{"id":"https://openalex.org/W2167984158","doi":"https://doi.org/10.1145/1393921.1393947","title":"Row/column redundancy to reduce SRAM leakage in presence of random within-die delay variation","display_name":"Row/column redundancy to reduce SRAM leakage in presence of random within-die delay variation","publication_year":2008,"publication_date":"2008-01-01","ids":{"openalex":"https://openalex.org/W2167984158","doi":"https://doi.org/10.1145/1393921.1393947","mag":"2167984158"},"language":"en","primary_location":{"id":"doi:10.1145/1393921.1393947","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1393921.1393947","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceeding of the thirteenth international symposium on Low power electronics and design - ISLPED '08","raw_type":"proceedings-article"},"type":"conference-abstract","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://catalog.lib.kyushu-u.ac.jp/opac_download_md/11879/goudarzi08_3.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045308844","display_name":"Maziar Goudarzi","orcid":"https://orcid.org/0000-0002-1272-4589"},"institutions":[{"id":"https://openalex.org/I135598925","display_name":"Kyushu University","ror":"https://ror.org/00p4k0j84","country_code":"JP","type":"education","lineage":["https://openalex.org/I135598925"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Maziar Goudarzi","raw_affiliation_strings":["Kyushu University, Fukuoka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu University, Fukuoka, Japan","institution_ids":["https://openalex.org/I135598925"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022726556","display_name":"Tohru Ishihara","orcid":"https://orcid.org/0000-0002-1650-9958"},"institutions":[{"id":"https://openalex.org/I135598925","display_name":"Kyushu University","ror":"https://ror.org/00p4k0j84","country_code":"JP","type":"education","lineage":["https://openalex.org/I135598925"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tohru Ishihara","raw_affiliation_strings":["Kyushu University, Fukuoka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu University, Fukuoka, Japan","institution_ids":["https://openalex.org/I135598925"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I135598925"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":true,"cited_by_count":4,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"2008","issue":null,"first_page":"93","last_page":"93"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.6607743501663208},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.5993218421936035},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.5670506358146667},{"id":"https://openalex.org/keywords/die","display_name":"Die (integrated circuit)","score":0.4948822855949402},{"id":"https://openalex.org/keywords/variation","display_name":"Variation (astronomy)","score":0.48297420144081116},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.47939634323120117},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45379555225372314},{"id":"https://openalex.org/keywords/column","display_name":"Column (typography)","score":0.4344882369041443},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.4190293252468109},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21302172541618347},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.19566601514816284},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.16939985752105713},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.11179009079933167},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09655216336250305},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.0722501277923584}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.6607743501663208},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.5993218421936035},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5670506358146667},{"id":"https://openalex.org/C111106434","wikidata":"https://www.wikidata.org/wiki/Q1072430","display_name":"Die (integrated circuit)","level":2,"score":0.4948822855949402},{"id":"https://openalex.org/C2778334786","wikidata":"https://www.wikidata.org/wiki/Q1586270","display_name":"Variation (astronomy)","level":2,"score":0.48297420144081116},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.47939634323120117},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45379555225372314},{"id":"https://openalex.org/C2780551164","wikidata":"https://www.wikidata.org/wiki/Q2306599","display_name":"Column (typography)","level":3,"score":0.4344882369041443},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.4190293252468109},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21302172541618347},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.19566601514816284},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16939985752105713},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.11179009079933167},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09655216336250305},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0722501277923584},{"id":"https://openalex.org/C44870925","wikidata":"https://www.wikidata.org/wiki/Q37547","display_name":"Astrophysics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C126042441","wikidata":"https://www.wikidata.org/wiki/Q1324888","display_name":"Frame (networking)","level":2,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1145/1393921.1393947","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1393921.1393947","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceeding of the thirteenth international symposium on Low power electronics and design - ISLPED '08","raw_type":"proceedings-article"},{"id":"pmh:oai:irdb.nii.ac.jp:01211:0005973408","is_oa":true,"landing_page_url":"https://hdl.handle.net/2324/11879","pdf_url":"https://catalog.lib.kyushu-u.ac.jp/opac_download_md/11879/goudarzi08_3.pdf","source":{"id":"https://openalex.org/S7407056385","display_name":"Institutional Repositories DataBase (IRDB)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I184597095","host_organization_name":"National Institute of Informatics","host_organization_lineage":["https://openalex.org/I184597095"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"International Symposium on Low Power Electronics and Design","raw_type":"conference paper"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.558.9879","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.558.9879","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.c.csce.kyushu-u.ac.jp/lab_db/papers/paper/pdf/2008/goudarzi08_3.pdf","raw_type":"text"},{"id":"pmh:oai:catalog.lib.kyushu-u.ac.jp:2324/11879","is_oa":true,"landing_page_url":"http://hdl.handle.net/2324/11879","pdf_url":null,"source":{"id":"https://openalex.org/S4306402148","display_name":"QIR (Kyushu University Institutional Repository) (Kyushu University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I135598925","host_organization_name":"Kyushu University","host_organization_lineage":["https://openalex.org/I135598925"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"International Symposium on Low Power Electronics and Design","raw_type":"conference paper"}],"best_oa_location":{"id":"pmh:oai:irdb.nii.ac.jp:01211:0005973408","is_oa":true,"landing_page_url":"https://hdl.handle.net/2324/11879","pdf_url":"https://catalog.lib.kyushu-u.ac.jp/opac_download_md/11879/goudarzi08_3.pdf","source":{"id":"https://openalex.org/S7407056385","display_name":"Institutional Repositories DataBase (IRDB)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I184597095","host_organization_name":"National Institute of Informatics","host_organization_lineage":["https://openalex.org/I184597095"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"International Symposium on Low Power Electronics and Design","raw_type":"conference paper"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.4000000059604645,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322832","display_name":"University of Tokyo","ror":"https://ror.org/057zh3y96"},{"id":"https://openalex.org/F4320338075","display_name":"Core Research for Evolutional Science and Technology","ror":"https://ror.org/00097mb19"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2167984158.pdf","grobid_xml":"https://content.openalex.org/works/W2167984158.grobid-xml"},"referenced_works_count":21,"referenced_works":["https://openalex.org/W39641061","https://openalex.org/W324636563","https://openalex.org/W1518236483","https://openalex.org/W1702767802","https://openalex.org/W2000457170","https://openalex.org/W2101308451","https://openalex.org/W2104509890","https://openalex.org/W2110999128","https://openalex.org/W2124825934","https://openalex.org/W2126357937","https://openalex.org/W2131054871","https://openalex.org/W2134822007","https://openalex.org/W2139340565","https://openalex.org/W2141682861","https://openalex.org/W2146018705","https://openalex.org/W2150949306","https://openalex.org/W2150984383","https://openalex.org/W2161934647","https://openalex.org/W2165126103","https://openalex.org/W2166677938","https://openalex.org/W2170874491"],"related_works":["https://openalex.org/W2119312496","https://openalex.org/W4247460323","https://openalex.org/W1909296377","https://openalex.org/W2537086382","https://openalex.org/W2107909712","https://openalex.org/W2089002058","https://openalex.org/W2153162275","https://openalex.org/W2079259690","https://openalex.org/W2626140143","https://openalex.org/W3185029353"],"abstract_inverted_index":{"Traditionally,":[0],"spare":[1,58],"rows/columns":[2],"have":[3],"been":[4],"used":[5],"in":[6,112],"two":[7],"ways:":[8],"either":[9],"to":[10,15,19,23,46,64],"replace":[11],"too":[12,54],"leaky":[13],"cells":[14,22,56,70,74],"reduce":[16,47],"leakage,":[17,48],"or":[18,81],"substitute":[20,51],"faulty":[21],"improve":[24],"yield.":[25],"In":[26],"contrast,":[27],"we":[28,83,116],"first":[29],"choose":[30,85],"a":[31,72,100,105],"higher":[32,79],"threshold":[33],"voltage":[34],"(Vth)":[35],"and/or":[36],"gate-oxide":[37],"thickness":[38],"(Tox)":[39],"for":[40,99],"SRAM":[41,69,113],"transistors":[42],"at":[43,78,127],"design":[44],"time":[45],"and":[49,88,132],"then":[50],"the":[52,86,93],"resulting":[53],"slow":[55],"by":[57,121],"rows/columns.":[59],"We":[60],"show":[61],"that":[62,92],"due":[63],"within-die":[65],"delay":[66,133],"variation":[67,111],"of":[68],"only":[71,123],"few":[73],"violate":[75],"target":[76],"timing":[77],"Vth":[80,87],"Tox;":[82],"carefully":[84],"Tox":[89],"values":[90],"such":[91],"original":[94],"memory":[95],"timing-yield":[96],"remains":[97],"intact":[98],"negligible":[101,128],"extra":[102],"delay.":[103],"On":[104],"commercial":[106],"90nm":[107],"process":[108],"assuming":[109],"3%":[110],"cell":[114],"delay,":[115],"obtained":[117],"47%":[118],"leakage":[119],"reduction":[120],"adding":[122],"5":[124],"redundant":[125],"columns":[126],"area,":[129],"dynamic":[130],"power":[131],"costs.":[134]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}