{"id":"https://openalex.org/W1969981172","doi":"https://doi.org/10.1145/1401827.1401841","title":"An observation-based model for fault localization","display_name":"An observation-based model for fault localization","publication_year":2008,"publication_date":"2008-07-21","ids":{"openalex":"https://openalex.org/W1969981172","doi":"https://doi.org/10.1145/1401827.1401841","mag":"1969981172"},"language":"en","primary_location":{"id":"doi:10.1145/1401827.1401841","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1401827.1401841","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2008 international workshop on dynamic analysis: held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Rui Abreu","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Rui Abreu","raw_affiliation_strings":["Delft University of Technology, The Netherlands","Delft University of Technology, The Netherlands;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Delft University of Technology, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Delft University of Technology, The Netherlands;","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001628304","display_name":"Peter Zoeteweij","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Peter Zoeteweij","raw_affiliation_strings":["Delft University of Technology, The Netherlands","Delft University of Technology, The Netherlands;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Delft University of Technology, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Delft University of Technology, The Netherlands;","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084609766","display_name":"Arjan J. C. van Gemund","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Arjan J. C. van Gemund","raw_affiliation_strings":["Delft University of Technology, The Netherlands","Delft University of Technology, The Netherlands;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Delft University of Technology, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Delft University of Technology, The Netherlands;","institution_ids":["https://openalex.org/I98358874"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I98358874"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":49,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"64","last_page":"70"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.8276784420013428},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7763203382492065},{"id":"https://openalex.org/keywords/siemens","display_name":"Siemens","score":0.7565151453018188},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6981320977210999},{"id":"https://openalex.org/keywords/ranking","display_name":"Ranking (information retrieval)","score":0.6537562012672424},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.6049886345863342},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5583996772766113},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5556273460388184},{"id":"https://openalex.org/keywords/root-cause","display_name":"Root cause","score":0.5182754397392273},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.513235330581665},{"id":"https://openalex.org/keywords/software-bug","display_name":"Software bug","score":0.45967844128608704},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4451165795326233},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.41558682918548584},{"id":"https://openalex.org/keywords/unified-modeling-language","display_name":"Unified Modeling Language","score":0.41538557410240173},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.30532217025756836},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.272147536277771},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1428728997707367}],"concepts":[{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.8276784420013428},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7763203382492065},{"id":"https://openalex.org/C100053769","wikidata":"https://www.wikidata.org/wiki/Q169893","display_name":"Siemens","level":2,"score":0.7565151453018188},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6981320977210999},{"id":"https://openalex.org/C189430467","wikidata":"https://www.wikidata.org/wiki/Q7293293","display_name":"Ranking (information retrieval)","level":2,"score":0.6537562012672424},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.6049886345863342},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5583996772766113},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5556273460388184},{"id":"https://openalex.org/C84945661","wikidata":"https://www.wikidata.org/wiki/Q7366567","display_name":"Root cause","level":2,"score":0.5182754397392273},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.513235330581665},{"id":"https://openalex.org/C1009929","wikidata":"https://www.wikidata.org/wiki/Q179550","display_name":"Software bug","level":3,"score":0.45967844128608704},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4451165795326233},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.41558682918548584},{"id":"https://openalex.org/C145644426","wikidata":"https://www.wikidata.org/wiki/Q169411","display_name":"Unified Modeling Language","level":3,"score":0.41538557410240173},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.30532217025756836},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.272147536277771},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1428728997707367},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1145/1401827.1401841","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1401827.1401841","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2008 international workshop on dynamic analysis: held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008)","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.569.8462","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.569.8462","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://swerl.tudelft.nl/twiki/pub/Main/TechnicalReports/TUD-SERG-2008-019.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321780","display_name":"Ministerie van Economische Zaken","ror":"https://ror.org/00bc6bw85"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1585935505","https://openalex.org/W1860287101","https://openalex.org/W2003116861","https://openalex.org/W2036196659","https://openalex.org/W2039786027","https://openalex.org/W2095743037","https://openalex.org/W2108309071","https://openalex.org/W2123659430","https://openalex.org/W2134691366","https://openalex.org/W2144386448","https://openalex.org/W2153418968","https://openalex.org/W2159949130","https://openalex.org/W2162045655","https://openalex.org/W2162376048","https://openalex.org/W2162661453","https://openalex.org/W2166007208","https://openalex.org/W3163682980","https://openalex.org/W4233319527","https://openalex.org/W4241947695"],"related_works":["https://openalex.org/W2889557831","https://openalex.org/W2389261154","https://openalex.org/W613085492","https://openalex.org/W4243246472","https://openalex.org/W3173728350","https://openalex.org/W4240572821","https://openalex.org/W2351649981","https://openalex.org/W2945351762","https://openalex.org/W2102012911","https://openalex.org/W2154701440"],"abstract_inverted_index":{"Automatic":[0],"techniques":[1],"for":[2,125],"helping":[3],"developers":[4],"in":[5,16,132],"finding":[6],"the":[7,17,52,65,71,85,110,117,126,129],"root":[8,72],"causes":[9,73],"of":[10,20,54,74,113],"software":[11,75],"failures":[12],"are":[13,93],"extremely":[14],"important":[15],"development":[18],"cycle":[19],"software.":[21],"In":[22],"this":[23,114,133],"paper":[24,134],"we":[25,105],"study":[26],"a":[27,45,136],"dynamic":[28],"modeling":[29],"approach":[30,82,115,130],"to":[31,50,69],"fault":[32],"localization,":[33],"which":[34],"is":[35,99],"based":[36],"on":[37,64,109],"logic":[38],"reasoning":[39],"over":[40],"program":[41],"traces.":[42],"We":[43,122],"present":[44,106],"simple":[46],"diagnostic":[47,97,111,138],"performance":[48,98],"model":[49,78],"assess":[51],"influence":[53],"various":[55],"parameters,":[56],"such":[57],"as":[58],"test":[59,91],"set":[60],"size":[61],"and":[62],"coverage,":[63],"debugging":[66],"effort":[67],"required":[68],"find":[70],"failures.":[76],"The":[77],"shows":[79],"that":[80,89],"our":[81],"unambiguously":[83],"reveals":[84],"actual":[86],"faults,":[87],"provided":[88],"sufficient":[90],"cases":[92],"available.":[94],"This":[95],"optimal":[96],"confirmed":[100],"by":[101],"numerical":[102],"experiments.":[103],"Furthermore,":[104],"preliminary":[107],"experiments":[108],"capabilities":[112],"using":[116],"single-fault":[118],"Siemens":[119,127],"benchmark":[120],"set.":[121],"show":[123],"that,":[124],"set,":[128],"presented":[131],"yields":[135],"better":[137],"ranking":[139],"than":[140],"other":[141],"well-known":[142],"techniques.":[143]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":8},{"year":2012,"cited_by_count":5}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}