074891852","https://openalex.org/W2092422674","https://openalex.org/W2100162598","https://openalex.org/W2120787570","https://openalex.org/W2120926795","https://openalex.org/W2126606154","https://openalex.org/W2143712427","https://openalex.org/W2147281414","https://openalex.org/W2172167090","https://openalex.org/W3103896344","https://openalex.org/W3143245542","https://openalex.org/W4256238177","https://openalex.org/W4285719527","https://openalex.org/W4388702419"],"related_works":["https://openalex.org/W2952740084","https://openalex.org/W2931644080","https://openalex.org/W3118435309","https://openalex.org/W2098804367","https://openalex.org/W2541184210","https://openalex.org/W2044802586","https://openalex.org/W2564510446","https://openalex.org/W2022894844","https://openalex.org/W1964233904","https://openalex.org/W1495752199"],"abstract_inverted_index":{"Current":[0],"and":[1],"future":[2],"trends":[3],"for":[4],"software":[5],"include":[6],"increasingly":[7],"complex":[8],"requirements":[9],"on":[10,47],"interaction":[11],"between":[12],"systems.":[13],"As":[14],"a":[15,26,35,60,63],"result,":[16],"the":[17,38,48],"difficulty":[18],"of":[19,37,62],"system":[20,49],"testing":[21,24,46,58],"increases.":[22],"Model-based":[23],"is":[25,82],"test":[27,30,86],"technique":[28],"where":[29],"cases":[31],"are":[32,76],"generated":[33],"from":[34,52],"model":[36],"system.":[39],"In":[40],"this":[41],"study":[42],"we":[43],"explore":[44],"model-based":[45,57],"level,":[50],"starting":[51],"early":[53,71],"development.":[54],"We":[55],"apply":[56],"to":[59,69,78],"subsystem":[61,80],"message":[64],"gateway":[65],"product":[66],"in":[67],"order":[68],"improve":[70],"fault":[72],"detection.":[73],"The":[74],"results":[75],"compared":[77],"another":[79],"that":[81],"tested":[83],"with":[84],"hand-crafted":[85],"cases.":[87]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":7},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":6}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}