{"id":"https://openalex.org/W2150182783","doi":"https://doi.org/10.1145/1391469.1391704","title":"Study of the effects of MBUs on the reliability of a 150 nm SRAM device","display_name":"Study of the effects of MBUs on the reliability of a 150 nm SRAM device","publication_year":2008,"publication_date":"2008-06-08","ids":{"openalex":"https://openalex.org/W2150182783","doi":"https://doi.org/10.1145/1391469.1391704","mag":"2150182783"},"language":"en","primary_location":{"id":"doi:10.1145/1391469.1391704","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1391469.1391704","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 45th annual Design Automation Conference","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044495372","display_name":"Juan Antonio Maestro","orcid":"https://orcid.org/0000-0001-7133-9026"},"institutions":[{"id":"https://openalex.org/I3020445194","display_name":"Universidad Nebrija","ror":"https://ror.org/03tzyrt94","country_code":"ES","type":"education","lineage":["https://openalex.org/I3020445194"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Juan Antonio Maestro","raw_affiliation_strings":["Universidad Antonio de Nebrija, Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidad Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080322790","display_name":"Pedro Reviriego","orcid":"https://orcid.org/0000-0003-2540-5234"},"institutions":[{"id":"https://openalex.org/I3020445194","display_name":"Universidad Nebrija","ror":"https://ror.org/03tzyrt94","country_code":"ES","type":"education","lineage":["https://openalex.org/I3020445194"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Pedro Reviriego","raw_affiliation_strings":["Universidad Antonio de Nebrija, Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidad Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I3020445194"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":27,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"930","last_page":"935"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mean-time-between-failures","display_name":"Mean time between failures","score":0.8625054359436035},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.8118941783905029},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6957138776779175},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6657745838165283},{"id":"https://openalex.org/keywords/microelectronics","display_name":"Microelectronics","score":0.5441088080406189},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5276193618774414},{"id":"https://openalex.org/keywords/energy","display_name":"Energy (signal processing)","score":0.47944942116737366},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.4638391137123108},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.46175146102905273},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.4571719765663147},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.35986950993537903},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26824072003364563},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2557355463504791},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19248244166374207},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.17696130275726318},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.1643795371055603},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08317127823829651}],"concepts":[{"id":"https://openalex.org/C44154001","wikidata":"https://www.wikidata.org/wiki/Q754940","display_name":"Mean time between failures","level":3,"score":0.8625054359436035},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.8118941783905029},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6957138776779175},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6657745838165283},{"id":"https://openalex.org/C187937830","wikidata":"https://www.wikidata.org/wiki/Q175403","display_name":"Microelectronics","level":2,"score":0.5441088080406189},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5276193618774414},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.47944942116737366},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.4638391137123108},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.46175146102905273},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.4571719765663147},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35986950993537903},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26824072003364563},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2557355463504791},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19248244166374207},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.17696130275726318},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.1643795371055603},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08317127823829651},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1391469.1391704","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1391469.1391704","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 45th annual Design Automation Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8999999761581421}],"awards":[{"id":"https://openalex.org/G6072626392","display_name":null,"funder_award_id":"ESP-2006-04163","funder_id":"https://openalex.org/F4320321764","funder_display_name":"Ministerio de Educaci\u00f3n, Cultura y Deporte"}],"funders":[{"id":"https://openalex.org/F4320321764","display_name":"Ministerio de Educaci\u00f3n, Cultura y Deporte","ror":"https://ror.org/03nc27g21"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W259115443","https://openalex.org/W934537791","https://openalex.org/W1980073965","https://openalex.org/W1981194937","https://openalex.org/W2033816298","https://openalex.org/W2104886115","https://openalex.org/W2110196049","https://openalex.org/W2117485913","https://openalex.org/W2124241199","https://openalex.org/W2127178251","https://openalex.org/W2136292465","https://openalex.org/W2136476145","https://openalex.org/W2137983381","https://openalex.org/W2152652532","https://openalex.org/W2154784930","https://openalex.org/W2160451204","https://openalex.org/W2546044294"],"related_works":["https://openalex.org/W4290647047","https://openalex.org/W1500230652","https://openalex.org/W2363504003","https://openalex.org/W2066033226","https://openalex.org/W2548582980","https://openalex.org/W2620706469","https://openalex.org/W2052914698","https://openalex.org/W2088929465","https://openalex.org/W2612883256","https://openalex.org/W4386933833"],"abstract_inverted_index":{"Soft":[0],"errors":[1],"induced":[2],"by":[3],"radiation":[4],"are":[5,30],"an":[6],"increasing":[7],"problem":[8],"in":[9,48,55],"the":[10,17,61,69,85,91,95],"microelectronic":[11],"field.":[12],"Although":[13],"traditional":[14],"models":[15],"estimate":[16],"reliability":[18,54],"of":[19,75],"memories":[20],"suffering":[21],"Single":[22],"Event":[23],"Upsets":[24,28],"(SEUs),":[25],"Multiple":[26],"Bit":[27],"(MBUs)":[29],"becoming":[31],"more":[32,34],"and":[33],"important":[35],"as":[36,90],"technology":[37],"scales.":[38],"In":[39],"this":[40],"paper,":[41],"a":[42,56,76],"model":[43],"that":[44,87],"deals":[45],"with":[46],"MBUs":[47],"memory":[49],"systems,":[50],"which":[51],"allows":[52],"calculating":[53],"fast":[57],"way":[58],"similar":[59],"to":[60,67],"SEU":[62],"case,":[63],"has":[64],"been":[65],"used":[66],"analyze":[68],"Mean":[70],"Time":[71],"To":[72],"Failure":[73],"(MTTF)":[74],"150":[77],"nm":[78],"device":[79],"under":[80],"radiation.":[81],"This":[82],"analysis":[83],"illustrates":[84],"importance":[86],"physical":[88],"factors,":[89],"energy,":[92],"have":[93],"on":[94],"system":[96],"reliability.":[97]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}